Mstation jms 700 system
The MStation JMS-700 is a scanning electron microscope (SEM) system manufactured by JEOL. It is designed to provide high-quality imaging and analysis of a wide range of materials and samples. The core function of the MStation JMS-700 is to generate and detect electron signals from the interaction between the electron beam and the sample, allowing for detailed observation and characterization of the sample's surface and internal structure.
4 protocols using mstation jms 700 system
Characterization of Organic Compounds
Melting Point and NMR Characterization
Characterization of Organic Compounds
Characterization of Organic Compounds
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