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Mstation jms 700 system

Manufactured by JEOL

The MStation JMS-700 is a scanning electron microscope (SEM) system manufactured by JEOL. It is designed to provide high-quality imaging and analysis of a wide range of materials and samples. The core function of the MStation JMS-700 is to generate and detect electron signals from the interaction between the electron beam and the sample, allowing for detailed observation and characterization of the sample's surface and internal structure.

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4 protocols using mstation jms 700 system

1

Characterization of Organic Compounds

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Melting points were determined on open glass capillaries using a STUART Melting point SMP 10 apparatus and are uncorrected. NMR spectra were recorded on a Bruker AMX 500 spectrometer in DMSO-d6 and reported as δ ppm values relative to TMS at 500/700 and 125/176 MHz for 1H and 13C NMR, respectively. J values were recorded in Hz. HREI-MS spectra were measured on a JEOL MStation JMS-700 system. X-ray data were collected on a Bruker APEX-II D8 Venture area diffractometer, equipped with graphite monochromatic Mo Kα radiation, λ = 0.71073 Å at 100 (2) K. Follow-up of the reactions and checking the purity of compounds was made by TLC on DC-Mikrokarten polygram SIL G/UV254, from the Macherey–Nagel Firm, Duren Thickness: 0.25 mm.
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2

Melting Point and NMR Characterization

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Melting points were uncorrected and determined with open glass capillaries using a STUART melting point SMP 10 apparatus. High-resolution mass spectra were obtained on a JEOL MStation JMS-700 system. 1H and 13C NMR spectra (500, 700, and 175 MHz) were recorded on Bruker AMX 500 and 700 instruments using TMS as the internal reference and DMSO-d6 as solvent.
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3

Characterization of Organic Compounds

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Melting points were measured in open-glass capillaries using a STUART SMP 10 melting point apparatus and are uncorrected. NMR spectra were recorder in DMSO-d6 either on a Bruker AMX 500 or 700 spectrometer. Chemical shifts are reported relative to TMS as δ ppm values. Spectrometers operated at either 500 or 700 MHz for 1H NMR and 175 MHz for 13C NMR. Coupling constants (J values) are given in Hz. High resolution mass spectra (HREI-MS) were measured on a JEOL MStation JMS-700 system. A Perkin Elmer FT-IR Spectrum BX spectrometer was used to record the IR spectra (KBr, ѵ, cm−1). TLC on DC Mikrokarten polygram SIL G/UV254 (thickness: 0.25 mm from the Macherey–Nagel Firm Duren) was used to monitor the reactions and check the purity of compounds.
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4

Characterization of Organic Compounds

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NMR spectra were measured in DMSO-d6 on a Bruker AMX 700 spectrometer operated at 700 MHz for 1H NMR and 175 MHz for 13C NMR. High-resolution mass spectra (EI-HRMS) were measured on a JEOL MStation JMS-700 system. A Brucker Alpha II FTIR-ATR spectrometer was used to record the IR spectra (KBr, v, cm−1). Melting points (uncorrected) were measured using a STUART SMP 10 melting point apparatus. Monitoring the reactions and checking compound purity were carried out by TLC on a DC Mikrokarten polygram SIL G/UV254 (Macherey-Nagel Firm, Duren) with a thickness of 0.25 mm.
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