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Evo ma10 electron microscope

Manufactured by Zeiss
Sourced in Germany

The EVO-MA10 is an electron microscope designed for high-resolution imaging and analysis. It utilizes a thermionic electron gun to generate an electron beam, which is focused and scanned across the sample surface to generate images. The EVO-MA10 offers a wide range of magnification capabilities and can achieve high-resolution imaging of a variety of materials.

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4 protocols using evo ma10 electron microscope

1

Taxonomic identification of Russula senecis

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During the field survey (2008–2012), several edible mushrooms were collected from the forest floor of West Bengal, India accompanied by tribal mushroom hunters of the regions. Among the basket of mushrooms which they usually gather for their regular dishes, a unique mushroom, commonly called “JHAL PATRA” (JHAL = because of its acrid taste; PATRA = Mushroom) was chosen and brought to the laboratory for thorough taxonomic investigation. Detailed microscopic work was performed using the protocol of Buyck & Adamcik (2011) (link) and it was identified as Russula senecis S. Imai using standard literatures (Imai, 1938 ; Zhishu, Guoyang & Taihui, 1993 ; Das, 2009 ). Colour codes and terms (mostly) follow the Royal Botanic Gardens Edinburgh colour chart (Henderson, Orton & Watling, 1969 ). Scanning Electron Microscope (SEM) illustrations of basidiospores were carried out with a Zeiss EVO-MA10 electron microscope (Zeiss, Oberkochen, Germany) at the Centre for Research in Nanoscience and Nanotechnology, University of Calcutta, Kolkata, India. After thorough microscopic work, the specimen voucher had been deposited in Calcutta University Herbarium (CUH).
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2

SEM Analysis of Trabecular Bone Structure

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For the analysis by scanning electron microscopy (SEM), the right tibiae were kept in
absolute ethyl alcohol for 5 days then cut (1-mm thick) in the coronal plane using an
ISOMET¯ 1000 saw (Buehler, USA) (Figure
4
). After cutting, the slices were attached to aluminum supports (stubs)
with silver- and graphite-based conductive glue to improve the flow of electrons. The
stubs were kept dry with silica gel (Synth¯ Labsynth, Brazil) and
subsequently sputter-coated in gold, in a SCD 050 Sputter Coater (Bal-Tec™, Germany),
for 350 s. The stubs with the samples were then positioned in an Evo-MA10 electron
microscope (Zeiss™, Germany). The images were obtained with 40× magnification and the
trabecular spaces were analyzed qualitatively.
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3

Silk Filament Visualization by SEM

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Scanning Electron Microscopy was used to visualize the printed silk filaments. Sections were prepared by freeze-fracturing under liquid nitrogen. All samples for SEM were sputter-coated with 102–20 nm gold coating using a Polaron SC502 Sputter Coater (Fisons, VG Microtech, East Sussex, England) and imaged using a Zeiss EVO MA10 electron microscope (Carl Zeiss AG, Germany).
For EDX: Samples were coated with gold and then observed using a Carl Zeiss (Carl Zeiss SMT, Germany) Supra 55 field emission scanning electron microscope (FESEM) at an accelerated voltage of 20 kV. EDX was performed using Zeiss Supra 55 SEM coupled with an EDAX EDX system at the Center for Nanoscale Systems at Harvard University.
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4

Silk-based Disc Morphology Analysis

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The interior morphology of the silk-based discs was assessed by scanning electron microscopy (SEM) using a Zeiss EVO MA10 electron microscope (Carl Zeiss AG, Oberkochen, Germany). The samples were cut to expose the cross-sections, mounted onto SEM stubs, and coated with gold via a SC7620 sputter coater (Quorum Technologies, Lewes, UK). The diameter of the pore in each image was measured by the average of 20 pores in ImageJ (version 1.53).
Fourier-transform infrared spectroscopy (FTIR; JASCO FTIR 6200 spectrometer, Jasco, Easton, MD, USA or a Bruker Vertex 70 spectrometer, Berlin, Germany) was used to evaluate the secondary configurations of silk-based discs, as described previously [38 (link)]. The amide I region (1585 to 1720 cm−1) was overlaid to compare the β-sheet content.
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