A Bruker Lambda 35 UV–Vis absorption spectrometer was used in the range of 200–800 nm with steps of 0.5 nm at room temperature. FTIR spectra with a wave number 400–4000 cm−1 were developed using a Bruker IFS 66. The diffraction data of the finely powdered samples were recorded for 2θ angles between 5 and 80°. The Raman spectrum was recorded between 400 and 4000 cm−1 on an INCA-xart Raman spectrometer using a 514.5 nm Ar laser at 0.5 mW power. Images were obtained at magnifications ranging from 45× to 30,000×. TEM measurements were carried out in an TECNAI G2 series transmission electron microscope operating at 200 kV.
Ifs 66
The IFS 66 is a Fourier Transform Infrared (FTIR) spectrometer manufactured by Bruker. It is designed to analyze the infrared absorption and emission spectra of various materials and samples. The IFS 66 provides high-resolution, high-quality infrared data for applications in analytical chemistry, materials science, and other scientific fields.
Lab products found in correlation
17 protocols using ifs 66
Comprehensive Characterization of Synthesized Graphene Oxide
A Bruker Lambda 35 UV–Vis absorption spectrometer was used in the range of 200–800 nm with steps of 0.5 nm at room temperature. FTIR spectra with a wave number 400–4000 cm−1 were developed using a Bruker IFS 66. The diffraction data of the finely powdered samples were recorded for 2θ angles between 5 and 80°. The Raman spectrum was recorded between 400 and 4000 cm−1 on an INCA-xart Raman spectrometer using a 514.5 nm Ar laser at 0.5 mW power. Images were obtained at magnifications ranging from 45× to 30,000×. TEM measurements were carried out in an TECNAI G2 series transmission electron microscope operating at 200 kV.
Matrix Isolation of Cyanogen Azide
Characterization of Organic Compounds
Morphological and Textural Characterization
Characterization of Nanoadsorbent Materials
Synthesis and Characterization of Chiral Vanadium Complexes
Characterization of Organic Compounds
Specular Reflectance of IPA Adsorption
was measured under controlled pressure of IPA. To control the vapor
pressure in the sample chamber, a container with liquid IPA was connected
to the chamber through a needle valve. The internal pressure of the
chamber was measured with a dual capacitance manometer (MKS model
PDR 2000). Samples were annealed at 200 °C for 1 h to remove
any moisture from the voids in the porous structures before carrying
out the gas adsorption–desorption process. The chamber containing
a sample was kept under dynamic vacuum (10–2 Torr)
for 30 min. In adsorption measurements, IPA gas was injected into
the chamber, and the reflectance spectra were measured at each fixed
pressure, P, by using a FTIR spectrometer (IFS-66,
Bruker). This process was repeated sequentially at different vapor
pressures until saturation pressure (Ps) was reached. Desorption experiments were conducted following the
same protocol, with a gradual decrease in the pressure being obtained
by opening the valve connected to the vacuum pump. Again, spectra
were taken at slowly decreasing pressures until the initial value
was attained. All measurements were made at room temperature (∼20
°C).
Characterization of CP/O300 Nanocomposites
Infrared Spectroscopy of Solid Samples
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