Sem tm 3030plus
The SEM TM 3030Plus is a scanning electron microscope (SEM) designed by Hitachi. It is a compact desktop model that provides high-resolution imaging of samples at the microscopic level. The SEM TM 3030Plus uses an electron beam to scan the surface of a sample, generating detailed images that reveal the sample's topography and composition.
Lab products found in correlation
4 protocols using sem tm 3030plus
Visualizing Morphological Changes in ABS-PP Blends
Acorn Flour Starch Characterization
Starch microstructural characterization was carried out with a scanning electron microscopy – SEM (Hitachi SEM TM 3030Plus, Tokyo, Japan). Samples were observed with 400–1500x magnification.
Microstructure Analysis of Emulsified Sauces
Characterization of Plant-Based Coagulants
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