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Sem tm 3030plus

Manufactured by Hitachi
Sourced in Japan

The SEM TM 3030Plus is a scanning electron microscope (SEM) designed by Hitachi. It is a compact desktop model that provides high-resolution imaging of samples at the microscopic level. The SEM TM 3030Plus uses an electron beam to scan the surface of a sample, generating detailed images that reveal the sample's topography and composition.

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4 protocols using sem tm 3030plus

1

Visualizing Morphological Changes in ABS-PP Blends

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The visual phase separations between ABS and PP at the fractured surfaces were analyzed by an SEM TM3030 Plus (Hitachi, Tokyo, Japan). It was also used to analyze the effects of aging interval, bed temperature, and printing temperature. The images were used to describe the tensile properties in ANOVA analysis.
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2

Acorn Flour Starch Characterization

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Acorn flour starch content was determined using an enzymatic kit K-TSTA-100A (Megazyme, Enterprise Ireland, Dublin, Ireland), and then was measured in a spectrometer UVmin-1240 (Shimadzu, Kyoto, Japan).
Starch microstructural characterization was carried out with a scanning electron microscopy – SEM (Hitachi SEM TM 3030Plus, Tokyo, Japan). Samples were observed with 400–1500x magnification.
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3

Microstructure Analysis of Emulsified Sauces

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Microstructure analysis of the emulsified sauces was performed by low-vacuum scanning electron microscopy -SEM (Hitachi SEM TM 3030Plus, Tokyo, Japan. The TM3030Plus tabletop microscope was used, allowing easy observation and analysis without the need for further sample preparation. A magnification of 600× was used.
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4

Characterization of Plant-Based Coagulants

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In order to analyze the chemical compositions of the plant-based coagulants, an IRAffinity-1S Fourier Transform Infrared spectrometer—FTIR (Shimadzu, Kyoto, Japan) device was used, in the wavenumber range of 400–4000 cm−1. Samples were prepared using the KBr disc method, mixing 2 mg of sample, with 200 mg KBr, and pressing it into a mold at 10 ton cm−2. The microstructural characterization was carried out using scanning electron microscopy—SEM (Hitachi SEM TM 3030Plus, Tokyo, Japan).
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