All the chemicals were purchased from Sigma-Aldrich and used as received. Nanopure water (18 MΩ-cm) (Thermo Scientific) is used throughout all experiments. UV-vis spectra were acquired with an Olis HP 8452 diode array spectrophotometer. Polarized resonance synchronous spectra (PRS2) were acquired using the Fluoromax-4 spectrofluorometer equipped with an excitation and detection polarizer. PerkinElmer ELAN DRC II inductively coupled plasma-mass spectrometer (ICP-MS) was used for the silver quantification. Litesizer 500 (Anton-Paar) instrument was used for the zeta potential measurements. A Thermo Scientific K-Alpha X-ray photoelectron spectrometer system was used for the XPS measurements. A LabRam HR800 confocal Raman microscope was used for Raman and SERS acquisitions with 632 nm laser excitation. Reflective sample substrate (RSS) slides from Raminescent, LLC were used for all SERS acquisitions. These RSS slides are highly reflective with negligible fluorescence and Raman background (Athukorale et al., 2017a (link)).
K alpha x ray photoelectron spectrometer system
Manufactured by Thermo Fisher Scientific
Sourced in United States
The K-Alpha X-ray photoelectron spectrometer system is a laboratory instrument designed for surface analysis. It uses X-ray photoelectron spectroscopy (XPS) to determine the chemical composition and electronic state of the surface of a material. The system provides quantitative information about the elements present on the surface, their chemical states, and the relative concentrations of those elements.
Automatically generated - may contain errors
Lab products found in correlation
Litesizer 500, by Anton Paar (1 mentions)
Elan drc 2, by PerkinElmer (1 mentions)
Jsm 7610f, by JEOL (1 mentions)
E 1030, by Hitachi (1 mentions)
Nicolet is20, by Thermo Fisher Scientific (1 mentions)
Zetasizer nano zs90, by Malvern Panalytical (1 mentions)
D8 advance diffractometer, by Bruker (1 mentions)
Dxr raman spectrometer, by Thermo Fisher Scientific (1 mentions)
Agilent 8453 g1103a spectrophotometer, by Agilent Technologies (1 mentions)
Fourier transform infrared spectroscopy, by Thermo Fisher Scientific (1 mentions)
3flex equipment, by Micromeritics (1 mentions)
D2 phaser desktop, by Bruker (1 mentions)
Nano z, by Malvern Panalytical (1 mentions)
Invia reflex raman microscopy system, by Renishaw (1 mentions)
Quanta 200 feg esem, by Thermo Fisher Scientific (1 mentions)
Alpha platinum atr spectrometer, by Bruker (1 mentions)
Spectrum 100, by PerkinElmer (1 mentions)
Spark multimode microplate reader, by Tecan (1 mentions)
12 protocols using k alpha x ray photoelectron spectrometer system
1
Analytical Characterization of Silver Nanoparticles
2
Comprehensive Surface Characterization of Carbon Fibers
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
XPS analysis was performed by using a Thermo Scientific K‐Alpha X‐ray Photoelectron Spectrometer System with an AlKα (1486.6 eV) monochromated X‐ray source (12 kV×3 mA) (Waltham, MA, USA). Carbon fiber filaments were fixed at both ends to the sample holder by using a carbon tape, and the target spot was chosen to cover the carbon fibers only (400 μm X‐ray spot size). The elemental composition of the surface was discovered by recording the survey spectrum with a resolution of 1 eV. High‐resolution C 1s, N 1s, O 1s, and F 1s spectra were obtained with a resolution of 0.1 eV by using a pass energy of 20 eV. Data processing was performed with Thermo Scientific Avantage Software version 5.89 (Waltham, MA, USA).
Surface topography of the samples was investigated by using a Hitachi S4500 scanning electron microscope by applying an accelerating voltage of 15 kV; the Au/Pd coating was deposited with a Hitachi E1030 ion sputter for 40 s (Hitachi, Ltd., Tokyo, Japan). Field‐emission scanning electron microscopy (FE‐SEM) experiment was also performed with a JSM‐7610F and an accelerating voltage of 15 kV (JEOL, Tokyo, Japan). The FE‐SEM system was coupled with a JEOL EX‐230**BU EX‐37001 energy‐dispersive X‐ray analyzer, which enabled us to record the energy‐dispersive X‐ray spectrum and to carry out chemical mapping experiments.
Surface topography of the samples was investigated by using a Hitachi S4500 scanning electron microscope by applying an accelerating voltage of 15 kV; the Au/Pd coating was deposited with a Hitachi E1030 ion sputter for 40 s (Hitachi, Ltd., Tokyo, Japan). Field‐emission scanning electron microscopy (FE‐SEM) experiment was also performed with a JSM‐7610F and an accelerating voltage of 15 kV (JEOL, Tokyo, Japan). The FE‐SEM system was coupled with a JEOL EX‐230**BU EX‐37001 energy‐dispersive X‐ray analyzer, which enabled us to record the energy‐dispersive X‐ray spectrum and to carry out chemical mapping experiments.
3
X-ray Photoelectron Spectroscopy and SEM Characterization
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
X-ray photoelectron spectra were recorded on a Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer System using Al Kα monochromated X-ray radiation (1486.6 eV, 36 W; Waltham, MA, USA). Data were collected from a spot size of 400 μm and the binding energy scale was calibrated to the hydrocarbon C1s peak at 285.0 eV. Survey spectra were obtained with a resolution of 1 eV and high-resolution C1s, N1s, O1s, and S2p spectra were recorded using a pass energy of 20 eV and a spectral resolution of 0.1 eV. Data were processed with a Thermo Scientific Avantage Software version 5.89 (Waltham, MA, USA). Overlapping peaks were resolved using the Powel method with Gauss-Lorentz Mix algorithm and a built-in Smart algorithm for background correction.
Morphological analysis was performed with a JSM-7610F field emission scanning electron microscope (FE-SEM) applying 8 mm working distance and 15 kV accelerating voltage (JEOL, Tokyo, Japan). Prior to the analysis, Au/Pd layer was sputtered on the sample surface using a Hitachi E1030 type equipment and a deposition time of 40 s (Hitachi, Ltd., Tokyo, Japan).
Morphological analysis was performed with a JSM-7610F field emission scanning electron microscope (FE-SEM) applying 8 mm working distance and 15 kV accelerating voltage (JEOL, Tokyo, Japan). Prior to the analysis, Au/Pd layer was sputtered on the sample surface using a Hitachi E1030 type equipment and a deposition time of 40 s (Hitachi, Ltd., Tokyo, Japan).
4
Characterization of ZPP Nanoparticles
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Transmission electron microscopy (TEM) images were performed at an 80 kV acceleration voltage by HT7800. A TESCAN MIRA LMS transmission electron microscope was used to take Scanning Electron Microscope (SEM) images. The concentration of ZPP were measured by a double-beam UV-spectrophotometer (UV-8000 A, Shanghai, China) and high-pressure liquid chromatography (HPLC). Fourier Transform Infrared Spectroscopy (FTIR) measurements were carried out on PDA with a Thermo Scientific Nicolet iS20 (Thermo Fisher Scientific, USA) at 4000 – 400 cm− 1. Crystal structure measurements were performed with an Ultima IV X-ray diffractometer (XRD, Ultima IV, Rigaku, Japan) at 10°/min using Cu Kα radiation (λ = 1.54 Å). By using an ASAP2460, the Brunauer-Emmett-Teller (BET) surface area of hMnO2 was determined at 77 K by analyzing N2 adsorption-desorption isotherms. X-ray photoelectron spectroscopy (XPS) was also conducted on MnO2 using a Thermo Scientific K-alpha X-ray Photoelectron Spectrometer System (hv = 1486.68 eV). The hydrated particle size and zeta potential of the nanoparticles were determined by Dynamic Light Scattering (DLS, Malvern Zetasizer Nano ZS90).
5
Amination of Galactomannan Biopolymers
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Aminations of galactomannan were performed the same way as galactose aminations except for using 50 mM potassium phosphate buffer (pH 7.5) instead of HEPES and a longer reaction time of 24 h. The oxidized reference was produced without the addition of ATA and the non-oxidized reference was produced without any enzyme. After reactions, SpATA was added to the oxidized reference, and SpATA, FgrGaOx, catalase, and HRP were added to the non-oxidized reference to make the references have the same composition as aminated samples. The products were desalted using Amicon Ultra-0.5 centrifuge filters (100 kDa cutoff) to remove proteins and residual amino donors and were washed repetitively until the calculated buffer concentration fell below 0.1% of the original value (1000× dilution). The desalted products were freeze–dried, and the XPS analyses were performed by OCCAM (University of Toronto) using a K-Alpha X-ray photoelectron spectrometer system (Thermo Scientific).
6
Characterization of CdSe Nanoparticles
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
X-ray Powder Diffraction (XRD) patterns were obtained using the Bruker D8 Advance diffractometer (Cu Kα 1.5418 Å, Ni-filtered). Samples were supported onto Si low background sample holder by directly drop-casting the CdSe toluene suspension. The patterns were recorded from 20∘ to 90∘ (2θ) using a step of 0.02∘, 0.5 s/step of exposure time, and accumulating the signal for 4 hours. Transmission electron microscopy (TEM) images were recorded using a corrected TEM Titan Themis Cubed (FEI Company) operating at 300 kV. Samples were prepared by depositing one drop of dilute particle dispersions in toluene onto a carbon-coated copper grid. Average particle size diameter and standard deviation were determined statistically by counting above 200 particles. X-ray photoelectron spectroscopy (XPS) analysis was performed in a K-Alpha X-ray Photoelectron Spectrometer System (Thermo Scientific). The ultra-high vacuum chamber (UHV) operating pressure was Pa. The high-resolution XPS spectra were recorded using 100 meV per step.
7
Electrode Surface Characterization by SEM, XPS, and ECSA
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
SEM image and corresponding EDX elemental mapping were taken using an Auriga 60 Cross Beam SEM. The surface composition of the electrode was determined using a K-Alpha X-ray photoelectron spectrometer system (Thermo Fisher Scientific). The XPS data were analyzed using CasaXPS and the adventitious C 1s signal was calibrated to 284.5 eV. The electrochemical surface area (ECSA) was determined by measuring the double-layer capacitance (Cdl) in Ar-saturated 0.1 M HClO4 solution. The ECSA is given by:
Where Rf is the roughness factor normalized by the Cu foil and S stands for the ideal surface area of smooth Cu foil electrode (1 cm2). The roughness factor was estimated by normalizing the double-layer capacitance Cdl to that of a Cu foil. The Cdl was determined by measuring the capacitive current in the non-faradaic potential region under various scan rates of cyclic voltammetry(10 mV s−1, 20 mV s−1, 40 mV s−1, 60 mV s−1, 80 mV s−1and 100 mV s−1). The Cdl was obtained by plotting the capacitive current against the scan rates.
Where Rf is the roughness factor normalized by the Cu foil and S stands for the ideal surface area of smooth Cu foil electrode (1 cm2). The roughness factor was estimated by normalizing the double-layer capacitance Cdl to that of a Cu foil. The Cdl was determined by measuring the capacitive current in the non-faradaic potential region under various scan rates of cyclic voltammetry(10 mV s−1, 20 mV s−1, 40 mV s−1, 60 mV s−1, 80 mV s−1and 100 mV s−1). The Cdl was obtained by plotting the capacitive current against the scan rates.
8
Characterization of Graphene Oxide Cathodes
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Specific surface area of RGO paper or carbon paper cathodes was determined with the Brunauer–Emmett–Teller (BET) method as previously described53 (link). The Agilent 8453 G1103A spectrophotometer (Agilent, Denmark) was used to measure the UV-vis spectrum of the GO solution. X-ray photoelectron spectroscopy (XPS) was performed with a Thermo Scientific™ K-Alpha™ + X-ray Photoelectron Spectrometer System with an aluminum K-Alpha (1486 eV) as x-ray source. All the samples were deposited on polished Si-wafer by drop casting for XPS measurements. X-ray spot area for measurement was set at 400 μm and flood gun was used for charge compensation. Raman spectroscopy was conducted with a Thermo Scientific DXR Raman spectrometer equipped with a 455 nm laser.
9
Multifaceted Characterization of Graphene Nanoplatelet Composites
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The morphological studies of GNP and its hybrid additives were analyzed using a Leo Supra 35VP field emission scanning electron microscope (SEM) and a JEOL JEM-ARM200CFEG UHR- transmission electron microscopy (TEM). X-ray diffraction (XRD) measurements were carried out by using a Bruker D2 PHASER Desktop with a CuKα radiation source. Raman spectroscopy was employed to characterize the structural changes in GNP samples using a Renishaw inVia Reflex Raman Microscopy System with a laser wavelength of 532 nm in the range of 100–3500 cm−1. Functional groups of functionalized silica samples were analyzed using a Thermo Scientific Fourier transform infrared spectroscopy (FTIR). The surface composition of GNP and its hybrid additives were examined quantitively by Thermo Scientific K-Alpha X-ray photoelectron spectrometer system (XPS). Zetasizer Nano ZS, Malvern dynamic light scattering (DLS) was used to measure the particle size of carbon and silica samples. Surface areas of the prepared samples were measured by BET method by using Micromeritics 3Flex equipment. Thermal conductivity analysis of GNP based grouts was conducted by hot disk thermal constants analyzer, TPS 2500 S. Thermogravimetric analysis (TGA) was carried out using a Mettler Toledo thermal analyzer (TGA/DSC 3+) over the temperature range of 25 °C to 1000 °C at a heating rate of 10 °K min−1 under nitrogen.
10
XPS Analysis of Plasma-Treated PHB/PHBV Films
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The surface elemental composition and atomic concentration of the plasma-treated and untreated PHB and PHBV films were analyzed using X-ray photoelectron spectroscopy (XPS) (K-Alpha X-ray photoelectron spectrometer system; Thermo Fisher Scientific, Waltham, MA, USA). The analysis of the spectra of these films was done using peak fitting and the XPS system data processing unit.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!