Transmission electron microscope images (TEM) were obtained on the Tecnai G2 F20 S-twin transmission electron microscopy, and morphology of the HC-AB NP were observed through the image. Dynamic light scattering (DLS) size distribution and zeta potential of samples were analyzed by a Nano Zetasizer (Malvern Instruments Ltd.). X-ray photoelectron spectroscopy (XPS) was obtained on a V. G. Scientific ESCALAB250 spectrometer with Al Kα radiation (1486.6 eV, 150 W). The UV-vis absorption spectra was obtained using a TU-1901 dual-beam UV-vis spectrophotometer (PerkinElmer), and NIR-II absorption spectrum was recorded by NIR2000 SPECTROMETER spectrum analyzer. Fourier-transform infrared (FT-IR) spectroscopy were obtained on a ALPHA II spectrophotometer (Bruker), using the KBr pellet technique. N2 adsorption–desorption isotherms were tested on a Micromeritics ASAP 2020 system, the BET surface area and the pore size distributions were calculated by using the Brunauer Emmett Teller (BET) method and Barrett Joyner Halenda (BJH) desorption curve analysis, respectively.
Escalab 250 spectrometer
Manufactured by VG Scientific
Sourced in United Kingdom, Japan
The ESCALAB 250 is a high-performance X-ray photoelectron spectroscopy (XPS) spectrometer. It is designed for surface analysis, providing detailed information about the chemical composition and electronic structure of materials. The ESCALAB 250 features a state-of-the-art electron energy analyzer and X-ray source, enabling accurate and reliable data acquisition.
Automatically generated - may contain errors
Lab products found in correlation
D max 2550, by Rigaku (2 mentions)
Tecnai g2 f20 s twin, by Thermo Fisher Scientific (2 mentions)
Zetasizer nano, by Malvern Panalytical (1 mentions)
Alpha 2 spectrophotometer, by Bruker (1 mentions)
Asap 2020 system, by Micromeritics (1 mentions)
Lambda 950 spectrophotometer, by PerkinElmer (1 mentions)
Fluoview 500 laser scanning confocal microscope, by Olympus (1 mentions)
2010 instrument, by JEOL (1 mentions)
F 7000 fluorescence spectrophotometer, by Hitachi (1 mentions)
D max 2400 x ray diffractometer, by Rigaku (1 mentions)
S 4800, by Hitachi (1 mentions)
Jem 2010, by JEOL (1 mentions)
Tecnai g2 f20, by Philips (1 mentions)
Su8010, by Hitachi (1 mentions)
Jem arm200cf, by JEOL (1 mentions)
Jsm 6700f, by JEOL (1 mentions)
D8 advance diffractometer, by Bruker (1 mentions)
Uv 1900 spectrophotometer, by Shimadzu (1 mentions)
Jsm 6700f, by Thermo Fisher Scientific (1 mentions)
Vertex 70 ftir spectrometer, by Bruker (1 mentions)
8 protocols using escalab 250 spectrometer
1
Characterization of Hybrid Nanoparticles
2
Comprehensive Characterization of Carbon Dots
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Transmission electron microscopy (TEM) was performed on a JEOL-2010 instrument (JEOL, Tokyo, Japan) at 200 kV. Fourier transform infrared (FTIR) spectra were collected in the wavenumber range of 4000–400 cm−1 using a Nicolet 360 FTIR spectrometer (Nicolet, Madison, WI, USA). X-ray photoelectron spectroscopy (XPS) was performed using an ESCALAB 250 spectrometer (VG Scientific, London, England) with monochromatic Al Kα radiation (hν = 1486.6 eV), and the binding energy calibration was based on C 1s (284.6 eV). UV–vis absorption spectra were recorded on a PerkinElmer Lambda 950 spectrophotometer (PerkinElmer, Waltham, MA, USA). Excitation and emission spectra were collected using a Hitachi F-7000 fluorescence spectrophotometer (Hitachi, Tokyo, Japan). The QY of the CDs was measured at an excitation wavelength of 360 nm using quinine sulfate as a standard (QY = 54%) [6 (link)]. Confocal microscopy analysis was performed using an Olympus FluoView 500 laser scanning confocal microscope (Olympus, Tokyo, Japan), and the 3-(4,5-dimethylthiazol-2-yl)-2,5-diphenyltetrazolium bromide (MTT) assay of the obtained CDs was used to quantify the viability of HeLa cells [40 (link)].
3
Characterization of N-doped Carbon Nanofibers
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The crystal structure of the fibers was characterized using powder X-ray diffraction (XRD) on a Rigaku D/Max-2400 X-ray diffractometer with Cu-Kα radiation (λ = 1.54056 Å). The specific surface area and the pore size distribution of as-prepared N-doping carbon coating NTP nanofibers (700 and 800°C) were evaluated by the Brunauer-Emmet-Teller (BET) at 77 K using a NOVA 1200e Surface Area. Raman spectra of samples were acquired with a Lab RAM HR 800 Raman microscope with an excitation laser beam (λ = 532 nm). SEM images were obtained on a scanning electron microscope (Hitachi, S4800) attached with an energy-dispersive X-ray spectroscopy (EDS) facility. TEM and HR-TEM images were recorded on a JEOL JEM-2010 (JEOL Ltd, Tokyo, Japan) at 200 kV. Ex-situ XPS records were performed on a VG scientific ESCALAB 250 spectrometer.
4
Comprehensive Materials Characterization Protocol
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The morphology was investigated using field emission scanning electron microscopy (SEM, Hitachi SU-8010) and high-resolution transmission electron microscopy (HRTEM, Philips Tecnai G2 F20). The content of elements was obtained by a Vario EL III elemental analyzer (Elementar, Germany). The crystalline structure was characterized by X-ray powder diffraction (XRD, Bruker D5005 X'Pert) with Cu Kα radiation, and XRD patterns were collected from 2θ = 5° to 2θ = 70° at a scan rate of 2° min−1. N2 adsorption–desorption was used to examine the specific surface area and pore structure using a Micromeritics ASAP 2002 analyzer. Raman experiment was carried out on a Raman spectrometer (LabRAM HR UV-NIR, Jobin Yvon) using a 532 nm line (Nd-YAG laser). X-ray photoelectron spectroscopy (XPS) was performed on a VG scientific ESCA Lab 250 spectrometer with AlKa radiation and the obtained data were fitted by Avantage. Infrared spectroscopy (IR) was performed on a Thermo Fisher Scientific spectrometer. Thermogravimetry mass spectrometry (TG-MS) was analysed on a NETZSCH STA409PC-QMS403 instrument from 50 to 800 °C at 5 °C min−1.
5
Microscopic Analysis of Material Structures
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The morphologies and the microstructures of the samples were investigated using the field emission scanning electron microscope (FESEM, JEOL JSM-6700F). X-ray diffraction (XRD) characterizations were conducted by a Rigaku D/max-2550 diffractometer with Cu-Kα radiation, and Rietveld refinement was carried out for the crystal structure analysis. Atomic-resolution ABF STEM and HAADF STEM were performed using a JEM ARM200CF (JEOL, Tokyo, Japan) transmission electron microscope equipped with double CEOS (CEOS, Heidelberg, Germany) probe aberration correctors. The attainable spatial resolution of the microscope is 78 pm. The valence states of the samples were identified by X-ray photoemission spectra by using a VG scientific ESCALAB-250 spectrometer.
6
Comprehensive Material Characterization
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The crystal structure of the sample was studied by XRD measurement on a Bruker D8 Advance Diffractometer with Cu Kα radiation. The morphologies and the microstructures of the samples were investigated using a NOVA 230 field‐emission scanning electron microscopy and a FEI Titan 80–300 HRTEM. X‐ray photoelectron spectra were tested by using a VG scientific ESCALAB‐250 spectrometer. UV–vis absorption spectra were conducted on a Shimadzu UV‐1900 spectrophotometer.
7
Characterization of Co9S8@Carbon Nanofibers
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A Rigaku D/max-2550 diffractometer with Cu Kα radiation was utilized to collect X-ray diffraction (XRD) characterizations. Microscopic morphologies of Co9S8@carbon nanofiber were evaluated by a field emission scanning electron microscope (JEOL JSM-6700F) and TEM (FEI Tecnai G2F20S-TWIN). The thermogravimetric analysis (TGA) was measured by SDT Q600. X-ray photoemission spectrum (XPS) was carried out on a VG scientific ESCALAB-250 spectrometer.
8
Comprehensive Material Characterization
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XRD patterns were obtained on a Smartlab SE with Cu Kα radiation. The morphologies were analyzed by the field emission SEM (Regulus 8100). TEM, HRTEM, and SAED were investigated using an FEI Tecnai G2 F20 S‐TWIN. FTIR spectra of the experimental products were recorded on a Bruker VERTEX 70 FTIR spectrometer. The valence states of the samples were identified by XPS by using a VG scientific ESCALAB‐250 spectrometer.
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