D max 2400 powder diffractometer

The microstructures of the UVS and UVS-NZVI were imaged on S-4800 scanning electron microscopy (Hitachi, Japan) and H-9500 transmission electron microscopy (Hitachi, Japan). Fourier transform infrared (FTIR) spectra were obtained on a Tensor27 FTIR spectrometer (Bruker, Germany). X-ray diffraction (XRD) was recorded on a D/Max-2400 powder diffractometer (Rigaku, Japan), operating at 40 kV and 40 mA. The specific surface area and pore structure were measured on a specific surface area and porosity analyser (ASAP 2460 analyser, Micromeritics, USA). UVS-NZVI was degassed in vacuum and characterized by N₂ sorption at 77 K. The specific surface area was calculated by the Brunauer–Emmett–Teller (BET) method. Pore diameter were calculated by Barrett–Joyner–Halenda (BJH) method [26 (link),27 (link)].

The X-ray diffraction patterns were obtained on a Rigaku D/max-2400 powder diffractometer by using Cu Kα radiation at 40 kV and 60 mA. The luminescence decay curves were measured by a FLS-920T fluorescence spectrophotometer with a nF900 microsecond flashlamp as the light source. The photoluminescence and the long persistent luminescence spectra were recorded by FLS-920 fluorescence spectrophotometer (Edinburgh Instruments). The absorption spectra were recorded by a PerkinElmer Lambda 950 spectrometer in the region of 400–700 nm, while BaSO₄ was used as a reference.