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Raman spectroscopy

Manufactured by Bruker
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Raman spectroscopy is an analytical technique that measures the inelastic scattering of light by molecules. It provides information about the vibrational and rotational modes of molecules, which can be used to identify and characterize chemical compounds. The technique involves illuminating a sample with a monochromatic light source, typically a laser, and detecting the shifted frequencies of the scattered light.

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2 protocols using raman spectroscopy

1

Comprehensive Characterization of Synthesized Materials

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The morphologies of as-synthesised materials were characterized by FE-SEM/EDS (FE-SEM, JEOL JSM-7610F), and TEM (TEM, Hitachi HT7700). The crystalline structure was characterized by XRD (Bruker D8 ADVANCE using Cu-Kα radiation (λ = 1.5418 Å)). The chemical structure was characterized by FTIR (PerkinElmer) and Raman spectroscopy (Bruker, an excitation wavelength of 532 nm). The specific surface area was measured by nitrogen adsorption/desorption with the BET method (BELSORP-mini, MicrotracBEL). The surface composition was analysed by X-ray photoelectron spectroscopy (XPS, JEOL, JSP-9010MC). In situ gas detection was carried out by DEMS (Hiden analytical, HPR-40). Cyclic voltammetry (CV) and galvanostatic charge–discharge measurement (GCD) were performed using a Metrohm AUTOLAB potentionstat (PGSTAT 302N) and battery tester (Neware, Gelon, HongKong), respectively.
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2

Raman Spectroscopy Analysis of Ettringite

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To distinguish the bound water and hydroxide in the crystal structure of ettringite, further structural analysis was performed by Raman spectroscopy (Bruker Corporation, Billerica, MA, USA) using a Bruker Senterra Raman spectrometer equipped with an Olympus LMPIanFl N 50x lens with the FlexFocusTM system for confocal depth profiling and an ANDOR DU420-OE with a thermoelectric cooling system as a charge-coupled device (CCD). The green laser (λ = 532 nm) was operated with a total power of 20 mW and a spectral resolution of 3 cm−1 to 5 cm−1. Each spectra was collected with an acquisition time of 5 s per scan, merging five consecutive scans in a range of 50 cm−1 to 1555 cm−1, 1522 cm−1 to 2739 cm−1, and 2705 cm−1 to 3705 cm−1. The grating calibration was controlled by checking the position of the Raman line of a Si standard at 519.9 cm−1 [24 (link)]. The samples were transferred as powder on a glass slide.
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