100s electron microscope
The JEOL 100S electron microscope is a high-performance instrument designed for advanced materials analysis. It utilizes an electron beam to magnify and image samples at the nanoscale level, providing detailed information about their structure and composition. The JEOL 100S is capable of producing clear, high-resolution images and data, making it a valuable tool for researchers and scientists in various fields.
5 protocols using 100s electron microscope
Immunogold Labeling of Cellular Proteins
Ultrastructural Analysis of Myelinated Axons
Imaging PS1 Localization by Immunoelectron Microscopy
Ultrastructural Analysis of Myelinated Axons
TEM Imaging of NP Uptake in MCF-7 Cells
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