DLS experiments were performed to measure EV size and their concentration. All the measurements were made at 25°C on a Zetasizer Nano ZS90 spectrometer (Malvern, UK) equipped with a 5 mW HeNe laser (wavelength λ D 632.8 nm) and a non‐invasive back‐scattering optical setup (NIBS). For each sample, the detected intensity was processed by a digital logarithmic correlator, which computes a normalized intensity autocorrelation function. Then, the distribution of the diffusion coefficient D was obtained by using the CONTIN method.63 D was converted into an effective hydrodynamic diameter DH through the Stokes–Einstein equation: DH D KBT/(3phD), where KBT is the system's thermal energy and h represents the solvent viscosity. Solvent‐resistant micro cuvettes (ZEN0040, Malvern, Herrenberg, Germany) have been used for experiments with a sample volume of 40 μl. EV size distribution and concentration was calculated by a recently proposed DLS‐based non‐invasive tool as described previously (Vulpis et al., 2017 (link)).
Nano zs90 spectrometer
Manufactured by Malvern Panalytical
Sourced in United Kingdom
The Nano ZS90 spectrometer is a compact, high-performance instrument designed for the measurement of particle size, zeta potential, and molecular weight. The device utilizes dynamic light scattering (DLS) technology to determine the size distribution of particles and molecules in a wide range of samples, including suspensions, emulsions, and solutions. The Nano ZS90 provides accurate and reliable data with a measurement range of 0.3 nm to 10 μm.
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2 protocols using nano zs90 spectrometer
1
Characterizing Extracellular Vesicle Size and Concentration
2
Morphological and Physicochemical Characterization of PPPC
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The morphology of PPPC was observed by a JEOL JSM-7100F field-emission scanning electron microscope (FESEM, Tokyo, Japan) operated at 10 kV. Nitrogen adsorption-desorption isotherm was measured using a Quadrasorb instrument (Quantachrome, Boynton Beach, FL, USA) at 150 °C, and the data analysis was performed with Quantachrome software. X-ray diffraction (XRD) patterns were studied using a Rigaku Ultima IV X-ray diffractometer with Cu-Kα radiation (λ = 0.15418 nm). Fourier transform-infrared (FTIR) spectrum was recorded using a Nicolet 6700 spectrophotometer (Thermo Fisher, Cleveland, OH, USA). Raman spectrum was performed by a DXR Raman spectroscopy system (Thermo Fisher, Cleveland, OH, USA). Zeta potential was determined using a Malvern Zetasizer Nano ZS 90 spectrometer.
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