Jem 2100ex tem

In all cases, microstructural examinations were conducted by using optical microscopy, electron backscatter diffraction (EBSD), and transmission electron microscopy (TEM). For optical microscopy, the samples were prepared by mechanical polishing in conventional fashion, followed by the final etching in Keller’s reagent. A final surface finish for EBSD and TEM was obtained by electro-polishing in a solution of 25% nitric acid in ethanol.
EBSD analysis was performed using a FEI Quanta 600 field-emission-gun scanning electron microscope (FEG-SEM) (Thermo Fisher Scientific, Waltham, MA, USA) equipped with a TSL OIM^TM EBSD system (EDAX, Mahwah, NJ, USA). TEM observations were conducted with a JEM-2100EX TEM (JEOL Ltd., Akishima, Japan).

The morphology of CAO-AuNPs prepared by dialysis treatment was evaluated using a JEM-2100EX TEM, HRTEM (Jeol, Tokyo, Japan), and a JSM-6700F SEM (Jeol, Tokyo, Japan). XRD of CAO-AuNPs powder was undertaken using a D-MAX 2500/PC XRD diffractometer (Rigaku, Tokyo, Japan) with Cu Kα radiation (λ = 0.1518 nm). The particle size and ZP of CAO-AuNPs obtained by dialysis treatment were determined by using a Nano-ZS90 Malvern particle size analyzer (Malvern Instruments Ltd., Malvern, UK) at a scattering angle of 90° and at room temperature. UV-Vis spectrum analysis of CAO-AuNPs was performed on a UV-Vis spectrophotometer 2800 (Shimadzu, Kyoto, Japan) with quartz cell at a resolution of 1 nm.