X-ray diffraction patterns (XRD) spectra was collected X-ray diffractometer (Bruker D8 advance, Germany) with Cu Kα radiation (k = 1.54 nm) in the range of 2θ = 20°–70°. The valence properties of all existing elements in CsPbX3/ZnO NPs were determined by employing X-ray photoelectron (XPS: ESCALAB 250Xi-system) Ultraviolet-visible (UV-visible) spectra were investigated by a Lambda 950 spectrophotometer in the wavelength range of 300–800 nm. Fourier Transform Infrared (FTIR) has been carried out by Shimadzu-8400S infrared spectrometer. The morphology of the material was investigated by transmission electron microscope (JEOL JSM-7800F) and energy-dispersive spectra (EDS) was obtained by using an integrated Oxford INCA X-ACT equipped with SEM. On a multi-channel battery system (LANHE-CT2001A), the electrocatalytic activity of prototype coin cells was studied in a voltage range of 0.1–3.0 V at a constant current density.
X ray diffractometer
Manufactured by Bruker
Sourced in Germany, Switzerland, United States, Japan
An X-ray diffractometer is a laboratory instrument used to analyze the atomic and molecular structure of a wide range of materials. It works by directing a beam of X-rays at a sample and measuring the angles at which the X-rays are diffracted. The resulting diffraction pattern is then used to determine the crystallographic structure of the material.
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Lab products found in correlation
Jem 2100, by JEOL (4 mentions)
Jsm 7800f, by JEOL (2 mentions)
U 3010, by Hitachi (2 mentions)
Zetasizer nano z, by Malvern Panalytical (2 mentions)
Spectrum 100 ftir spectrometer, by PerkinElmer (2 mentions)
S 4700 microscope, by Hitachi (2 mentions)
2100f feg apparatus, by JEOL (2 mentions)
Cu grid, by JEOL (2 mentions)
Tecnai g2, by Thermo Fisher Scientific (2 mentions)
Lambda 900, by PerkinElmer (2 mentions)
Cu kα 1.5406 radiation, by Bruker (2 mentions)
Uv 1800 spectrophotometer, by Shimadzu (2 mentions)
D8 advance, by Bruker (2 mentions)
Jsm 6360a, by JEOL (1 mentions)
Tecnai g2 f20, by Thermo Fisher Scientific (1 mentions)
Quanta 400 feg, by Thermo Fisher Scientific (1 mentions)
Escalab 250xi, by Thermo Fisher Scientific (1 mentions)
Uv 2600, by Shimadzu (1 mentions)
Hrtem, by Thermo Fisher Scientific (1 mentions)
Em 208, by Philips (1 mentions)
82 protocols using x ray diffractometer
1
Comprehensive Characterization of CsPbX3/ZnO Nanocomposites
2
Characterization of Bioreduced Metal Nanoparticles
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Surface morphology and particle size of bioreduced PtNPs, PdNPs, and Pt–PdNPs were determined using transmission electron microscope (Tecnai 12 cryo TEM, FEI, Eindhoven, the Netherlands). The morphology and size of bioreduced nanoparticles were characterized by JEOL-JEM-2100 (JEOL, Akishima, Tokyo, Japan) high-resolution transmission electron microscope (HRTEM). Energy dispersive spectra recorded in the energy dispersive spectroscopy (EDS) equipped in JEOL JSM 6360A analytical scanning electron microscope at an energy range 0–20 keV confirmed the synthesis of PtNPs, PdNPs, and Pt–PdNPs using DBTE. The diffraction data for the dry powder were recorded on a Bruker X-ray diffractometer using a Cu Kα (1.54 Å) source. Phase formation was confirmed from characteristic peaks such as (111), (200), and (220).
3
Characterization of Photocatalyst Materials
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X-ray diffraction (XRD) patterns were recorded on an X-ray diffractometer (Bruker, Bremen, Germany) with Cu-Kα radiation (λ = 1.5406 Å) over a 2θ angle range of 10–80°. X-ray photoelectron spectroscopy (XPS) were collected on a K-alpha X-ray photoelectron spectrometer (Thermo ESCALAB 250Xi, Carlsbad, CA, USA) with monochromatic Al Kα (hv = 1486.6 eV) from an X-ray source operating at 15 kV and 10 mA. All binding energies were referenced to the C 1s peak at 284.6 eV. The morphology of the photocatalysts were investigated via a scanning electron microscope (SEM, FEI Quanta 400 FEG), which was equipped with energy dispersive spectroscopy (EDS). High-resolution transmission electron microscopy (HRTEM) images were measured using a FEI Tecnai G2 F20 (HRTEM, FEI, Hillsboro, OR, USA), with an accelerating voltage of 200 kV. UV–visible diffuse reflectance spectra (UV–vis DRS) of the samples were measured on a UV–visible spectrophotometer (UV-2600, SHIMADZU, Kyoto, Japan) over the range of 200–800 nm using BaSO4 as a reference. The binding energy was calibrated with reference to the C1 s peak at 284.8 eV.
4
Determination of Crystal Structure
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According to the method already reported (31 (link)), the crystal structure was determined using an X-ray diffractometer (Bruker AXS Ltd., Leipzig, Germany), and the relative crystallinity was calculated using the MDI Jade 5.0 software.
5
Characterizing Nanocrystals in Glass Ceramics
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To identify the crystalline phase in GCs, X-ray diffraction (XRD) patterns were performed on a X-ray diffractometer (Bruker, Fällanden, Switzerland) with Cu/Ka (λ = 0.1541 nm) radiation. The morphology and size distribution of the nanocrystals in GCs were measured via high-resolution transmission electron microscopy (HRTEM) (FEI, Hillsboro, OR, USA). UC emission spectra of samples were recorded using an Edinburgh FLS980 fluorescence spectrometer (Edinburgh Instruments, Edinburgh, UK). A 980 nm laser diode (LD) was used as the exciting source for the measurement of UC emission spectra. The emission decay curves were measured using the same spectrometer with a microsecond lamp as the excitation source. All measurements were performed at room temperature.
6
Nanomaterial Characterization Techniques
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Transmission electron microscopy images were recorded on a Philips-EM208S at an accelerating voltage of 100 kV. Fourier transform infrared (FTIR) spectroscopy study was carried out by JASCO, FT/IR-6300 (Japan), to determine the chemical functional groups in the nanoparticles at various steps of synthesis. The magnetic properties of nanoparticles were evaluated by the Alternating Gradient Field Magnetometry at room temperature up to 9000 Oe. X-ray diffraction (XRD) study was through a Bruker X-ray diffractometer. The iron and gold concentrations of the stock solution were measured using an atomic absorption spectrophotometer (Shimadzu, AA-680).
7
Synthesis of Zinc, Iron, and Copper Nanoparticles
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To prepare Zn NPs, 10 g of NaOH (1.0 M) was dissolved in 250 mL of
ultrapure water and stirred at 90 °C. Then, 17.0358 g of ZnCl2 (0.5 M) solution was prepared and kept in a burette. The
solution was then dropwise added into the NaOH solution for 26 min
and was continuously stirred for 2 h at 90 °C. The obtained solution
was kept overnight to be settled down from the precipitate. The collected
suspension was washed with absolute ethanol and ultrapure water several
times to remove unreacted molecules. Similarly, Fe and Cu NPs were
prepared by the chemical reduction method using FeCl2 and
CuCl2, respectively.7 (link) However,
to confirm the formation of the spinel structure of the as-synthesized
nanoparticles, ATR-FTIR analysis was performed in the frequency range
of 400–4000 cm–1. Moreover, a BRUKER X-ray
diffractometer with CuKα radiation of a wavelength of 1.5406
Å was used to study the crystallinity and phase formation of
the MNF sample over the angular range of 10–90°.
ultrapure water and stirred at 90 °C. Then, 17.0358 g of ZnCl2 (0.5 M) solution was prepared and kept in a burette. The
solution was then dropwise added into the NaOH solution for 26 min
and was continuously stirred for 2 h at 90 °C. The obtained solution
was kept overnight to be settled down from the precipitate. The collected
suspension was washed with absolute ethanol and ultrapure water several
times to remove unreacted molecules. Similarly, Fe and Cu NPs were
prepared by the chemical reduction method using FeCl2 and
CuCl2, respectively.7 (link) However,
to confirm the formation of the spinel structure of the as-synthesized
nanoparticles, ATR-FTIR analysis was performed in the frequency range
of 400–4000 cm–1. Moreover, a BRUKER X-ray
diffractometer with CuKα radiation of a wavelength of 1.5406
Å was used to study the crystallinity and phase formation of
the MNF sample over the angular range of 10–90°.
8
Relative Crystallinity Index Estimation via XRD
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The XRD patterns were obtained using an X-ray diffractometer (Bruker, Germany) with Ni-filtered Cu Kα radiation at 40 kV and 40 mA. The diffraction data were collected from 2θ = 5−45°, 30 min per sample. The relative crystallinity index (CrI) was estimated using XRD peak height method17 (link),18 (link) and calculated as eq. 2 . where, I002 is the peak intensity of the (002) lattice diffraction at 2θ ≈ 22.3°, which represents both the crystalline and amorphous regions, and Iam is the diffraction intensity of amorphous fraction at 2θ ≈ 18.3°.
9
Characterization of Advanced Materials
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STEM and HRTEM images were recorded on a Cs-corrected Titan 80–300 microscope operated at 300 kV. X-ray diffraction patterns were obtained using an X-ray diffractometer (Bruker, Germany) with Cu-Kα radiation. The 2θ scanning range was 10° to 80° with a scanning speed of 0.1° s−1. XPS was performed using an ESCALAB 250 spectrometer with Al Kα X-ray excitation (1,486.6 eV). Raman spectra were measured using an Invia-Reflex Raman system using a 785-nm laser. UV–vis and fluorescence spectra were obtained using Hitachi U-3010 and F-4500 spectrophotometers, respectively. ROS were detected using the ESR technique (ESP300E, Bruker).
10
X-Ray Diffraction Analysis of Peptide-Calcium Chelate
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The crystal structures of the peptide and peptide–calcium chelate were investigated with an X-ray diffractometer (Bruker Daltonic, Germany) with a Cu target anode material according to the method of Zhang et al. [21 (link)]. The system was operated at 2θ of 10–80°, 40 kV, 40 mA, with a scanning speed of 5°/min.
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