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Ilf 835

Manufactured by Jasco

The ILF-835 is a laboratory equipment device that provides a controlled environment for various scientific experiments and applications. It offers precise temperature and humidity regulation to create a stable and consistent testing environment. The core function of the ILF-835 is to maintain specific environmental conditions for research, analysis, and product testing purposes.

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3 protocols using ilf 835

1

Comprehensive Characterization of Composite Materials

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Thermogravimetric (TG) measurements were performed with Mettler TGA 2 up to 800 °C at a heating rate of 10 °C min−1 under air flow (40 mL min−1). Powder X-ray diffraction (XRD) measurements were carried out with PANalytical X'PERT-PRO MPD using Ni-filtered Cu Kα radiation. The morphologies of the composites were observed with a Hitachi SU8220 field-emission scanning electron microscope (SEM) operated at 1 kV. Energy dispersive X-ray (EDX) analysis was performed using a Bruker XFlash 5060FQ energy dispersive X-ray spectroscope. Brunauer–Emmett–Teller (BET) specific surface area was measured using Quantachrome Monosorb. The adsorbed gas was N2 (20%) and He (80%) at 77 K. Prior to the BET surface area measurements, the samples were dried under the gas flow at 150 °C for 10 min. UV-vis absorption measurements were conducted with Hitachi U-4100 and U-3900H spectrophotometers. Excitation and emission spectra and absolute photoluminescence quantum yields (ΦPL) were obtained with JASCO FP-8500 spectrofluorometer equipped with an integrating sphere unit ILF-835. X-ray photoelectron spectroscopy (XPS) was carried out using JEOL JPS-9010MC.
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2

Photophysical Characterization of Emitters

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Steady-state PL emission and PL excitation spectra were measured with a spectrofluorometer (JASCO FP-8500) utilizing a Xenon arc lamp with a power of 150 W. PLQE was measured using the same spectrofluorometer equipped with a 100 mm integrating sphere (ILF-835) coated with barium sulfate and the value was calculated using Jasco SpectraManager II software. A correction for taking account of absorption from the scattered light (i.e., indirect configuration) was performed in order to rule out the possibility of overestimating the PLQE when measuring highly scattering powder samples56 (link),57 (link). Confocal PL mapping was performed using an XperRam 200 (Nanobase Inc.) instrument with a 405-nm laser excitation source and a diffraction-limited laser spot size of ~1 μm. Temperature-dependent PL measurements were conducted using the same equipment (XperRam 200, Nanobase Inc.), with the temperature controlled by liquid N2.
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3

Absorption and Emission Spectroscopy Protocol

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Steady-state absorption spectra were recorded in 10 × 4 mm UV-grade quartz cuvettes (29-F/Q/10, Starna GmbH, Pfungstadt, Germany) on a JASCO V-650 spectrometer (JASCO Germany GmbH, Groß-Umstadt, Germany). The spectra were offset corrected and normalized. Emission spectra were recorded in 10 × 4 mm UV-grade quartz cuvettes (29-F/Q/10, Starna GmbH) with a JASCO FP 8500 fluorescence spectrometer. Prior to normalization, the spectra were corrected for offset, absorption and reabsorption artifacts as well as the spectral characteristics of the experimental equipment. The JASCO FP 8500 spectrometer was equipped with a 100 mm integrating sphere (ILF-835, JASCO) and used for absolute fluorescence quantum yield (QY) determinations. For anisotropy studies, the spectrometer was equipped additionally with two automatized polarization filters as polarizer and analyzer (FDP-837, JASCO).
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