Belsorp mini
The BELSORP-mini is a compact and automated gas adsorption analyzer designed for the measurement of the specific surface area and pore size distribution of solid materials. It utilizes the volumetric method to determine the adsorption and desorption isotherms of gases, providing detailed information about the physical and structural properties of the sample.
Lab products found in correlation
12 protocols using belsorp mini
Characterization of Polyoxotungstate-Polymer Catalysts
Biochar Microstructure Analysis
Characterization of HPBG Powder by XRD, SAXS, SEM, and TEM
Detailed Characterization of Materials
Surface Area Analysis via N2 Adsorption
Comprehensive Materials Characterization Protocol
(XRD) patterns were collected on a Unisantis XMD300 powder diffractometer
unit using Cu Kα (λ = 1.5418 Å). FTIR spectra were
recorded using a Bruker α II spectrophotometer in the range
of 400–2000 cm–1. Thermal properties of the
ZHF nanohybrid were determined using an SDT Q600 V20.9 Build 20 instrument
operated under an argon atmosphere at a flow rate of 50 mL/min from
25 to 720 °C at a rate of 5 °C/min. The morphologies and
texture of the carbon materials were characterized using a field emission
scanning electron microscope (FESEM) (MIRA3, TESCAN) and a transmission
electron microscope (FEI Tecnai F20 at 200 kV). Elemental analysis
was also performed by using energy-dispersive X-ray spectroscopy (EDS,
XFlash 6130 detector, Bruker). The surface area and pore size distribution
of the carbon materials were determined using a BELSORP measuring
instrument (BELSORP-mini, Japan, Inc.) using nitrogen gas adsorption–desorption
technique at 77 K. X-ray photoelectron spectroscopic (XPS) measurement
was performed on a Thermo Scientific K-Alpha X-ray photoelectron spectroscope
using Al Kα and spot size 400 μm.
Comprehensive Characterization of Nanoparticles
Comprehensive Characterization of Synthesized Material
material was characterized
using a field-emission scanning electron microscope (JEOL JSM-7610-F)
and a high-resolution transmission electron microscope (JEOL JEM-ARM200F).
The powder diffraction pattern of the sample was obtained with the
Bruker (D8 advance) X-ray diffractometer using the Cu X-ray source
(1.5406 Å) with a Ni-filter. The laser Raman spectra of the synthesized
sample were collected using the dispersive Raman spectrometer (SENTERRA,
Bruker) using 532 nm as an excitation wavelength. The specific surface
area of the material was carried out by employing the BELSORP-mini
(MicrotracBEL Corp.), where the material was degassed at 120 °C
for 12 h before the analysis. The impurity present in the exfoliated
material was studied with the Linseis thermogravimetric analyzer (STA
PT1600) under an oxygen atmosphere.
Comprehensive Material Characterization by XRD, TEM, XPS, and Adsorption
Comprehensive Structural and Compositional Analysis of Cu-MOF
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