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S 4500 instrument

Manufactured by Hitachi

The S-4500 is a scanning electron microscope (SEM) instrument manufactured by Hitachi. It is designed to provide high-resolution imaging of samples by using a focused electron beam to scan the surface. The S-4500 is capable of producing detailed images and performing elemental analysis of materials.

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4 protocols using s 4500 instrument

1

Scanning Electron Microscopy Imaging Protocol

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SEM imaging was performed with a Hitachi S-4500 instrument. For measurements, samples were placed on a conductive adhesive pad. Imaging was done with 1 kV accelerating voltage on a secondary electron detector. All investigated samples were ground and taken from the sorption tubes after conduction of physisorption measurements before imaging.
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2

Synthesis and Characterization of Metal Nanoparticles

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Sodium borohydride (NaBH4), ascorbic acid, silver nitrate (AgNO3), tetrachloroauric acid (HAuCl4), Thioflavin-S (ThS) and Aβ15-20 were purchased from Sigma-Aldrich. N-cetyltrimethylammonium bromide (CTAB) was obtained from Alfa Aesar. 2-aminoethanethiol was purchased from Aladdin. Aβ1-40 was obtained from American peptide. POMs were gifts from Prof. Wang. All the chemicals were used as received without further purification. Distilled water (18.2 MΩ; Millpore Co., USA) was used in all experiments and to prepare all buffers. Ultraviolet-visible spectroscopy (UV-vis) measurements were recorded on a Jasco-V550 UV-Vis spectrophotometer. To determine the composition of the as-prepared samples, in situ energy-dispersive X-ray spectroscopy (EDS) analysis were performed using a HITACHI S-4500 instrument. X-ray photoelectron spectra (XPS) were acquired on an ESCALab220i-XL electron spectrometer from VG Scientific using 300W Al Kα as the excitation source. The binding energies obtained in the XPS spectral analysis were corrected for specimen charging by referencing C1s to 284.8 eV. TEM images were recorded using a FEI TECNAI G2 20 high-resolution transmission electron microscope operating at 200 kV. The zeta potential of the nanoparticles in water was measured in a Zetasizer 3000HS analyzer.
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3

Surface Morphology Analysis of CNT Arrays

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For structure observation, SEM images were taken using a Hitachi S-4500 instrument to observe the surface morphologies of the CNT arrays and target surfaces.
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4

Scanning Electron Microscopy of Thin Films

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SEM analyses were conducted using a Hitachi S-4500 instrument operating at spatial resolution of 1.50 nm at 15 kV energy. The samples were prepared by spin coating of 50 μL of the solution on a silicon wafer. The samples were then placed on a flat mount after being coated with an ultrathin layer of electrically conducting platinum deposited by high-vacuum evaporation.
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