Asap2010 volumetric adsorption analyzer

High-resolution transmission electron microscopy (HRTEM) images were taken using a transmission electron microscope F20X-TWIN (FEI-Tecnai). In addition, Z-contrast imaging was done with a scanning TEM equipped with a Fischione HAADF (High Angle Annular Dark Field) detector. Both devices operated at a voltage of 200 kV. For thermogravimetric measurements of the atmosphere, simultaneous TGA-DTA Thermal Analysis TA Instruments (SDT 2960) was used at a temperature range of 293-1073 K at a heating rate of 10K/min. Nitrogen adsorption isotherms were measured using an ASAP2010 volumetric adsorption analyzer from Micromeritics (Norcross, GA), which was operated at the temperature of liquid nitrogen (77K) and at pressures ranging from about 10⁻⁶ to 0.999. The A0-o-C1 samples were degassed for 2 hours at temperature of 473K whilst the samples loaded with C2 and/or C3 were heated at 373K.

The morphology of the produced scaffolds was studied using a Quanta scanning electron microscope with field emission (SEM, Quanta 3D FEG, Huston, TX, USA). Phase homogeneity was confirmed using X-ray diffraction (XRD, Philips X “Pert with X’Celerator Scientific detector) using CuKα radiation and an incident angle of 2◦. Elemental analysis was illustrated using energy-dispersive X-ray spectroscopy (Quantax 200 XFlash 4010, Bruker AXS, Karlsruhe, Germany)). Low temperature N₂ adsorption isotherms were measured using an ASAP2010 volumetric adsorption analyzer from Micromeritics (Nor-cross, GA) at liquid nitrogen temperature (77 K) in the relative pressure range from about 10⁻⁶ up to 0.999. Before the measurements, the samples were outgassed for 2 h at a temperature of 373 K.

The porosity of the cleaned combustion products was characterized by low-temperature nitrogen adsorption, the relevant isotherms of all samples were measured at 77.4 K on the ASAP 2010 volumetric adsorption analyzer (Micromeritics, Norcross, GA, USA). Before each adsorption measurement, the sample was outgassed under vacuum at 200 °C. Scanning electron micrograph study was performed with using DSM 942 (Carl Zeiss, Jena, Germany) scanning electron microscope (SEM) for EHT = 2.00 kV.