The phase of the catalyst was determined by X-ray diffraction (XRD, D8-Advance, Bruker, Germany) with a diffraction angle from 5° to 70°. The morphologies and microstructures of the samples were observed by scanning electron microscopy (SEM, Zeiss Sigma) and high-resolution transmission electron microscopy (HRTEM, FEI Tecnai G2 f20 s-twin 200 kV). X-ray photoelectron spectroscopy (XPS, K-Alpha model by Thermo Fisher Scientific) analysis was performed, and all binding energies were calibrated with the binding energy of C 1s as reference. The specific surface areas of the samples were measured with a gas sorption analyzer Autosorb-iQ instrument. Fourier transform infrared (FT-IR) spectroscopy (Shimadzu FTIR-8400, Japan) was used to detect the change in chemical bonds of the catalyst before and after utilization.
K alpha model
Manufactured by Thermo Fisher Scientific
Sourced in United States
The K-alpha model is a laboratory equipment product offered by Thermo Fisher Scientific. It is designed to perform X-ray photoelectron spectroscopy (XPS) analysis. The core function of the K-alpha model is to provide detailed surface chemical analysis of solid materials.
Automatically generated - may contain errors
Lab products found in correlation
Model 6000, by Shimadzu (2 mentions)
Ht7700, by Hitachi (2 mentions)
Asap 2020 hd88, by Micromeritics (2 mentions)
Tecnai g2 f20 s twin 200 kv, by Thermo Fisher Scientific (1 mentions)
Ftir 8400, by Shimadzu (1 mentions)
D8 advance, by Bruker (1 mentions)
Varian 660 ir spectrometer, by Agilent Technologies (1 mentions)
Avantage, by Thermo Fisher Scientific (1 mentions)
Cary 500, by Agilent Technologies (1 mentions)
S 4700 scanning electron microscope, by Hitachi (1 mentions)
Jsm 7800f, by JEOL (1 mentions)
8 protocols using k alpha model
1
Catalyst Characterization Techniques
2
Comprehensive Characterization of Samples
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The samples underwent a comprehensive characterization process. Initially, optical microscopy was employed for initial visualization. The vibrational modes were thoroughly analyzed using Fourier-transform infrared spectroscopy (FTIR), where samples mixed with potassium bromide (KBr) were subjected to a temperature of 150 °C for 24 h. High-resolution measurements were carried out with a Varian 660-IR spectrometer (Agilent, Santa Clara, CA, USA), set to 1 cm−1 resolution, and comprising 20 scans per measurement to guarantee the accuracy and reliability of the spectral data. For morphological analysis, field-emission scanning electron microscopy (FE-SEM) was performed using a JEOL 7401F microscope (Tokyo, Japan), enabling detailed observation of the samples’ surface and structure. Additionally, chemical composition and atomic-level studies were conducted using X-ray photoelectron spectroscopy (XPS) on a Thermo Fisher Scientific K-alpha model (Waltham, MA, USA). This utilized a monochromatic Alkα X-ray source for excitation, ensuring precise compositional analysis. All measurements were executed at room temperature to ensure consistent and reliable conditions across the analyses.
3
Elemental Composition Analysis by XPS
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The elemental composition and oxidation states of the specimen were ascertained by utilizing an X-ray Photoelectron Spectrometer (XPS). The analysis was conducted using the K-alpha model provided by Thermo Scientific, a company based in the United States. The XPS system employed in this study utilizes monochromatic Al Kα X-ray radiation, characterized by a source energy of 1486.6 eV. This specific energy facilitates accurately determining binding energies corresponding to various elements in the analyzed sample. Data was acquired and processed using the Avantage commercial software (version 5.932, Thermo Scientific, USA). The XPS data was recorded, and initial processing steps, such as background correction and noise reduction, were performed using comprehensive software.
4
X-Ray Photoelectron Spectroscopy of Powder Samples
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As-obtained powder samples was stuck to conductive paste and then measured by X-ray photoelectron spectroscopy using K-Alpha+model (Thermo Fischer Scientific, UK) with Al Kα source.
5
Characterization of Ag-TiO2/GF Photocatalysts
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A Hitachi S-4700 scanning electron microscope (SEM) was used to determine the surface morphologies of the Ag-TiO2/GF photocatalytic materials. X-ray diffraction (XRD) patterns were obtained using a Bruker AXN model with a Cu-Kα radiation (λ = 1.5418 Å) source operated at a scan rate of 0.02 s−1 over a 2θ range of 10–80°. A Varian Cary 500 was used to record the UV-visible diffuse reflectance spectra (DRS) of photocatalysis materials. X-ray photoelectron spectroscopy (XPS) measurements were performed using a Thermo Fisher K-alpha model to determine the chemical composition of Ag-TiO2/GF photocatalysts.
6
Structural and Optical Characterization of Thin Films
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The distinct film thicknesses were measured using a profilometer (Dektak, Bruker, MA, USA). Their structural characteristics were analyzed using X-ray diffraction (XRD; INEL EQUINOX 2000) with Cu-Kα radiation (wavelength, λ = 0.15406 nm). The chemical composition and sample features were evaluated using X-ray photoelectron spectroscopy (XPS; K-Alpha model, Thermo Fisher Scientific, Waltham, MA, USA) with an Al–Kα monochrome X-ray source (for calibration, the C1s peak was used as the reference). The film’s optical properties were characterized via photoluminescence (PL) measurements (Hamamatsu photomultiplier attached to a SPEX spectrometer with a focal length of 50 cm); the film’s PL spectra were recorded with the 325 nm emission line of a 200 mW He–Cd laser. The surface morphologies of the produced films were examined using field-emission scanning electron microscopy (FESEM; JSM-7800F, JEOL, Tokyo, Japan) with an acceleration voltage of 3–5 kV. All of the characterizations were carried out at room temperature.
7
Comprehensive Catalyst Characterization
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The catalysts were characterized by powder XRD. The XRD patterns with diffraction intensity versus 2θ were recorded in a Shimadzu X-ray diffractometer (Model 6000) using Cu Kα radiation. TEM studies were conducted on the Hitachi HT-7700 with an accelerating voltage of 120 kV. High-resolution and dark-field TEM images were acquired from the Tecnai G2 F20 S-twin TEM at 200 kV. Surface area was measured by N2 physisorption (Micromeritics, ASAP 2020 HD88) based on Brunauer–Emmet–Teller method. X-ray photoelectron spectroscopy were acquired using a Thermo Electron Model K-Alpha with Al Kα as the excitation source.
8
Characterization of Catalysts via XRD, TEM, and XPS
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The catalysts were characterized by a Shimadzu X-ray diffractometer (Model 6000) using Cu Kα radiation. TEM studies were conducted on the Hitachi HT-7700 with an accelerating voltage of 120 kV. High-resolution and dark-field TEM images were acquired from the Tecnai G2 F20 S-twin transmission electron microscope at 200 kV. The surface area was measured by N2 physisorption (Micromeritics, ASAP 2020 HD88) based on Brunauer-Emmet-Teller (BET) method. XPS were acquired using a Thermo Electron Model K-Alpha with Al Kα as the excitation source.
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