Smartlab xrd system

A Rigaku SmartLab XRD system was adopted to study the crystalline structure of iPP samples. The wavelength is set as 1.5418 Å, the voltage as 40 kV, and the current as 40 mA. XRD pattern was recorded over angles ranging from 10° to 35° with a scan rate of 4 °/min. The relative content of β-crystal, K_β, could be calculated using Tuner–Jones formula [29 (link)].
$K_{\mathsf{\beta }}=\frac{A_{\mathsf{\beta }(300)}}{A_{\mathsf{\beta }(300)}+A_{\mathsf{\alpha }(110)}+A_{\mathsf{\alpha }(040)}+A_{\mathsf{\alpha }(130)}},$
where $A_{\mathsf{\beta }(300)}$ represents the diffraction intensity of β(300) plane at diffraction angle 2θ = 16.1°. $A_{\mathsf{\alpha }(110)}$ , $A_{\mathsf{\alpha }(040)}$ , and $A_{\mathsf{\alpha }(130)}$ represent the diffraction intensities of α(110), α(040), and α(130) planes at diffraction angles 2θ = 14.1°, 16.9°, and 18.5° in the XRD pattern, respectively.

The X-ray diffraction (XRD) measurement for TiO₂/Ti was performed by using a SmartLab XRD system (Rigaku, Tokyo, Japan). The thickness of the TiO₂ on the Ti substrate was measured by using a SE-2000 spectroscopic ellipsometer (Semilab Japan, Tokyo, Japan). The EGFET in this study was assembled by using a 2N7000 N-channel enhancement-type MOSFET (ON Semiconductor, Phoenix, AZ, USA). The pH and glucose measurements of our EGFETs were performed by using an RE-1B Ag/AgCl reference electrode (ALS, Tokyo, Japan) and a B1500A semiconductor device analyzer (Keysight, Tokyo, Japan). The pH change in the PBS during measurement was monitored by using an AT-610ST titrator equipped with a C171 glass electrode (Kyoto Electronics, Kyoto, Japan). The thickness, roughness, optical absorption, and surface morphology of the SF membrane were measured by using a DektakXTS-0K1704 stylus-type step profiler (Bruker Japan, Kanagawa, Japan), an SPM9700 atomic force microscope (AFM) (Shimazu, Kyoto, Japan), an FTIR-8400S Fourier transform infrared spectrometer (FTIR) with a DRS-8000A diffuse reflector (Shimazu, Kyoto, Japan), and a VE8800 scanning electron microscope (SEM) (Keyence, Osaka, Japan), respectively.