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Labx xdr 6000

Manufactured by Shimadzu
Sourced in Japan

The Labx-XDR 6000 is a high-performance X-ray diffractometer designed for advanced materials analysis. It features a powerful X-ray source, precision goniometer, and advanced detector technology to provide accurate and reliable data on the crystal structure, phase composition, and other properties of a wide range of materials.

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2 protocols using labx xdr 6000

1

Comprehensive Characterization of Material Samples

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Elemental analyses (CHN) of the samples were performed in a Perkin-Elmer PE-2400 microelemental device. The samples were characterized by X-ray diffractometry (XRD), using a Shimadzu diffractometer (model Labx-XDR 6000, Japan) operating at 40 kV and 30 mA, with Cu Kα radiation (λ = 1.5406 Å) and 3 to 75° 2θ range with a speed of first min−1. The Fourier transform infrared spectroscopy (FTIR) analyses of the samples were performed in a Bruker Vertex 70 model equipment (Germany) by preparing KBr pellets at 1% (m/m). FTIR spectra were obtained with a resolution of 4 cm−1, 120 scans between 4000 and 400 cm−1. The morphology was carried out by scanning electron microscopy (SEM), using a field emission electron source (SEM-EC) device from FEI, model Quanta FEG-250 (Eindhoven, Netherlands). The samples were mounted on stubs using double-sided carbon tape and covered in gold. The SEM analysis conditions were from 8 to 20 kV, and the working distance was 10 mm with point 3. The thermal stability of the samples was studied using the thermogravimetry technique (TG). TG curves were obtained using the TGA-50 Shimadzu (Japan) device at 10 °C min−1 heating rate in an argon atmosphere in alumina pun at 25 to 800 °C, and a mass of approximately 8 mg. Dye solutions were scanned using a UV-Vis spectrophotometer Cary 60, Agilent Technologies (USA), between 250 and 800 nm.
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2

Comprehensive Characterization of Crystalline Structure

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The crystal structure was investigated by X-ray diffraction in a scanning range of 2θ = 3° to 75° using an X-ray diffractometer Shimadzu, model Labx-XDR 6000, with Cu-Kα radiation (λ = 1.5406 Å in the Bragg–Betano configuration. Scanning Electron Microscopy (SEM) using a scanning electron microscope with an electron source by field emission FEG (Field Emission Gun), Quanta FEI 250. Spectroscopy in the Fourier Transform Infrared Region (FTIR) was performed on a Perkin Elmer SPECTRUM 400 (FTIR/FT-NIR) spectrometer with a sweep from 4000 to 400 cm−1. The textural properties of the solids were investigated based on the nitrogen adsorption–desorption isotherms using Quantachrome (Autosorb-iQ Instruments) results. The surface area, pore volume, and diameter were calculated using the Brunauer–Emmett–Teller (BET) method based on N2 adsorption–desorption. The material’s bandgap (Eg) was determined using a Shimadzu spectrophotometer Model UV-3600 with a diffuse reflectance accessory monitoring the region of 200 to 800 nm and was calculated through a series of mathematical transformations proposed in the Kubelka–Munk method.
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