Su 70 analytical sem

Scanning electron microscopy (SEM) images were taken with Hitachi SU-70 analytical SEM (Japan). Powder X-ray diffraction (PXRD) data were collected on a Bruker D8 X-ray diffractometer using Cu Kα radiation (λ = 1.5418 Å). Raman spectroscopy was performed on a Horiba Jobin Yvon Labram Aramis using a 532 nm diode-pumped solid-state laser, attenuated to give ~900 μW power at the sample surface. Viscosity Measurements were carried out using a CANNON-FENSKE viscometer.

Raman measurements were carried out by a Horiba Jobin Yvon Labram Aramis using a 532 nm diode-pumped solid-state laser, attenuated to give ~900 μW power at the sample surface. Scanning electron microscopy (SEM) measurements were carried out by Hitachi SU-70 analytical SEM (Japan). Viscosity measurements were carried out using a CANNON-FENSKE viscometer. The surface chemistry of the electrodes after ALD coating was examined by XPS with a Kratos Axis 165 spectrometer. XPS data was collected using a monochromated Al Ka X-ray source (1486.7 eV). The working pressure of the chamber was lower than 6.6 × 10⁻⁹ Pa. All reported binding energy values were caLIBrated to the C 1s peak at 284.8 eV.