Model jem 2100
The JEOL JEM-2100 is a high-performance transmission electron microscope (TEM) designed for advanced materials analysis. It features a LaB6 electron source and an accelerating voltage of up to 200 kV, enabling high-resolution imaging and analysis of a wide range of samples. The JEM-2100 is capable of providing detailed structural and compositional information at the nanoscale level.
Lab products found in correlation
10 protocols using model jem 2100
Glycofullerene Characterization by TEM
TEM Analysis of GO and GO-HN2 Platelets
Structural and Morphological Characterization
Morphological Analysis of Solid Dispersions
Comprehensive Characterization of Carbon Dots
Characterizing Glycofullerene Nanostructures by TEM
Multimodal Characterization of Nanomaterials
Characterization of M-TiO2@rGO Composites
Comprehensive Materials Characterization
Membrane Characterization via Advanced Microscopy
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