Nova nanosem npe218

The as-prepared products were characterized on an XRD (Bruker-D8 advance) equipped with a Cu Kα radiation source (λ = 1.5418 Å) at a scanning rate of 6 ° min⁻¹; X-ray tube voltage and current were set at 40 kV and 40 mA, respectively. SEM, TEM, and HAADF-STEM images were taken with an FEI Nova NanoSEM NPE218, JEM-2100, and JEM-ARM200F, respectively. The samples were prepared by dropping ethanol dispersion of samples onto carbon-coated copper TEM grids using pipettes and dried under ambient condition. EELs were recorded using an FEI Talos F200X equipped with super-EDX and energy filter (Gatan GIF Quantum ER 965) operated at 200 kV under STEM mode. By using Gatan Quantum 965 with dual EELs capability, both low- and high-loss region were collected near simultaneously, which allows accurate measurement of chemical shifts as EELs SI analysis was carried out. XPS was performed on an AXIS ULTRA DLD X-ray photoelectron spectrometer. UV-Vis absorption spectrum was obtained from Lambda 750S (Perkin Elmer, Inc., USA). Elemental content was tested by EDX and ICP-optical emission spectroscopy (iCAP7600). Raman spectra were recorded by a DXR Raman spectrophotometer (Thermo Fisher Scientific) at an excitation radiation wavelength of 532 nm.