The largest database of trusted experimental protocols

26 protocols using aztec

1

Characterization of Nanoparticles by Spectroscopy

Check if the same lab product or an alternative is used in the 5 most similar protocols
ATR-FTIR spectra were recorded at a resolution of 4 cm−1 over the 4000–700 cm−1 range using a NICOLET IZ10 spectrometer (Thermo Scientific, Waltham, MA, USA) equipped with a germanium ATR crystal and a single reflection angle 45° horizontal ATR accessory. The UV-Vis spectroscopic analysis was performed using a DR 3900 UV-Vis spectrophotometer (Hach Lange, Loveland, CO, USA) equipped with 1 cm quartz cuvettes. High-resolution transmission electron microscopy (HR-TEM) analysis was carried out using transmission electron microscopy/scanning transmission electron microscopy (TEM/STEM) system (Titan 80-300, FEI, city, state abbrev if USA, country) with a super twin-lens operated at 300 kV and equipped with an annular dark field detector. The presence of various elements in the obtained nanoparticles was analysed using energy-dispersive X-ray spectroscopy (EDX, Aztec, Oxford Instruments, Abingdon, UK). ICP-MS (Elan 6000, Perkin Elmer, Waltham, MA, USA) was used to determine the Pd/Pt concentration.
+ Open protocol
+ Expand
2

Particle Characterization via FE-SEM and Zetasizer

Check if the same lab product or an alternative is used in the 5 most similar protocols
Primary particle size, shape, and chemical characterization were determined by FE-SEM (JSM-7100F, JEOL, Tokyo, Japan), equipped with EDS (Aztec, Oxford Instruments, Abingdon, UK). Zeta potentials and hydrodynamic radii of particles (1 mg/mL) were measured with Zetasizer Nano System (Malvern Instruments, Worcestershire, UK) after stirring for 30 min, sonication for 15 min (Bransonic 5800, Branson Ultrasonics, Danbury, CT, USA), and dilution (0.1 mg/mL).
+ Open protocol
+ Expand
3

Microstructural Analysis of Metallic Materials

Check if the same lab product or an alternative is used in the 5 most similar protocols
The microstructure of materials was studied using an optical microscope (OM-Olympus PME3) and a scanning electron microscope (SEM—TESCAN LYRA) equipped with an EDS analyzer (OXFORD Instruments AZtec). Prior to the observations, the samples were ground using SiC grinding papers (P400–P2000), then polished with diamond paste D2 (UR-diamant, 2 µm) and finally polished on suspension Etosil E (Metalco, 0.06 µm). The average grain size was calculated using image analyses (ImageJ) on several images. For each grain, the Feret′s diameter was measured. The phase composition of the materials was determined by X-ray diffraction. Measurements were made at ambient temperature using the X’Pert3 Powder instrument with Bragg–Brentano geometry equipped by a Cu anode (λ = 1.5418, U = 40 kV, I = 30 mA). The evaluation of the results was performed using HighScore Plus 4.0 and Topas 3 software. The names and reference codes of the evaluated phases in PDF 4 database were Zn (01-078-9363), Mg2Zn11 (04-007-1412), MgZn2(04-008-6026) and Mg (04-013-4129). The details of the microstructure were studied by transmission electron microscope (TEM-EFTEM Jeol 2200 FS, accelerating voltage 300 kV, LaB6). The samples for TEM were prepared using the Gatan PIPS polishing system with Ar ions (Gatan, Pleasanton, CA, USA).
+ Open protocol
+ Expand
4

Surface Characterization of Materials

Check if the same lab product or an alternative is used in the 5 most similar protocols
Mechanical grinding and polishing were used for surface pre-treatment. Final polishing was performed using an Eposil F suspension (Metalco Testing s.r.o, Roztoky u Prahy, Czech Republic). The microstructure was characterized by optical microscopy and scanning electron microscopy (TescanVEGA3, TESCAN Brno, s.r.o, Brno, Czech Republic) equipped with Energy-Dispersive X-Ray Spectroscopy-EDS (AZtec, Oxford Instruments, Abingdon, United Kingdom).
+ Open protocol
+ Expand
5

Characterization of BPLP Composites

Check if the same lab product or an alternative is used in the 5 most similar protocols
To assess the morphology and homogeneity of BPLP composites, disks 6 × 2 mm (diameter × height) were formed via press-fit into PDMS molds. Composites were subsequently removed, mounted for SEM imaging, and sputter coating with a 5nm iridium layer (Emitec Sputter-Coater). Samples were imaged using an Apreo S LoVac SEM (Thermo Fisher Scientific, Waltham, MA). EDS analysis was conducted using AZtec (Oxford Instruments, Abingdon, UK).
+ Open protocol
+ Expand
6

SEM and EDS Analysis of Fracture Water Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
Four silicon wafers incubated in the fracture waters containing PFA-fixed, dehydrated in situ growth samples were analyzed by scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy chemical analysis (EDS) at the Penn State Materials Characterization Lab (University Park, PA, USA) using a Nova NanoSEM 630. Samples were coated in 3 nm iridium to enhance conductivity prior to imaging. EDS spectra were collected from 0–5 keV, and images were compiled using the software package AZtec (Oxford Instruments, Concord, MA, USA), excluding the iridium coating signal from the resulting spectra.
+ Open protocol
+ Expand
7

Microstructure Characterization via MIRA3 SEM and EBSD

Check if the same lab product or an alternative is used in the 5 most similar protocols
A MIRA3TM (LM) field emission scanning electron microscope from TESCAN was used for microstructure characterization. We used AZtec from Oxford Instruments at 20 kV to perform an EBSD analysis to obtain information on deformation twinning. Scanning the selected region of each image with a step size of 0.5 μm took approximately 20 minutes. At each location, an SEM image was captured in greyscale, and the corresponding EBSD image was captured in colour to reveal different crystallographic orientations. The phase Figures with twin boundaries marked in red were generated from the EBSD images. The austenitic phase is shown in blue, and martensitic phase is shown in green.
+ Open protocol
+ Expand
8

Sediment Composition Analysis in the Arctic

Check if the same lab product or an alternative is used in the 5 most similar protocols
A sediment sample from the Arctic Ocean was analysed to characterize the average mineralogical composition of the sediment in the area where Cores 880B MC and 893B MC were collected. In order to do so, the sediment fraction <63 μm was dried, mounted on carbon tape, and carbon-coated. EDS analysis of the sample were conducted using a SEM Zeiss Merlin VP Compact equipped with an EDS x-max 80 system by Oxford instruments, combined with the analytical software AZtec (The Arctic University of Norway in Tromsø, Tromsø, Norway).
+ Open protocol
+ Expand
9

Microstructure Characterization via EBSD

Check if the same lab product or an alternative is used in the 5 most similar protocols
MIRA3 (LM) field emission SEM from TESCAN was employed for microstructure characterization. We used AZTEC from Oxford Instruments to perform EBSD analysis and obtain the information for deformation twinning.
+ Open protocol
+ Expand
10

Characterization of ZnO-Coated Fiber-Optic Sensors

Check if the same lab product or an alternative is used in the 5 most similar protocols
All measurements from ball resonator optical fibers were performed using an optical backscatter reflectometer (OBR, LUNA OBR 4600) in the scan range from 1525 nm to 1610 nm with a gain of 0 dB and a resolution bandwidth of 0.258 Hz, recording 65,536 data points for each measurement. The spectra of ball resonators were demodulated using an optical backscatter analyzer (OBR; Luna OBR4600, Luna Inc., Roanoka, VA, USA). The surface morphology of a zinc oxide coated fiber-optic spherical tip was studied using a scanning electron microscope (SEM, Auriga Crossbeam 540, Carl Zeiss, Oberkochen, Germany) equipped with energy-dispersive X-ray spectroscopy (EDX, Aztec, Oxford Instruments, Abingdon, UK), which was used for elemental analysis, and also with transmission electron microscopy studies (TEM, JEOL, JEM-1400 plus, Peabody, MA, USA). To detect various characteristic functional groups, an infrared absorption spectrophotometer with Fourier transform FTIR Nicolet iS10 (Thermo Fisher Scientific Inc., Tokyo, Japan) was used. Nitrogen was used as purge gas. All measurements were carried out at room temperature 22 °C. The structural properties of the semiconductor coating were studied on a Rigaku SmartLab X-ray diffractometer (XRD, Rigaku Corp., SmartLab.,Tokyo, Japan).
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!