Transmission electron microscopy (TEM) was performed by a FEI Tecnai F-20 TEM (Hillsboro, USA) instrument at an accelerating voltage of 200 kV. TEM samples were prepared by dropping the C-dots aqueous solution onto carbon-coated copper grid which was left to dry before analysis. Fourier transform infrared (FTIR) spectra were recorded using Bruker Tensor 27 FTIR spectrometer (Bruker, Germany) at a resolution of 4 cm−1 in the range of 400–400 cm−1. The C-dots/KBr disk was prepared by mixing few milligrams of C-dots with about 100 mg of KBr powder, grinding to approximately 2 μm in a mortar and subjecting to 29.7 MPa pressure by a pressing machine. X-ray photoelectron spectroscopy (XPS) was performed by using Krato XPS instrument (Krato, UK) with AIKα radiation operating at 1486.6 eV. UV-vis absorption spectra were recorded on TU-1800 spectrometer (Beijing, China) in 1 cm quartz cell and the spectra were collected from 200 to 700 nm. Fluorescence spectra were obtained using F-2500 spectrometer (Hitachi, Japan) equipped with a xenon lamp as the excitation light source. Time-resolved fluorescence decay spectra were performed on an Edinburgh FLS 920 spectrometer (Edinburgh, UK) with the excitation wavelength at 320 nm.
Fls920 spectrometer
Manufactured by Edinburgh Instruments
Sourced in United Kingdom
The FLS920 spectrometer is a versatile instrument designed for a wide range of spectroscopic applications. It features high-performance optics, a sensitive detector, and customizable configurations to meet the specific needs of users. The core function of the FLS920 is to perform accurate and reliable spectroscopic measurements, enabling researchers and scientists to analyze the optical properties of various samples.
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Lab products found in correlation
Asap 2020, by Micromeritics (2 mentions)
Tecnai f20 tem, by Thermo Fisher Scientific (1 mentions)
F 2500 spectrometer, by Hitachi (1 mentions)
Tensor 27 ftir spectrometer, by Bruker (1 mentions)
Fois 1 integrating sphere, by OceanOptics (1 mentions)
Uv 3101pc uv vis nir spectrophotometer, by Shimadzu (1 mentions)
Lambda 1050 uv vis nir spectrophotometer, by PerkinElmer (1 mentions)
Bx51trf ccd microscope, by Olympus (1 mentions)
Cary eclipse fluorescence spectrofluorimeter, by Agilent Technologies (1 mentions)
Escalab 250xi x ray photoelectron spectroscope, by Thermo Fisher Scientific (1 mentions)
D max 2500, by Rigaku (1 mentions)
S 4800, by Hitachi (1 mentions)
Quanta 200 feg, by Thermo Fisher Scientific (1 mentions)
Axis ultra instrument, by Shimadzu (1 mentions)
Uv 2550 spectrometer, by Shimadzu (1 mentions)
2400 series sourcemeter, by Tektronix (1 mentions)
V 570 spectrophotometer, by Jasco (1 mentions)
V 570 spectrometer, by Jasco (1 mentions)
Axis ultra, by Shimadzu (1 mentions)
Kbr pellets, by Thermo Fisher Scientific (1 mentions)
27 protocols using fls920 spectrometer
1
Characterization of Carbon Dots
2
Near-Infrared Singlet Oxygen Luminescence
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Example 5
Luminescence measurements in the near infrared (NIR) region were performed with an Edinburgh Instruments FLS-920 spectrometer equipped with a germanium detector cooled with liquid nitrogen. The luminescence was recorded on air-equilibrated CD3CN solutions contained in 3-mL quartz cells with 1-cm path length. Deuterated acetonitrile was used as the solvent to increase the sensitivity of the measurement, owing to the significantly higher emission quantum yield of singlet oxygen in comparison with CH3CN. Compound 3 was generated in situ by exhaustive irradiation of 1 in the visible region (ca. 60 min irradiation under the conditions employed) at room temperature. The solution was then warmed up at 60° C. and its luminescence properties (spectral dispersion and time dependence of the intensity) were monitored in the absence of photoexcitation (the excitation source of the spectrometer was turned off).
3
Photoluminescence Characterization of Materials
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UV−Vis spectra were taken on an Agilent Technologies Cary 4000 UV−visible spectrophotometer. Steady-state and transient photoluminescence spectra were recorded on an Edinburgh Instruments FLS920 spectrometer. Transient photoluminescence spectra were measured via the time-correlated single-photon counting (TCSPC) method with a 405 nm picosecond laser diode with 2 MHz repetition rate. The photoluminescence lifetime τ was obtained by fitting the decay curves by a single-exponential decay function with an acceptable goodness-of-fit . The absolute photoluminescence QY was measured using an Ocean Optics FOIS-1 integrating sphere coupled with a QE pro spectrometer. The system was calibrated with a DH-3-cal standard light source.
4
Characterization of Optoelectronic Devices
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The electrical characteristics were performed by Keithley 4200 SCS at room temperature under air ambient. The photocurrent was recorded by HAMAMATSU S1336 photodiode. The optical images were captured by Olympus BX51TRF CCD microscope. The EL spectra were measured by AvaSpec-ULS2048L fiber spectrometer. The absorption spectra were recorded by Shimadzu UV-3101PC UV-vis-NIR spectrophotometer. The reflectance and transmittance were recorded by PerkinElmer Lambda 1050 UV-vis-NIR spectrophotometer. Absolute fluorescent quantum yield measurements were performed with a calibrated integrating sphere on an Edinburgh FLS920 spectrometer. The carrier mobilities were calculated by the formula for the saturation regime: IDS = μCi(W/2L)(VGS–VT)2, (where μ is the field-effect mobility, Ci is the gate dielectric capacitance density, VT is the threshold voltage, W and L are the channel width and length, respectively). The brightness was calculated by comparing the photocurrent with a standard OLED of known brightness (1000 cdm−2) and emission area (3 mm × 1 mm) with structure of ITO/NPB/Alq3:DCJTI/Alq3/LiF/Al. The EQE was calculated from the brightness, the drain current, the EL emission spectrum, and the spatial distribution of emission intensity of the devices.
5
Fluorescence Spectrophotometry Techniques
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A Varian Cary-Eclipse Fluorescence Spectrofluorimeter was used to obtain the fluorescence spectra. The spectrofluorimeter was equipped with a xenon discharge lamp (peak power equivalent to 75 kW), Czerny-Turner monochromators, R-928 photomultiplier tube which is red sensitive (even 900 nm) with manual or automatic voltage controlled using the Cary Eclipse software for Windows 95/98/NT system. The photomultiplier detector voltage was 700 V and the instrument excitation and emission slits were set at 5 and 5 nm, respectively. A closed cycle helium cryostat enclosed in an Edinburgh Instruments FLS920 spectrometer was employed for lifetime measurements.
6
Characterizing X-ray Induced Luminescence
7
Characterization of Photocatalyst Phases and Properties
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The phases of as prepared photocatalysts were characterized by X-ray power diffraction (XRD) on a Rigaku DMAX2500 X-ray diffractometer using a copper target. Particle sizes and morphologies of the samples were determined using transmission electron microscopy (TEM), high resolution transmission electron microscopy (HRTEM) on a JEM-2010 apparatus with an acceleration voltage of 200 kV and field-emission scanning electron microscopy (FE-SEM, HITACHI S-4800). Element distribution was obtained on energy-dispersive X-ray spectroscopy (EDX). UV-vis diffuse reflectance spectra (UV-DRS) of the samples were measured using a Lambda 750 UV/Vis spectrometer with BaSO4 act as the corrected baseline at room temperature. The photoluminescence (PL) spectra of the samples were recorded on Edinburgh Instruments FLS 920 spectrometer at an excitation wavelength of 320 nm. Surface composition and chemical states were analyzed with a Thermo Scientific Escalab 250Xi X-ray photoelectron spectroscope (XPS) equipped with Al Kα radiation, and the binding energy was calibrated by the C1s peak (284.6 eV) of the contamination carbon.
8
Characterization of Perovskite Solar Cells
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The surface morphology of the perovskite film and section morphology of the PSC was characterized using a field emission scanning electron microscope (FESEM, Quanta 200 FEG, FEI Co.). The time-resolved (PL) spectra were acquired using a FLS920 spectrometer from Edinburgh Instruments. The current density–voltage (J–V) curves were measured (2400 Series Source Meter, Keithley Instruments) under simulated air mass 1.5 global sunlight (AM 1.5G). The external quantum efficiency (EQE) measurement was performed through a combination system of xenon lamp, monochromator, chopper and lock-in amplifier together with a calibrated silicon photodetector. UV-Vis absorption measurements of the CeOx film were carried out in a Shimadzu UV-2550 spectrometer. The X-ray photoelectron spectroscopy (XPS) measurement was performed using an AXIS Ultra instrument (Kratos UK) at a base pressure of ∼10–8 torr at 295 K.
9
Photophysical Characterization of Air-Equilibrated THF Solutions
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All photophysical measurements were performed with freshly prepared air-equilibrated THF solutions (HPLC grade) at room temperature (298 K). UV–Vis absorption spectra were recorded on a Jasco V-570 spectrophotometer (Mary’s Court Easton, MD, USA). The samples used to make the solutions were freshly recrystallized or thoroughly washed with cooled ether/pentane prior to the measurements to remove any organic impurity. Steady state fluorescence studies were performed in dilute air-equilibrated solutions in quartz cells of 1 cm path length (ca. 1 × 10−6 M, optical density < 0.1) at room temperature (20 °C) using an Edinburgh Instruments (FLS920) spectrometer (Edinburgh, UK) in photon-counting mode. Fully corrected excitation and emission spectra were obtained with an optical density at λexc ≤ 0.1. Fluorescence quantum yields were measured according to procedures in the literature [41 ,42 ]. UV-vis absorption spectra used for the calculation of the fluorescence quantum yields were recorded using a double-beam Jasco V-570 spectrometer.
10
Time-Resolved Fluorescence Lifetime Measurement
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Lifetimes were measured using a 315.8 nm emitting picosecond pulsed diode laser as the light source in the time‐correlated single‐photon counting (TCSPC) mode using the Edinburgh Instruments FLS920 spectrometer. Emission decay was detected with a 3 nm emission‐slit band‐width. A 5000 kHz (every 200 ns) pulse was generated. The time range was set to 200 ns, and 1024 channels were used. Instrument response functions (IRFs) were measured from the scatter of an aqueous suspension of Ludox at the same excitation wavelength. A reconvolution‐fit was performed using Software F900 version 7.2.1. The quality of the decay fits was assessed by the calculated values of the reduced χ2 and Durbin‐Watson parameters, and visual inspection of the weighted and autocorrelated residuals.
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