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Ppp nchr 50

Manufactured by Nanosensors
Sourced in Switzerland

The PPP-NCHR-50 is a high-precision atomic force microscope (AFM) cantilever probe. It features a nominal force constant of 42 N/m and a resonant frequency of 330 kHz. The probe is designed for non-contact mode scanning and is suitable for a variety of applications that require high-resolution imaging and surface characterization.

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Lab products found in correlation

2 protocols using ppp nchr 50

1

Analyzing Au Nanoparticle Arrays by AFM

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The topography
of the prepared arrays of Au nanoparticles was measured by using atomic
force microscopy (PicoPlus from Molecular Imaging, Agilent Technologies,
Germany) with tapping-mode tips PPP-NCHR-50 (Nanosensors, Switzerland).
The obtained images were processed in open-source software Gwyddion
(version 2.47 from gwyddion.net).
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2

Graphene Characterization and NP Deposition

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Before and after the deposition of nanoparticles, a series of characterization measurements was conducted to determine the graphene uniformity and quality, and to see if any damage of the graphene occurred during the deposition. Atomic Force Microscopy (AFM) (Quadrexed Dimension 3100 with a Nanoscope IVa controller) was used in tapping mode to obtain topography images of the sensing layers. The measurements were performed using silicon (Si) tips (PPP-NCHR-50 from Nanosensors) with a tip radius of curvature below 7 nm. X-ray photoelectron spectroscopy (XPS) studies using a Microlab 310-F spectrometer were performed to investigate possible alterations made to the sample after deposition of NPs and to establish if Fe3O4 was present on the surface.
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