Sigma 500 microscope

All the reagents were purchased of analytical grade from certified sellers and used without any further refinement. FT-IR spectra were recorded with wavelength range 4000–400 cm⁻¹ using Bruker Alpha II spectrophotometer. The PXRD spectra obtained with Rigaku Miniflex diffractometer. Solid ¹³C (CP/MAS-NMR) analysis applied via Bruker Ultrashield 400wb Plus. TGA analysis was conducted via TA Q50 thermal analyzer using sample 5 mg with range of 50–800 °C at the constant heating rate of 10 °C min⁻¹ under ambient environment. Nitrogen sorption isotherms were calculated at 77 K via BELSORP Max II equipment using relative pressure (0–1 bar), while pore size is determined via NLDFT model. Scanning electron microscopic (SEM) study was investigated with Zeiss Sigma 500 microscope. Transmission electron microscopy (TEM) was explored via Tecnai G2 F20 S-TWIN equipment functioning at an acceleration voltage of 200 kV. UV-visible spectroscopy was performed via Hitachi UH4150 spectrophotometer. Photoluminescence emission and excitation spectra were recorded at ambient temperature with a HORIBA FluoroLog-3 fluorescence spectrometer, while time-resolved decay measurements were carried on HORIBA FluoroLog-3 fluorescence spectrometer equipped with a laser of 355 nm working in time-correlated single-photon counting mode (TCSPC) with a time resolution of 100 ns.

Scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) measurements were carried out using a Zeiss Sigma 500 microscope. Raman spectroscopy was performed using a Horiba LabRAM HR Evolution with excitation at 532 nm. XPS data were obtained using a Thermo ESCALAB 250XI. A powder X-ray diffraction (XRD) diffractometer (Ultima IV 185) was employed to study the structure of the produced samples. XPS data were analyzed with the Fityk software. High-resolution TEM (HRTEM), selected-area electron diffraction (SAED) and elemental mapping were carried out on a JEM-2100PLUS80-200 kV.