EM observations were carried out on a GAIA3 FIB-SEM work station using a STEM detector (GAIA3; Tescan, Brno-Kohoutovice, Czech Republic) at 30.0 kV (Chalmers Materials Analysis Laboratory, Chalmers University of Technology, Gothenburg, Sweden) (
Gaia3
GAIA3 is a high-resolution scanning electron microscope (SEM) designed for advanced materials analysis and characterization. It offers a combination of high-resolution imaging, chemical analysis, and sample manipulation capabilities. The GAIA3 is intended to be used in a variety of research and industrial applications where detailed examination of materials is required.
Lab products found in correlation
23 protocols using gaia3
Ultrastructural Analysis of Biological Specimens
EM observations were carried out on a GAIA3 FIB-SEM work station using a STEM detector (GAIA3; Tescan, Brno-Kohoutovice, Czech Republic) at 30.0 kV (Chalmers Materials Analysis Laboratory, Chalmers University of Technology, Gothenburg, Sweden) (
Characterization of Polystyrene-Sulphate Colloids
Shear Strength Analysis of Cu-Cu Bonds
Fracture surface analysis is an important step in characterizing die-to-die bonding since it provides valuable information about the bonding quality; shear strength results often have high deviations.
The SEM images and EDX analysis of the fracture surface types were performed using GAIA3 (TESCAN) equipment. The detector X-Max 150 and the analysis software Aztec 4.2 (Oxford Instruments) were used for EDX analysis.
CoSi2/TiSi2 Interface Structure Analysis
TEM Analysis of Cr1+δTe2 Crystals
FIB-EDS Mapping of Biogenic Silica
Characterization of Cycled Solid-State Electrolytes
Characterizing PEO Coatings via XRD and Microscopy
Characterization of Composite Microspheres
Characterization of Lignite and Heavy Metal Adsorption
The differences in the surface morphology of the BLA before and after microbial modification and the adsorption of heavy metal ions were investigated via SEM/EDS. The samples were washed with anhydrous ethanol and dispersed, fixed on a conductive adhesive surface, naturally air-dried, and then characterized using field-emission SEM/EDS (FE-SEM; Tescan GAIA3, Tescan company, Jebrno, Czech Republic) [50 (link)]. The elemental composition of the lignite samples was investigated using an element analyzer (PE PerkinElmer 2400; Perkin-Elmer, Waltham, MA, USA).
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