Fourier transformation infrared spectroscopy (FT-IR) analysis of the synthesized polymers was performed on a PerkinElmer 400 spectrometer using the attenuation total reflectance setting. The same pressure was applied on the outer surface of all analyzed samples. A number of 32 scans were recorded using a 1 cm−1 resolution. All spectra were processed using the automated baseline correction and the data auto-tune functions (see Supplementary Figs. 25 –29 ).
400 spectrometer
Manufactured by PerkinElmer
The 400 spectrometer is a laboratory instrument designed for spectroscopic analysis. It is capable of measuring the absorption or emission spectrum of a sample across a range of wavelengths. The core function of the 400 spectrometer is to provide accurate and reliable spectroscopic data for various applications in scientific research and analysis.
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2 protocols using 400 spectrometer
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Polymer Characterization by FT-IR Spectroscopy
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Versatile Characterization of Materials
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The crystalline
diffraction pattern
of the samples was analyzed by a Rigaku Miniflex 600 powder X-ray
diffractometer with monochromatized Cu Kα (λ = 1.5425
Å) incident radiation. FTIR spectra of the samples were recorded
by a PerkinElmer 400 spectrometer in the range 4000–400 cm–1. High-resolution transmission electron microscopy
(HRTEM) images and energy-dispersive X-ray (EDAX) spectra were taken
using a JEOL JEM-2100 microscope at an accelerating voltage of 200
kV. Dynamic light scattering was performed in a HORIBA Scientific
SZ-100. The photoluminescence measurements and lifetime measurements
were carried out using a Shimadzu RF-5301 spectrofluorometer. The
quantum yield of thin films was determined in a HORIBA FL3–211_1939C-5017-FL.
The UV–visible diffuse reflectance spectra were recorded using
a UV-2450 Shimadzu UV–visible spectrophotometer.
diffraction pattern
of the samples was analyzed by a Rigaku Miniflex 600 powder X-ray
diffractometer with monochromatized Cu Kα (λ = 1.5425
Å) incident radiation. FTIR spectra of the samples were recorded
by a PerkinElmer 400 spectrometer in the range 4000–400 cm–1. High-resolution transmission electron microscopy
(HRTEM) images and energy-dispersive X-ray (EDAX) spectra were taken
using a JEOL JEM-2100 microscope at an accelerating voltage of 200
kV. Dynamic light scattering was performed in a HORIBA Scientific
SZ-100. The photoluminescence measurements and lifetime measurements
were carried out using a Shimadzu RF-5301 spectrofluorometer. The
quantum yield of thin films was determined in a HORIBA FL3–211_1939C-5017-FL.
The UV–visible diffuse reflectance spectra were recorded using
a UV-2450 Shimadzu UV–visible spectrophotometer.
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