U 3900h spectrometer

The phase purity and components of the AgBr/AgVO₃ photocatalysts were characterized by XRD (Rigaku D/max-3C, Japan) operating at 40 kV and 30 mA with Cu Kα radiation (λ = 0.15406 nm). TEM and HRTEM images were taken on a Tecnai G220 transmission electron microscope at 200 kV acceleration voltage. The nitrogen (N₂) adsorption–desorption measurements were conducted at 77 K by use of Micromeritics ASAP2020, and the sample was degassed at 200 °C for 6 h to remove physisorbed gases. The Brunauer–Emmett–Teller (BET) approach using adsorption data was followed to evaluate the specific surface area. The X-ray photoelectron spectroscopy (XPS) measurements were measured using a Multifunctional imaging electron spectrometer (Thermo ESCALAB 250XI, USA). The UV-vis diffuse reflectance spectra (UV-DRS) of the samples were tested using a Hitachi U-3900H Spectrometer (Japan) using BaSO₄ as the reference.

The UV-visible spectrophotometry (UV-vis) measurements were collected on a Japan HITACHI U-3900H spectrometer. Transmission electron microscopy (TEM) and Energy-Dispersive X-ray (EDX) spectroscopy measurements were collected on a Philips Tecnai F20 microscope at an accelerate voltage of 200 kV. Powder X-ray diffraction patterns (XRD) were measured on a Bruker D8 Advance diffractometer using Cu Kα radiation (λ = 1.5406 Å). For the preparation of XRD samples, 1–2 mL of as-prepared colloidal solution are dripped onto a zero-diffraction silicon wafer. The PL spectra and PLQY measurements were acquired using a Fluorolog-3 Horiba Jobin-Yvon spectrofluorimeter (excited at 365 nm) equipped with an integrating sphere. PL lifetimes were measured using a time-corrected single-photon-counting (TCSPC) system. The wavelengths of the excitation sources for exciton emission peak and Mn²⁺ emission peak are 371 nm (by a pulsed diode light source) and 365 nm (by a Xenon lamp), respectively.