Transmission electron microscopy (TEM)
was carried out on a JEM-1011 (JEOL) instrument. Field-emission scanning
electron microscopy was carried out on Hitachi SU8010 at 5.0 kV. Confocal
laser scanning microscopy (CLSM) used a Panasonic Super Dynamic II
WV-CP460 instrument, and the sample was excited at 488 nm. Atomic
force microscopy (AFM) results were acquired from a Dimension Icon
(American) with a ScanAsyst. Fourier transform infrared (FT-IR) spectra
were observed from an α-T spectrometer of Germany Bruker Optics.
The values of ζ-potential were acquired from Malvern Zetasizer
Nano ZS ZEN3600. UV–vis spectra were collected on a UV–vis
spectrophotometer (Hitachi, U-4100). A Lumina Fluorescence Spectrometer
(Thermo Fisher) of the model Thermo Scientific Lumina was applied
to observe the fluorescence spectra. The fluorescence lifetimes were
determined using a spectrofluorometer (FLSP920, Edinburgh Instruments
Ltd) with a time-correlated single-photon-containing method.
was carried out on a JEM-1011 (JEOL) instrument. Field-emission scanning
electron microscopy was carried out on Hitachi SU8010 at 5.0 kV. Confocal
laser scanning microscopy (CLSM) used a Panasonic Super Dynamic II
WV-CP460 instrument, and the sample was excited at 488 nm. Atomic
force microscopy (AFM) results were acquired from a Dimension Icon
(American) with a ScanAsyst. Fourier transform infrared (FT-IR) spectra
were observed from an α-T spectrometer of Germany Bruker Optics.
The values of ζ-potential were acquired from Malvern Zetasizer
Nano ZS ZEN3600. UV–vis spectra were collected on a UV–vis
spectrophotometer (Hitachi, U-4100). A Lumina Fluorescence Spectrometer
(Thermo Fisher) of the model Thermo Scientific Lumina was applied
to observe the fluorescence spectra. The fluorescence lifetimes were
determined using a spectrofluorometer (FLSP920, Edinburgh Instruments
Ltd) with a time-correlated single-photon-containing method.