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423 protocols using jsm 7800f

1

Structural Analysis of Carbon Nanotubes via SEM

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Structural analyses were conducted using a JEOL scanning electron microscope (SEM) (model JSM-7800F, JEOL Ltd., Tokyo, Japan). The JEOL JSM-7800F microscope is a high-resolution scanning electron microscope equipped with four detectors: upper electron detector (UED), lower electron detector (LED), backscatter electron detector (BED), and transmission electron detector (TED).
A small amount of the analyzed carbon nanotubes was dispersed in isopropyl alcohol, then the suspension prepared using this method was spotted onto a so-called grid and left under clean conditions to dry. After complete drying, the grid was placed in a holder in the chamber of the microscope. The analysis was performed using the TED detector.
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2

Corrosion and Nanoindentation Analysis of AlCoCrCuFe HECs

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After the laser cladding process, AlCoCrxCuFe HECs specimens were sectioned into 10 mm × 10 mm × 10 mm pieces perpendicular to the laser cladding path. The cross section of the specimens was ground with 2000 grit sandpaper, polished to a scratch free mirror surface, and subjected to 10% oxalic acid (beilianchem, 99.5%) solution electrolytic corrosion for 30 s. Specimens after oxalic acid electrolytic corrosion surfaces were observed using a scanning electron microscope (SEM) (JEOL JSM-7800F, Tokyo, Japan) with energy dispersive spectroscopy (EDS) (JEOL JSM-7800F, Tokyo, Japan). X-ray diffraction (XRD) (Bruker D8 Advance, Billerica, MA, USA) was used to analyze the phase structure of HECs at a scanning speed of 4° min−1, ranging from 20° to 100°. The nanoindentation characteristics of the AlCoCrxCuFe HECs were studied by a nanoindentation tester (Keysight Nanoindenter G200, Santa Rosa, CA, USA). The measurements were carried out using a Berkovich indenter with the load of 300 mN and loading time of 25 s. Nanoindentation tests were performed for each sample five times.
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3

Optical Characterization of Cervical Tissue

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The morphology and size of the Au NPs in water solution were analyzed by transmission electron microscopy (TEM) using a FEI Titan 80–300 electron microscope (Hillsboro, OR, USA) with an accelerating voltage of 300 kV. Tissue was analyzed by a Scanning Electron Microscope (SEM) JEOL JSM-7800F (Tokyo, Japan) and by a SEM-Energy Dispersive X-ray Spectrometer (EDS) from Oxford Instruments (Abingdon, UK). UV-Vis absorption measurements were carried out using a Perkin Elmer Lamda 900 spectrometer (Waltham, MA, USA) with a spectral resolution of 2 nm. Optical characterization of cervix tissue was obtained by a Zeiss confocal microscope, model LSM-710-NLO, equipped with a Chameleon Vision-II ultrafast laser system from Coherent (tunable from 680 to 1040 nm, 140 fs, 80 MHz repetition rate). The excitation wavelength used for confocal images was 543 nm and 900 nm for TPI.
The SERS spectra were acquired using an inVia Raman microscope from Renishaw with a 20×/0.4 objective and approximately 5 mW of excitation power at 785 nm wavelength. The integration time for each Raman spectrum was 20 s and the spectral range was from 700 to 1700 cm−1. The Raman data was obtained by mapping a minimum of 10 independent tissue regions in each sample, depending on the quality of each slide, each site was measured twice. The results represent the average of all the mapped regions for each sample.
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4

Elemental Analysis of Nanocomposite Coatings

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Investigations of chemical composition and distribution of elements in coatings were performed using X-ray energy dispersion spectrometry (EDS) (Edax Inc., Mahwah, NJ, USA), an integral part of the scanning electron microscope (JEOL JSM-7800 F, JEOL Ltd. Tokio, Japan). The phases formed in the nanocomposite coating were investigated by X-ray diffraction (XRD) (XRD, Philips X’Pert Pro, Almelo, Netherlands). A monochromatic source, CuKα radiation (λ = 1.544 Å) was used, and the specimens were scanned from 20° to 90° at a scanning rate of 0.02°/s.
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5

Copper Morphology in Acidic Media

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The morphology of copper samples before and after exposure to 0.5 M H2SO4 with and without 1 mM studied inhibitors at 298 K were observed by AFM (MFP-3D-BIO, Asylum Research, America) and FE-SEM (JEOL-JSM-7800F, JEOL Ltd, Japan).
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6

SEM Characterization of Nanoparticles

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Nanoparticles were characterized by SEM (JEOL JSM-7800F, Akishima, Tokyo, Japan). SEM images were obtained using an acceleration voltage of 1.00 kV and images were obtained with a magnification of ×15,000.
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7

Surface Porosity Analysis of Titanium Samples

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The surfaces
of the uncoated Ti sample and samples modified via the MAO and UMAO
processes were examined by using a field emission scanning electron
microscope (JEOL JSM-7800 F, JEOL Ltd., Tokyo, Japan). The images
were analyzed using a secondary electron detector (SED) at a 5 kV
acceleration voltage. The average percentage of the open surface porosity
and average pore size of the investigated MAO and UMAO coatings were
calculated using ImageJ software on SEM micrographs.
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8

Adhesive Failure Modes Analysis

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After SBS testing, the debonded surface was observed with an optical microscope under 20× (Olympus BX40, Olympus Optical Co. Ltd., Tokyo, Japan) to define the failure mode. The failure modes were classified into adhesive failure, cohesive failure, and a mixture of adhesive and cohesive failures (mixed failure). The structures of the residual adhesives on the surface were evaluated using a Thermal FE-SEM instrument (JEOL JSM-7800F, JEOL Ltd., Tokyo, Japan). Magnification strengths of 500× and 2000× were used for comparison with observations obtained using optical microscopy [27 ].
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9

Surface Analysis of Laser-Treated Ti13Zr13Nb Alloy

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The SEM microscope was used to study the surface structure of the laser-treated Ti13Zr13Nb alloy (JEOL JSM-7800 F, JEOL Ltd., Tokyo, Japan). The chemical composition on the surface of the samples was analyzed using the X-ray energy dispersion (EDS) spectrometer (Octene Elite 25, EDAX, Mahwah, NJ, USA) attached to the SEM microscope. An analysis of the chemical composition was performed for an area of 400 × 300 μm.
The thickness of the remelted surface layers was assessed on cross-sections of samples that were ground, polished, and etched with Kroll’s reagent (0.06 mm3 HF, 0.12 mm3 HNO3, 50 mm3 distilled water). An optical microscope was used for examination (UC50, Olympus Europa SE&Co. KG, Hamburg, Germany).
Phase composition analysis was performed using a PHILIPS X’PERT-PRO (PHILIPS, Almelo, The Netherlands) diffractometer with a copper lamp. The X-ray method using Cu Kα radiation was performed to analyze the phase composition, with a wavelength of radiation λKα1 = 0.15406 nm and λKα2 = 0.15444 nm.
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10

Electron Microscopy Analysis of PECs

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The prepared PEC sample was dropped to carbon-coated copper mesh and excess sample was removed after the PEC sample was attached to the mesh. Sodium phosphotungstate aqueous (PTA) solution 1% (w/v) was prepared and dropped to the copper grids for negative staining. Excess PTA solution was then eliminated. Next, the copper grids were placed in a vacuum oven. Twenty-four hours later, the dried copper grids were kept from light exposure at room temperature until observation. The morphology of the PECs was observed using TEM (HT7700, Hitachi, Japan) with an accelerated voltage of 120 V under high contrast mode (HC mode).
Besides, the morphology of PECs was also observed using a thermal field emission scanning electron microscope (Thermal FE-SEM) (JEOL JSM-7800F, JEOL Ltd., Tokyo, Japan). The PEC solutions were first prepared and freeze-dried using a vacuum freeze drier (Uniss MF-280, Uniss Company, New Taipei City, Taiwan). The freeze-dried powder was afterwards coated with platinum and observed by the thermal FE-SEM.
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