A small amount of the analyzed carbon nanotubes was dispersed in isopropyl alcohol, then the suspension prepared using this method was spotted onto a so-called grid and left under clean conditions to dry. After complete drying, the grid was placed in a holder in the chamber of the microscope. The analysis was performed using the TED detector.
Jsm 7800f
The JSM-7800F is a high-performance field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a stable electron beam, advanced optics, and a variety of detectors to provide exceptional image quality and analytical capabilities.
Lab products found in correlation
423 protocols using jsm 7800f
Structural Analysis of Carbon Nanotubes via SEM
A small amount of the analyzed carbon nanotubes was dispersed in isopropyl alcohol, then the suspension prepared using this method was spotted onto a so-called grid and left under clean conditions to dry. After complete drying, the grid was placed in a holder in the chamber of the microscope. The analysis was performed using the TED detector.
Corrosion and Nanoindentation Analysis of AlCoCrCuFe HECs
Optical Characterization of Cervical Tissue
The SERS spectra were acquired using an inVia Raman microscope from Renishaw with a 20×/0.4 objective and approximately 5 mW of excitation power at 785 nm wavelength. The integration time for each Raman spectrum was 20 s and the spectral range was from 700 to 1700 cm−1. The Raman data was obtained by mapping a minimum of 10 independent tissue regions in each sample, depending on the quality of each slide, each site was measured twice. The results represent the average of all the mapped regions for each sample.
Elemental Analysis of Nanocomposite Coatings
Copper Morphology in Acidic Media
SEM Characterization of Nanoparticles
Surface Porosity Analysis of Titanium Samples
of the uncoated Ti sample and samples modified via the MAO and UMAO
processes were examined by using a field emission scanning electron
microscope (JEOL JSM-7800 F, JEOL Ltd., Tokyo, Japan). The images
were analyzed using a secondary electron detector (SED) at a 5 kV
acceleration voltage. The average percentage of the open surface porosity
and average pore size of the investigated MAO and UMAO coatings were
calculated using ImageJ software on SEM micrographs.
Adhesive Failure Modes Analysis
Surface Analysis of Laser-Treated Ti13Zr13Nb Alloy
The thickness of the remelted surface layers was assessed on cross-sections of samples that were ground, polished, and etched with Kroll’s reagent (0.06 mm3 HF, 0.12 mm3 HNO3, 50 mm3 distilled water). An optical microscope was used for examination (UC50, Olympus Europa SE&Co. KG, Hamburg, Germany).
Phase composition analysis was performed using a PHILIPS X’PERT-PRO (PHILIPS, Almelo, The Netherlands) diffractometer with a copper lamp. The X-ray method using Cu Kα radiation was performed to analyze the phase composition, with a wavelength of radiation λKα1 = 0.15406 nm and λKα2 = 0.15444 nm.
Electron Microscopy Analysis of PECs
Besides, the morphology of PECs was also observed using a thermal field emission scanning electron microscope (Thermal FE-SEM) (JEOL JSM-7800F, JEOL Ltd., Tokyo, Japan). The PEC solutions were first prepared and freeze-dried using a vacuum freeze drier (Uniss MF-280, Uniss Company, New Taipei City, Taiwan). The freeze-dried powder was afterwards coated with platinum and observed by the thermal FE-SEM.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!