Scanning electron microscopy (SEM) images were collected on an FEI Quanta 250 microscope. Transmission electron microscopy (TEM), high-resolution TEM (HRTEM) images and selected area electron diffraction (SAED) patterns were recorded on an FEI Tecnai G2 F20 field-emission microscope. X-ray diffraction (XRD) patterns were obtained on a Bruker D8 ADVANCE diffractometer equipped with a CuKα radiation source (λ = 1.54178 Å). Raman spectra were obtained on a Bruker Senterra confocal Raman spectrometer (λex = 532 nm). N2 adsorption/desorption isotherms at 77 K were carried out on a Quantachrome Autosorb-iQ instrument. Brunauer–Emmett–Teller (BET) specific surface areas were calculated from the linear range of the BET plot and pore width distribution curves were obtained using the quenched solid density functional theory (DFT) method. X-ray photoelectron spectroscopy (XPS) results were acquired on a Thermo Fisher ESCALAB 250Xi spectroscope with an excitation source of AlKα radiation (1486.6 eV).
Tecnai g2 f20 field
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Tecnai G2 F20 field emission transmission electron microscope (FE-TEM) is a high-performance imaging and analysis tool designed for advanced materials research and characterization. It features a field emission electron source, providing high-brightness and high-resolution imaging capabilities. The Tecnai G2 F20 is capable of achieving sub-angstrom resolution, enabling detailed structural and compositional analysis of a wide range of samples.
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2 protocols using tecnai g2 f20 field
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Multi-Technique Nanomaterial Characterization
2
Visualizing Outer Membrane Vesicles
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Electron microscopy images were obtained from the Electron Microscopy unit in the Molecular and Cellular Imaging Facility at the University of Guelph. The OMV samples were negatively stained with 2% uranyl acetate (Koval and Hynes, 1991; Chanyi and Koval, 2014) and visualized using an FEI Tecnai G2 F20 field emission electron microscope (FEI, Hillsboro, Oregon, USA) operating at 120 kV. Images were obtained using a bottom mount Gatan 4k CCD camera (Gatan, Pleasanton, CA, USA) using Tecnai Imaging and Analysis software.
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