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Thermal analyzer

Manufactured by TA Instruments
Sourced in United States

The Thermal Analyzer is a laboratory instrument designed to measure and analyze the thermal properties of materials. It can measure changes in a material's physical or chemical properties as a function of temperature or time under a controlled atmosphere.

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6 protocols using thermal analyzer

1

FTIR, TGA, and FNDs Characterization

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Fourier transform infrared spectroscopy (FTIR, Bruker, Karlsruhe, Germany) spectra were obtained on a Bruker VERTEX 70 using standard KBr-pellets in the range of 2200–400 cm−1 with a resolution of 4 cm−1. Thermogravimetric analysis (TGA) measurements were carried out in air at a heating rate of 10 °C min−1 using a Thermal Analyzer (TA Instruments, New Castle, DE, USA). The average sizes and zeta potentials of FNDs were measured using a Delsa Nano C (BECKMAN COULTER Inc, Brea, CA, USA). Size distributions are represented by the particle number.
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2

Characterization of Synthesized Samples

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Information concerning the crystal structures of the synthesized samples was acquired by powder XRD (Bruker AXS D8 diffractometer) with Cu Kα radiation (λ = 1.5406 Å). Thermogravimetric analysis (TGA) was conducted under constant nitrogen flow on a TA thermal analyzer at a rate of 15 °C/min from 25 to 800 °C. The FTIR spectra were recorded using an Agilent FTIR spectrometer with KBr. The N2 adsorption–desorption isotherms were collected using a Quanta Chrome Nova surface area and pore size analyzer at − 196 °C. The specific surface area of the samples was calculated by the BET method, and the total pore volume was determined from the volume of N2 taken up by the samples at P/P0 = 0.95. Besides, the BJH method was used to calculate the pore size distribution of the samples using the desorption branch of the isotherm. The surface morphologies of the samples were scrutinized with E-SEM (Thermo Scientific Quattro S). The chemical compositions and mapping images of the samples were determined by EDX associated with the E-SEM instrument. The XPS spectra were recorded on a Thermo-Fisher Scientific spectrometer with monochromatic X-ray Al Kα radiation. The total organic carbon (TOC) was measured on Analytic Jena multi N/C 2100S TOC analyzer.
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3

Thermal Analysis of SPI Films

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DSC was tested by using a thermal analyzer (TA Instruments, New Castle, DE, USA). SPI films (3–6 mg) were sealed in an aluminum pan and heated at a rate of 10 °C min−1 from 30 to 200 °C under an N2 atmosphere.
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4

Characterization of Organic Compounds

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NMR spectra were collected on a Varian Inova 400 or 500 MHz spectrometer using residual proton solvent signals as an internal reference. Mass spectrometry data were collected by one of two methods. 3a, 3b, 8a, and 8b were analyzed by direct infusion into a Synap HDMS quadrupole TOF-MS (Waters, Beverly, MA) with a resolving power of 9000. The remainder of the positive ion mass spectra were recorded by direct infusion into an Orbitrap XL MS (Thermo-Fisher Scientific, Waltham, MA) at a resolving power of 30 000. Differential scanning calorimetry traces were recorded on a TGA Q10 DSC system with a TA Instruments thermal analyzer at a heating rate of 10 °C min−1. Elemental analyses were collected by Robertson Microlit Laboratories, Inc. IR spectra were recorded via the dropcast method from methanolic solution onto a KBr plate with a Thermo Nicolet 6700 FT-IR. For each spectrum, the resolution was 4 cm−1 and 256 scans were collected. X-ray crystallographic data were collected by the Indiana University Molecular Structure Center on a Bruker APEX II Kappa Duo diffractometer using Mo Kα radiation (graphite monochromator) at 150 K. Details of the X-ray analysis can be found in the Supporting Information.
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5

Thermogravimetric Analysis of Samples

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Thermogravimetric (TG) curves were obtained using a TA Instruments thermal analyzer. About 5 mg of samples was tested from 25 to 500 °C, with temperature increasing at a rate of 10 °C min−1 under a flow of argon. From the TG curves, differential TG (DTG) curves can be calculated.
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6

FTIR, SEM, and TGA analysis of (PVP-PI)/OA blends

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The FTIR spectra were conducted by a Nicolet Avatar 320 FTIR Spectrophotometer in the range of 4000-400 cm -1 with 60 scan. The surface morphologies of the crosslinked (PVP-PI)/OA blends were carried out by Scanning electron Microscope (SEM), JSM-5400, JEOL Ltd., Tokyo, Japan. Thermal Gravimetric Analysis (TGA, Q50) measurements were performed in a TA Instruments thermal analyzer, at heating rate of 10°C/min, under bubbling nitrogen gas.
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