Mcp ht450

The morphologies of the prepared electrodes were investigated using field-emission scanning electron microscopy (FE-SEM; S-4800, Hitachi, Tokyo, Japan). The elemental compositions of C, O, Mn, and Fe in the fabricated electrodes were obtained using an energy-dispersive X-ray spectroscopy (EDS) system (EX-250, HORIBA Ltd., Kyoto, Japan) installed in the FE-SEM instrument. Thermograms of the HTW-C/PLA electrodes were obtained using a thermogravimetric analyzer (TGA2, Mettler Toledo GmbH, Columbus, OH, USA). The electrical conductivities of the C-MnO₂/PLA and C-Fe₃O₄/PLA electrodes were obtained using a two-point probe system (MCP-HT450, Mitsubishi, Tokyo, Japan) after being cast in the pellet form. The crystal structures of the prepared electrodes were investigated by X-ray diffraction (XRD, D8 Advance, Bruker Co., Billerica, MA, USA) in the 2θ range of 10–80° at 10° min⁻¹.

The morphological structures of the mica and color mica/TiO₂ materials were investigated via field emission scanning electron microscopy (FE-SEM, S-4800, Hitachi, Tokyo, Japan); cross-sectional samples of the color mica/TiO₂ materials were prepared for the analysis using a focused ion beam (FIB, LYRA3 GMH, TESCAN, Brno, The Czech Republic) system. The elemental compositions (Si and Ti) of the color mica/TiO₂ materials were obtained using an energy-dispersive X-ray spectroscopy (EDS) system (EX-250, HORIBA, Ltd., Kyoto, Japan) integrated with the FE-SEM instrument. The molecular structures of the materials were analyzed using a Fourier-transform infrared (FT-IR) instrument (Nicolet iS10, Thermo Fisher Scientific, Waltham, MA, USA). The concentrations of Na⁺ and Ca²⁺ ions in the materials were determined using an ion chromatography system (930 Compact IC Flex, Metrohm, Herisau, Switzerland). The electrical conductivities of the materials in the pellet form were obtained using a two-point probe system (MCP-HT450, Mitsubishi, Tokyo, Japan).

Transmission electron microscopy (TEM) images of nanocrystals on continuous carbon-coated Cu grids were obtained using a Hitachi HF5000 system operated at 80.0 kV (Tokyo, Japan). NPs were drop-cast onto the TEM substrates from EtOH dispersions and dried overnight. Field-emission scanning electron microscopy (FE-SEM) images of the nanocrystals deposited on a Si wafer were obtained using a Hitachi S-4800 instrument operated at 10.0 kV with an in-lens detector (Tokyo, Japan). Fourier-transform infrared (FTIR) spectroscopy was performed using a Nicolet iS10 spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). The NP powder was loaded onto a sample holder, and the spectra were acquired with 512 scans at a resolution of 4 cm⁻¹. Dielectric properties were determined using an impedance analyzer (Solartron 1260, Bognor Regis, UK) equipped with a dielectric interface system (Solartron 1296). NPs dispersed in silicon oil (3.0 wt%) were loaded into the chamber. Permittivity measurements were performed by supplying an alternating current in the frequency range of 10⁻² to 10⁷ Hz. The electrophoretic mobility of the materials was determined using an Otsuka ELS-8000 system (Tokyo, Japan). The electrical conductivity of the sample pellets was obtained using a Mitsubishi MCP-HT450 instrument (Tokyo, Japan) via a two-point method.