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Jsm 6300 microscope

Manufactured by JEOL
Sourced in Japan

The JSM-6300 is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution imaging of a wide range of sample types. The JSM-6300 utilizes an electron beam to scan the surface of a sample, generating detailed information about its topography and composition. This instrument is capable of magnifying samples up to 300,000x, making it a versatile tool for various scientific and industrial applications.

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9 protocols using jsm 6300 microscope

1

Corrosion Inhibition Screening of ILs

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Analytic-grade hydrochloric acid and deionized water were employed to prepare the corrosive medium (0.5 M HCl). Initially, all the ILs were evaluated at a concentration of 100 ppm. Afterward, the compounds with the best IE were further evaluated at 25, 50, 75, and 200 ppm. The selected metallic material was API X52 steel. Prior to each electrochemical test, the metal surface was abraded with SiC emery paper No. 600-1200, followed by a cleaning and drying treatment [71 ]. In addition, the metal samples used in the SEM surface analyses were polished with 0.05 μm alumina to obtain a mirror-finish surface. The morphology of the surface with and without CI was analyzed using a JEOL-JSM-6300 microscope.
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2

Multi-Technique Characterization of Synthetic Fibers

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The synthesized fibers were characterized using scanning electron microscopy (SEM), elemental analysis and infrared spectroscopy. The SEM images were obtained using a JEOL JSM 6300 microscope, while the carbon, nitrogen and oxygen content of the fibers were determined in a EuroVector Elemental Analyser EA3000 (EuroVector SpA, Milan, Italy). Both micrographs and elemental analysis were conducted at the Central Service for Research Support (SCAI) of the University of Córdoba.
The infrared measurements were performed in a Bruker Tensor37 infrared (IR) spectrometer, which was equipped with a diamond attenuated total reflection (ATR) cell with a circular surface of 3-mm diameter and three internal reflections. A Deuterated Triglycine Sulfate detector was used for the acquisition of the spectra. The spectra were collected in the wavelength range from 4000 to 500 cm−1 at a resolution of 4 cm−1 with 64 coadded scans each. Data collection was conducted using the OPUS software (Bruker, Ettligen, Germany).
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3

Materials Characterization via TGA, XRD, and SEM

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Thermogravimetric analyses (TGA), X-ray diffraction, and SEM techniques were employed to characterize the synthesized materials. TGA were carried out on a TGA/SDTA 851e Mettler Toledo balance, using and oxidant atmosphere (air, 80 mL·min−1) with a heating program consisting of a ramp of 10 °C·min−1 from 393 to 1073 K. X-ray measurements were performed on a Seifert 3000TT diffractometer using CuKα radiation. Scanning electron microscopy images were obtained with a Jeol JSM6300 microscope operated at 30 kV.
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4

Electrochemical Corrosion Inhibition Analysis

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The samples employed
for the surface analyses were prepared by following the methodology
for electrochemical tests and polished with 1 μm alumina. The
metal coupons were immersed in the corrosive medium in the absence
and presence of 150 ppm of CI for 4 h at 25 °C. Afterward, the
metal samples were retrieved from the medium and rinsed with deionized
water and dried with nitrogen.105 (link) The surface
of API 5L X52 steel was analyzed by SEM/EDS on a JEOL-JSM-6300 microscope.
The study of the treated metal surfaces was carried out using DRIFTS;
these measurements were performed in situ using a Thermo Scientific
Nicolet 560 Spectrometer in a series of spectra recorded with identical
resolution (4 cm–1). The XPS analysis was performed
with a K-Alpha Thermo Fisher Scientific spectrometer with monochromatic
Al Kα (1486.6 eV) and vacuum pressure of 1 × 10–9 Torr. The pass energy values for the study and high-resolution spectra
were set at 160 and 20 eV, respectively. The obtained spectra were
referred to adventitious carbon (284.8 eV) and the peak fitting was
performed using the software Thermo Avantage v.5.9915.
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5

Characterization of MUF Cube Morphology

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The morphology of MUF cubes was observed by scanning electron microscopy (SEM). Images were obtained using a JEOL JSM 6300 microscope at the Central Service for Research Support of the University of Córdoba. Chromatographic analysis was carried out on a Shimadzu (Kyoto, Japan) HPLC system coupled to a SPD-M20A Diode Array Detector (DAD). The column used for the separation was a Hypersil ODS (250 × 4.6 mm, 5 µm particle size) from Thermo Fisher Scientific (Waltham, MA, USA), kept at 25 °C in a CTO 10AS column oven. Samples were injected using a Rheodyne injector with a sample loop of 20 µL volume. The mobile phase consisted of water (A) and acetonitrile (B), containing 0.1% (v/v) formic acid. The analytes were separated following a gradient elution program from 55% to 80% B in 30 min and then to 85% in 5 min. The total chromatogram time was 35 min. Mobile phase was delivered using a LC20AD pump, at a flow rate of 0.8 mL min−1. The detector was set at a wavelength range of 200–360 nm. Data acquisition and processing were carried out using a LC-solution software version 1.21. FTIR spectra were recorded on a Spectrum Two FTIR using an attenuated total reflectance accessory (PerkinElmer, Cambridge, MA, USA). Approximate contact angle measurements were carried out by analyzing various photographs of water droplets on MUF cubes using the Corel Draw X6 software.
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6

Monocyte-derived Dendritic Cell Imaging

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Live-cell images were captured for MoDC generated from CD2- monocytes purified via the MACS+Adh method and cultured in AV-SF medium after 1, 2, 3, and 4 days of culture. Single and Z-stack brightfield images were taken at 400X magnification using the Keyence BZ-X700 microscope (Keyence, Itasca, IL) and processed using the Keyence Analyzer software. Scanning Electron Microscopy (SEM) was performed by Arizona State University’s (ASU, Tempe, AZ) Life Science Electron Microscopy Lab. Briefly, MoDC were generated using MACS+Adh method in AV-SF and harvested on day 4. Cells were fixed in 4% paraformaldehyde (Electron Microscopy Sciences, Hatfield, PA) and stored at 4°C. Cells were then processed at ASU with phosphate-buffered 2% glutaraldehyde treatment followed by adherence to a glass coverslip for SEM imaging using the JEOL JSM-6300 microscope (Peabody, MA).
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7

Characterization of Dry Macroporous Membranes

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Microstructure of the surface and cross-section of dry macroporous membranes was examined by scanning electron microscopy, SEM, using a JEOL JSM 6300 microscope (Japan) at an accelerating voltage of 10 kV. The samples were coated with gold by sputtering for 90 seconds (JFC 1100, JEOL, Japan) to make conductive the surface of the samples. Depth and interconnection of pores in macroporous membranes was observed by scanning confocal laser microscopy, using a Nikon C1 microscope (Japan).
The porosity of the original scaffold, , was determined by geometric and volumetric measurements, according to the equation [42] :
, where m is the scaffold mass, ρ is the polymer density and t, w and l are the thickness, weight and length of the scaffold respectively.
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8

Characterization of Swollen Materials by Cryo-SEM

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A JSM-5410 scanning electron microscope (SEM; JEOL Ltd., Tokyo, Japan) was used to characterize the obtained materials. Surfaces and inner sections of the samples (exposed by fracturing the samples previously frozen by immersion in liquid nitrogen) were observed after a sputter-coating with gold. The working distance was fixed at 15 mm and the acceleration voltage at 15 kV.
Samples swollen for 4 days (by immersion in phosphate buffer saline (PBS), by immersion in distilled water, or maintained in an atmosphere of PBS, PBS(RH)), were mounted on a specimen holder and immersed in nitrogen slush. Once frozen, these samples were transferred to a JSM 6300 microscope (JEOL Ltd., Tokyo, Japan) in the cryoSEM device. An inner section was then exposed by fracturing the sample, and ice sublimation started at -80ºC. After 40 min, samples were sputter-coated with gold and examined at 20 kV of acceleration voltage.
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9

Characterization of Hydroxyapatite Coatings

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Scanning Electron Microscopy (SEM) images of the hydroxyapatite coatings were taken in a Jeol JSM-6300 microscope, with the samples previously sputter-coated under vacuum with gold, 15 kV of acceleration voltage and 15 mm of working distance.
Quantification of elements was achieved by Electron Dispersive X-ray Spectroscopy (EDS) in the same device. Coatings were carefully cut and samples were observed transversally to estimate the coating thickness and roughness. Roughness was measured as the average distance between ridges and valleys.
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