Jsm 6300 microscope
The JSM-6300 is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution imaging of a wide range of sample types. The JSM-6300 utilizes an electron beam to scan the surface of a sample, generating detailed information about its topography and composition. This instrument is capable of magnifying samples up to 300,000x, making it a versatile tool for various scientific and industrial applications.
Lab products found in correlation
9 protocols using jsm 6300 microscope
Corrosion Inhibition Screening of ILs
Multi-Technique Characterization of Synthetic Fibers
The infrared measurements were performed in a Bruker Tensor37 infrared (IR) spectrometer, which was equipped with a diamond attenuated total reflection (ATR) cell with a circular surface of 3-mm diameter and three internal reflections. A Deuterated Triglycine Sulfate detector was used for the acquisition of the spectra. The spectra were collected in the wavelength range from 4000 to 500 cm−1 at a resolution of 4 cm−1 with 64 coadded scans each. Data collection was conducted using the OPUS software (Bruker, Ettligen, Germany).
Materials Characterization via TGA, XRD, and SEM
Electrochemical Corrosion Inhibition Analysis
for the surface analyses were prepared by following the methodology
for electrochemical tests and polished with 1 μm alumina. The
metal coupons were immersed in the corrosive medium in the absence
and presence of 150 ppm of CI for 4 h at 25 °C. Afterward, the
metal samples were retrieved from the medium and rinsed with deionized
water and dried with nitrogen.105 (link) The surface
of API 5L X52 steel was analyzed by SEM/EDS on a JEOL-JSM-6300 microscope.
The study of the treated metal surfaces was carried out using DRIFTS;
these measurements were performed in situ using a Thermo Scientific
Nicolet 560 Spectrometer in a series of spectra recorded with identical
resolution (4 cm–1). The XPS analysis was performed
with a K-Alpha Thermo Fisher Scientific spectrometer with monochromatic
Al Kα (1486.6 eV) and vacuum pressure of 1 × 10–9 Torr. The pass energy values for the study and high-resolution spectra
were set at 160 and 20 eV, respectively. The obtained spectra were
referred to adventitious carbon (284.8 eV) and the peak fitting was
performed using the software Thermo Avantage v.5.9915.
Characterization of MUF Cube Morphology
Monocyte-derived Dendritic Cell Imaging
Characterization of Dry Macroporous Membranes
The porosity of the original scaffold, , was determined by geometric and volumetric measurements, according to the equation [42] :
, where m is the scaffold mass, ρ is the polymer density and t, w and l are the thickness, weight and length of the scaffold respectively.
Characterization of Swollen Materials by Cryo-SEM
Samples swollen for 4 days (by immersion in phosphate buffer saline (PBS), by immersion in distilled water, or maintained in an atmosphere of PBS, PBS(RH)), were mounted on a specimen holder and immersed in nitrogen slush. Once frozen, these samples were transferred to a JSM 6300 microscope (JEOL Ltd., Tokyo, Japan) in the cryoSEM device. An inner section was then exposed by fracturing the sample, and ice sublimation started at -80ºC. After 40 min, samples were sputter-coated with gold and examined at 20 kV of acceleration voltage.
Characterization of Hydroxyapatite Coatings
Quantification of elements was achieved by Electron Dispersive X-ray Spectroscopy (EDS) in the same device. Coatings were carefully cut and samples were observed transversally to estimate the coating thickness and roughness. Roughness was measured as the average distance between ridges and valleys.
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