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High resolution tem

Manufactured by JEOL
Sourced in United States, Japan

The High-resolution TEM (Transmission Electron Microscope) is a powerful analytical tool designed for advanced materials characterization. It provides high-magnification imaging and analysis of nanoscale structures and compositions, with a resolution down to the atomic scale. The core function of this instrument is to enable detailed examination of the internal structure, morphology, and chemical properties of a wide range of materials, including metals, ceramics, polymers, and biological samples.

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3 protocols using high resolution tem

1

Characterization of Engineered Nanoparticles

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The SPIO-NPs were synthesized according to previous methods.23 (link) CdTe-QDs and Au-QDs were gifts from Dr. Xiangyang Liu (Fujian Provincial Key Laboratory for Soft Functional Materials Research, Xiamen University). GO-QDs were obtained from JCNANO (Nanjing, China). CeO2-NPs, ZnO-NPs, and SiO2-NPs were purchased from Aladdin (Shanghai, China). The morphology of these NPs was observed using transmission electron microscopy (TEM) (FEI Tecnai, Blackwood, NJ, USA). Au-QDs and CdTe-QDs were captured with high-resolution TEM (JEOL, Peabody, MA, USA). The high-resolution TEM image of GO-QDs was provided by manufacturer. Malvern Zetasizer instrument (Worcestershire, UK) was used to measure the size and zeta potential of these NPs.
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2

Time-lapse TEM Imaging of Nanocarriers

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Fresh NCs were observed using high resolution TEM (Jeol, Tokyo, Japan) operating at 200 kV. Time-sequential TEM images of recovered NC formulae, after suspending the MPS in PBS (pH 6.8) at different time intervals, were also carried out.
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3

Characterization of Iron Oxide Nanoparticles

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To prepare samples for TEM, hydrated gels (20 μL) were placed into 100% ethanol overnight and then infused with EMBED-812, first with a 50/50 ethanol/EMBED-812 mixture overnight and then with 100% EMBED-812 overnight. The EMBED-812 was then polymerized. We note that while some sample volume change caused by the solvent exchange process is expected, the sample was always kept in a swollen state with respective solvents and any observed volume change was not significant. Sections were cut on a Leica EM UC7 ultramicrotome with a Diatome diamond knife at a thickness setting of 50 nm. The sections were examined using an FEI Tecnai spirit at 80 kV and photographed with an AMT CCD camera. The images were used for particle size and volume fraction analyses. A JEOL JEM-2010 high-resolution TEM operating at 200 kV was used to take higher magnification images of the iron oxide particles. The large spherical particles showed clear lattice fringes, indicating single-crystal structure.
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