Phase composition of the prepared powder and fired ceramic samples was examined by means of X-ray diffraction (XRD) (2θ 20–60°, Cu Ka radiation, Rigaku D/MAX 2500 (Rigaku Corporation, Tokyo, Japan) with rotating anode, Japan). The phases were identified using the ICDD PDF2 database [22 ]. The content of phases in the samples of ceramic material after calcination at 1200 °C for 12 h was determined from quantitative X-ray diffraction analysis according to a procedure based on a standard method. According to this method the proportions of α- and β-modifications of tricalcium phosphate Ca3(PO4)2 can be quantified using XRD from integrated intensities of characteristic diffraction peaks.
D max 2500
Manufactured by Rigaku
Sourced in Japan, United States
The D/MAX-2500 is a high-performance X-ray diffractometer designed for advanced materials analysis. It features a powerful X-ray source, precise goniometer, and advanced detector technology to provide accurate and reliable data for a wide range of applications.
Automatically generated - may contain errors
Lab products found in correlation
S 4800, by Hitachi (37 mentions)
Escalab 250xi, by Thermo Fisher Scientific (32 mentions)
Jem 2100f, by JEOL (22 mentions)
K alpha, by Thermo Fisher Scientific (20 mentions)
Jsm 6700f, by JEOL (10 mentions)
Asap 2020, by Micromeritics (8 mentions)
Supra 55, by Zeiss (7 mentions)
S 4800, by JEOL (6 mentions)
Su8010, by Hitachi (6 mentions)
Uv 3600, by Shimadzu (6 mentions)
Nicolet is50, by Thermo Fisher Scientific (6 mentions)
Nicolet 6700, by Thermo Fisher Scientific (6 mentions)
Escalab 250, by Thermo Fisher Scientific (6 mentions)
Jem arm200f, by JEOL (5 mentions)
Uv 2600, by Shimadzu (4 mentions)
Tecnai g2 f20, by Thermo Fisher Scientific (4 mentions)
Smartlab, by Rigaku (4 mentions)
Jsm 7800f, by JEOL (4 mentions)
Escalab 250xi x ray photoelectron spectrometer, by Thermo Fisher Scientific (4 mentions)
Tecnai f20, by Philips (4 mentions)
375 protocols using d max 2500
1
Quantitative XRD Analysis of Tricalcium Phosphate
2
Comprehensive Characterization of Nanomaterial Samples
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The surface morphology of the samples were measured by scanning electron microscopy (SEM, Hitachi S-4800, Hitachi Ltd., Tokyo, Japan) equipped with energy-dispersive spectrometer (EDS) analyzer. Transmission electron microscope (TEM) and high-resolution transmission electron microscopy (HRTEM) analysis was performed using a JEOL JEM-2100 TEM (JEOL Ltd., Tokyo, Japan). The phase was checked by X-ray diffractometer (XRD, Rigaku D/max 2500, λ = 1.5406 Å, Rigaku Co., Tokyo, Japan) and Raman spectroscopy (JY-HR 800, Horiba Ltd., Paris, France). The nitrogen adsorption and desorption isotherms, and pore size distributions were characterized by a Micromeritics ASAP 2020 analyzer (Micromeritics Instrument Corp., GA, USA). X-ray photoelectron spectroscopy (XPS) was obtained on an Axis Ultra spectrometer (Kratos Analytical Ltd., Manchester, UK). Elementary analysis (EA) (Elementar vario EL cube, Thermal Conductivity Detector, Elementar GmbH, Hanau, Germany) was used to determine the nitrogen and sulfur content in composites.
3
Morphological and Structural Analysis of DL@BS Micro-Spheres
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The morphology and diameter of DL@BS MSs were observed using a digital camera and microscope in which the field of view was 10× and 40×, respectively. A scanning electron microscopy (Zeiss Merlin Compact) was also used to observe and compare the morphologic differences between single‐layer (SL)‐BS MSs and DL@BS MSs. The phase structure of DL@BS MSs was analysed by XRD on a Rigaku‐D/MAX2500 diffractometer(Rigaku), equipped with a Cu Kα radiation source (λ = 0.15418 nm) ranging from 5° to 75° with a 0.5° slit and a scanning speed of 7° min−1.
4
X-ray Diffraction Analysis of Yam Starch
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
X-ray diffraction patterns of yam starch were analyzed using Rigaku D/max 2500 X-ray powder diffractometer (Rigaku, Tokyo, Japan) with Nickel filtered Cu Kα radiation (k = 1.54056 Å) at a voltage of 40 kV and current of 200 mA. The scattered radiation was detected in the angular range of 3 to 40° (2 h), with a scanning speed of 8°/min and step size of 0.06.
5
Characterization of Synthesized Cu NWs
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The synthesized Cu NWs were analyzed using a scanning electron microscope (SEM, Hitachi S-4800), transmission electron microscopy (TEM). X-ray diffraction (XRD) of the Cu NWs was measured in the range of 2θ = 20–80° by step scanning on the Rigaku D/MAX-2500 diffractometer (Rigaku Co., Japan). The T60 UV-visible spectrophotometer and the NI cDAQ – 9178 were used to measure the optical transmittance and the sheet resistance of the Cu NW electrode, respectively.
6
Structural Characterization of Crystalline Product
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The crystalline structure of the product was analyzed using an X-ray diffractometer (XRD, Rigaku D/max-2500, Rigaku Corporation, Tokyo, Japan) using Cu Kα radiation. The morphology, nanostructure, and composition of the sample were characterized using field emission scanning electron microscopy (FESEM, JEOL JSM-6700F, JEOL Ltd., Akishima, Tokyo, Japan), transmission electron microscopy (TEM, JEOL JEM-2010, JEOL Ltd., Japan), and high-resolution TEM (HRTEM, JEOL JEM-2010, JEOL Ltd., Japan).
7
Characterization of H3L Ligand and Its Metal Complexes
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
H3L was purchased from Jinan Henghua Technology Co., Ltd., Shan Dong, China. All other chemicals were purchased commercially and applied directly. Perkin-Elmer 240 element analyzer (PerkinElmer, Dublin, Ireland) is used for microanalysis of C, H and N elements. The ultraviolet-visible spectrophotometer (model UV-2600) manufactured by Shimadzu Company (Shimadzu, Kyoto, Japan), was used to measure the absorption spectra at room temperature, with the test wavelength ranging from 200–800 nm. Powder X-ray diffraction analysis was characterized by Rigaku D/Max-2500 (Rigaku, Tokyo, Japan) X-ray diffractometer equipped with Cu-Kα radiation at a wavelength of 0.154 nm. Photo-luminescence lifetimes and solid-state fluorescence spectra were measured by FS5 fluorescence spectrometer (Edinburgh Instruments, Edinburgh, UK). The RF-5301 fluorescence spectrophotometer (Shimadzu, Kyoto, Japan) was used to carry out the photo-luminescence sensing experiment, equipped with a plotter unit and 1 cm × 1 cm quartz battery in phosphorescent mode.
8
Rigaku D/Max-2500 XRD Analysis
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
X-Ray diffraction analysis (XRD) was conducted by the diffractometer with rotating anode Rigaku D/Max-2500 (Rigaku, Japan).
9
Solvothermal Synthesis of 3D CuS Nanoplates
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Example 1
In a Teflon-sealed autoclave, CuS nanoplates having a three-dimensional structure were synthesized using a solvothermal method. Copper nitrate (Cu(NO3)2.3H2O), cetyl trimethylammonium bromide (CTAB), hexane and n-pentanol, used in the synthesis, were purchased from Sigma-Aldrich. A microemulsion was used, which consists of water containing 0.1 M CTAB (in hexane), 8.65 moles (based on CTAB) of n-pentanol and 10 moles (based on CTAB) of 0.2 M copper nitrate. A 0.2M aqueous solution of copper nitrate was added to a mixture solution of pentanol and hexane containing CTAB, and then stiffed until the solution became transparent. The microemulsion was introduced into a 100 ml Teflon-sealed autoclave, and then 0.8 ml of carbon disulfide was added. The autoclave was placed in an oven and treated at 170° C. for 15 hours. Next, the obtained black precipitate was washed several times with acetone and ethanol and dried in a vacuum oven at a temperature of 60° C. A scanning electron microscope (SEM, Varios 460) and an X-ray diffraction analyzer (XRD, RIGAKU, D/MAX-2500) were used to confirm the three-dimensional structure and crystalline structure of the nanoplates synthesized as described above.
10
Comprehensive Material Characterization Protocol
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The products were characterized by XRD, FTIR spectroscopy, SEM, TEM and EDX. XRD measurements were performed using the Rigaku D/max 2500 diffractometer with Cu Kα radiation (λ = 0.154056 nm) at V = 40 kV and I = 150 mA, and the scanning speed was 8° min−1. TGA measurements were performed using the DuPont Instruments 951 Thermogravimetric analyzer from room temperature to 725 °C in flowing nitrogen gas at the heating rate of 5 °C min−1. The FTIR spectroscopy of the sample was conducted at room temperature with a KBr pellet using the VECTOR-22 (Bruker) spectrometer in the range from 400 to 4000 cm−1. The morphologies of the samples were studied by field emission scanning electron microscopy (FE-SEM, JEOL JSM-6700F). The TEM and HR-TEM images and EDX spectra were obtained using the Tecnai G2 20S-Twin transmission electron microscope operating at the accelerating voltage of 120 kV. The specific surface areas (SBET) of the samples were calculated by following the multipoint Brunauer–Emmett–Teller (BET) procedure using the Quantachrome Nova 2000e sorption analyzer. The pore diameter and the pore size distribution were determined by the Barrett–Joyner–Halenda (BJH) method.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!