Su8010 field emission scanning electron microscope

A scanning electron microscope (SU8010 Field Emission Scanning electron microscope, Hitachi, Chiyoda City, Japan) was used to determine the morphology of the Bre. An appropriate amount of Bre was evenly coated on the sample tank, the surface was sprayed with gold, and SEM observed the morphology.

After spraying gold on an appropriate amount of β-CD, the physical mixture, and a-β-CD, the samples were fixed on the sample table with conductive double-sided adhesive, and their morphological characteristics were observed under vacuum by an SU8010 field emission scanning electron microscope (Hitachi, Japan) [39 (link)].

The X-ray diffraction (XRD) spectra were collected using a D8 ADVANCE X-ray diffractometer (Bruker, Karlsruhe, Germany). The morphological images of the products were obtained on a SU8010 field emission scanning electron microscope (Hitachi, Tokyo, Japan). A TENSOR27 instrument (Bruker, Karlsruhe, Germany) were used to record the Fourier transform infrared spectroscopy (FTIR) spectra. The thermal stability of samples was studied with a thermogravimetry (TG) analyzer (TAQ50, Netzsch, Selb, Germany) at a heating rate of 50 °C min⁻¹ in a nitrogen atmosphere. XPS analysis of the surface was conducted with a PHI Quantera II X-ray photoelectron spectroscope (ULVAC-PHI, Japan) equipped with an Al Kα X-ray radiation source.

Mass spectra were recorded on a Bruker impact II high-definition mass spectrometer, quadrupole and time-of-flight modules both in the positive ion modes. The data analyses of mass spectra were performed on the basis of the isotope distribution patterns using Compass Data Analysis software (version 4.4). UV-vis absorption spectra were recorded on a Thermo Scientific Evolution 220 UV-vis spectrophotometer. Fourier transform infrared spectra were recorded on a Bruker Tensor II spectrophotometer (Bruker Optics GmbH, Ettlingen, Germany) using a single attenuated total reflectance accessory covering a wave number range from 400 to 4000 cm⁻¹. The final spectrum was the average of 32 scans accumulated using Bruker’s Opus software 8.1, taken at a resolution of 4 cm⁻¹. The samples were measured under the same mechanical force pushing the samples in contact with the diamond window. PXRD analyses were carried out on a microcrystalline powder using a Rigaku Oxford Diffraction XtaLAB Synergy-S diffractometer using Cu radiation (λ = 1.54184 Å). Morphology of the sample and elemental composition analyses were measured using an SU-8010 field-emission scanning electron microscope (Hitachi Ltd., Tokyo, Japan) equipped with an Oxford-Horiba Inca XMax50 energy-dispersive x-ray spectroscopy attachment (Oxford Instruments Analytical, High Wycombe, England).

Functional groups responsible for the synthesis and stabilization of AgNPs were detected by Fourier transform infrared (FTIR) spectroscopy. Freeze-dried AgNP powders (1 mg) were mixed with KBr (300 mg) and compressed to thin pellets by hydraulic pellet press. FTIR spectra were recorded in the range of 500‒4000 cm⁻¹ with a resolution of 4 cm⁻¹ using an AVATAR 370 FTIR spectrometer (Thermo Nicolet, MA, USA).
The size and morphology of AgNPs were observed by scanning electron microscopy and transmission electron microscopy. One drop of the AgNP solution was applied onto a carbon-coated copper grid and dried under a lamp. AgNPs carried by the grid were observed with an SU8010 field emission scanning electron microscope (Hitachi, Tokyo, Japan) and a JEM-1230 transmission electron microscope (JEOL, Tokyo, Japan). The silver element of AgNPs was detected by an X-Max N energy dispersive spectrometer (Oxford Instruments, Oxford, UK) at 20 keV.
The crystalline nature of AgNPs was analyzed by X-ray diffraction spectroscopy. Freeze-dried AgNP powders were applied onto a coated film on a glass slide and analyzed using a D8 Advance Diffractometer (Bruker, Karlsruhe, Germany) in the 2θ range from 20° to 80° with Cu-Kα radiation at 40 kV and 40 mA.