Ultima 4 multipurpose x ray diffraction system

The properties of the TiO₂ nanomaterials were characterized by several techniques. The XRD analysis was carried out on an Ultima IV multipurpose X-ray diffraction system (Rigaku, Tokyo, Japan) with Cu Kα radiation at 40 kV and 40 mA (λ = 1.5406 Å). JADE 6.5 software was applied for XRD spectra analysis. The Raman measurements were performed on a HORIBA JY LabRAM HR Evolution Raman spectrometer (HORIBA Scientific, Paris, France). The porosity as well as BET surface area of TiO₂ nanomaterials was investigated by applying a Micromeritics ASAP 2020 Surface Area and Porosity Analyzer (Micromeritics, Norcross, United States). The HR-TEM images were obtained using a FEI Talos F200S Transmission Electron Microscope (ThermoFisher, Waltham, USA) with a field emission-transmission gun at 200 kV, using a Digital Micrograph for image analysis. Fourier Transformed Infrared (FTIR) spectra in the transmission mode were measured with a Thermo Scientific Nicolet iS20 FTIR spectrometer (ThermoFisher, Waltham, USA) using KBr pellets. The electron paramagnetic resonance (EPR) experiments were carried out by employing EMXPlus in situ EPR spectrometer (Bruker, Karlsruhe, Germany) with DMPO or TEMP as trapping agents.

The composition and phase of the obtained product were detected by an Ultima IV multipurpose X-ray diffraction system (XRD, Rigaku Corporation, Tokyo, Japan) using Cu Kα radiation (λ = 0.15406 nm). The morphology of formed sample was determined using a Sirion 200 field emission scanning electron microscope (FE-SEM, FEI Company, Eindhoven, Netherlands), while the chemical composition was characterized by an INCA energy dispersive spectrometer (EDS, Oxford Instruments, Oxon, England, UK). The lattice parameters and lattice images of as-prepared samples were tested by a Talos F200X field-emission high resolution transmission electron microscopy (FE-HRTEM, Thermo Fisher Scientific, Waltham, MA, USA). The surface constituents and element valence state of formed products were detected with an ESCLAB MKII X-ray photoelectron spectrometer (XPS, VG Scientific, Waltham, MA, USA). The binding energy of the obtained XPS spectra was calibrated by the C (1s) peak at 284.6 eV. The infrared absorption spectra were measured on a 6700 Fourier transformation infrared (FT-IR) spectrometer (Thermo Fisher Scientific, Waltham, MA, USA).