Labx xrd 6000

Transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HR-TEM) measurements was carried out using a JEOL-2010F (200 kV) (JEOL, Tokyo, Japan). The ultraviolet and visible (UV-Vis) absorption spectra were examined with a UV-Vis spectrophotometer (TU-1901, Beijing, China). Fourier-transform infrared (FT-IR) spectroscopy was performed using a Nicolet 5700 Fourier transform infrared spectrometer (Shimadzu, Tokyo, Japan). The prepared nanomaterials were characterized by X-ray diffraction (XRD, LabX XRD-6000 (Shimadzu, Tokyo, Japan)). Elemental analysis was recorded by X-ray photoelectron spectroscopy (XPS, Thermo Scientific Escalab 250Xi, USA). Fluorescence spectra were collected using an F-4700 fluorescence spectrophotometer (HITACHI, Tokyo, Japan).

A X-ray diffraction (XRD, Shimadzu labx XRD-6000) spectroscope was used to characterize crystalline structures of carbon composites. The XRD patterns of the synthesized GO and Ag NP- and ZnO NP-doped GO composites were recorded at a scan rate of 4 degree/min using monochromatic Cu-Kα radiation (MXP18; MAC Science Co., Tokyo, Japan) at 30 kV and 20 mA. The recorded specific peak intensity and 2θ values were further identified using a database system (JCPDS).

Ultraviolet–visible (UV–vis) spectral analysis and Fourier transform infrared spectroscopy (FT-IR) of the formed GO and rGO/AgNC were done using UV/VIS/NIR Spectrophotometer (V-630, Japan) and FT/IR-4100typeA, respectively. The X-ray diffraction (XRD) patterns of the GO and rGO/AgNC were recorded at 2θ values between 10° and 80° using a Cu X-ray tube at 40 kV and 30 mA with the X-ray diffractometer (model LabX XRD-6000, Shimadzu, Japan). The Zeta Potential analysis was carried out using Malvern Zetasizer Nano-ZS90, Malvern, UK. Transmission electron microscopic analysis (TEM) was done using JEOL JEM-2100, Japan, as described before (Eldeeb et al. 2018 (link)).

The morphology of the g-C₃N₄/TNA membrane was analyzed using scanning electron microscopy (SEM, Quanta 200 FEG) and transmission electron microscopy (TEM, JEM-2100F). The crystallinity of the sample was determined by X-ray diffraction (XRD) using a diffractometer with Cu Kα radiation (Shimadzu LabX XRD-6000). BET surface area and pore volume distribution were analyzed using an automated surface area and pore size analyzer (QuantachromeAutosorb-1 MP). The UV-vis absorption spectrum of the g-C₃N₄/TNA membrane was investigated using UV-vis diffuse reflectance spectroscopy (DRS) (Shimadzu UV-2450). Fourier transform infrared spectra (FTIR) of the samples were obtained in KBr pellets on a Nicolet 5DXC IR spectrometer (Nicolet, Madison). X-ray photoelectron spectroscopy (XPS, ESCALAB250) was used to analyze the elemental composition of the g-C₃N₄/TNA membrane. The photoluminescence spectrum of the sample was measured at room temperature using a 380 nm excitation wavelength (F-4500). Membrane pore size distribution was measured by using a Porometer (Porolux 1000) under a room temperature of 25 °C. The water contact angle of the g-C₃N₄/TNA membranes was tested using a contact angle and surface tension measurement system (Physics Instruments Ltd., Germany).

The 6 mm diameter cylinder specimens with a length-to-diameter ratio of 1, were prepared for room temperature uniaxial compression tests at a strain rate of 5 × 10⁻³s⁻¹, using an Instron 8874 universal testing machine. An extensometer was used to measure plastic deformation. Three specimens were tested for each material. The microstructures of three materials were observed using an Olympus optical microscope and a field emission scanning electron microscope (FESEM). X-ray diffraction (XRD) analysis was carried out on specimens before compression and after yielding, using an automated Shimadzu Lab-X XRD-6000 diffractometer (Cu Kα, λ = 1.54056 Ǻ) operating at a scanning speed of 2 deg/min. The specimens were etched with a mixture of 1 g oxalic, 1 ml nitric acid, 1 ml acetic acid and 150 ml distilled water.

Zinc oxide nanoparticle (particle size >100 nm) powder was purchased from Sigma-Aldrich. The primary particle size was determined using scanning electron microscope (S-3400N, Scanning Electron Microscope; HITACHI, Tokyo, Japan), operated at an acceleration voltage of 20 kV. The X-ray energy dispersive spectroscopy (EDX) spectrum was obtained to confirm the chemical composition of ZnO NPs. The crystalline nature of the particles was assessed by X-ray diffractometer (Lab X, XRD-6000; Shimadzu Corp., Kyoto, Japan), operated at a voltage of 40 kW and a current of 30 mA with CuK α radiation λ = 1.5406 in the scan range of 2Θ = 10–80° to obtain the images.