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Senterra confocal raman spectrometer

Manufactured by Bruker

The Senterra confocal Raman spectrometer is a laboratory instrument used for the analysis of materials. It is designed to measure the Raman scattering of light by molecules within a sample, providing detailed information about the molecular structure and composition of the material.

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3 protocols using senterra confocal raman spectrometer

1

Multi-Technique Nanomaterial Characterization

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Scanning electron microscopy (SEM) images were collected on an FEI Quanta 250 microscope. Transmission electron microscopy (TEM), high-resolution TEM (HRTEM) images and selected area electron diffraction (SAED) patterns were recorded on an FEI Tecnai G2 F20 field-emission microscope. X-ray diffraction (XRD) patterns were obtained on a Bruker D8 ADVANCE diffractometer equipped with a CuKα radiation source (λ = 1.54178 Å). Raman spectra were obtained on a Bruker Senterra confocal Raman spectrometer (λex = 532 nm). N2 adsorption/desorption isotherms at 77 K were carried out on a Quantachrome Autosorb-iQ instrument. Brunauer–Emmett–Teller (BET) specific surface areas were calculated from the linear range of the BET plot and pore width distribution curves were obtained using the quenched solid density functional theory (DFT) method. X-ray photoelectron spectroscopy (XPS) results were acquired on a Thermo Fisher ESCALAB 250Xi spectroscope with an excitation source of AlKα radiation (1486.6 eV).
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2

Advanced Materials Characterization Methods

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Pore textural properties were acquired using a Quantachrome Autosorb iQ by the N2 isothermal adsorption–desorption method at 77 K. Brunauer–Emmett–Teller (BET) specific surface areas were obtained from the multi-point BET-plot calculation provided by the ASiQwin software (version 5.2). Pore size distribution curves, together with pore volumes and surface areas of pores with size between 0.5–50 nm, were calculated by the quenched solid density functional theory (DFT) method. Energy disperse spectroscopy (EDS) analyses were obtained from an FEI Quanta 250 microscope. Transmission electron microscope (TEM) images were recorded on an FEI Tecnai G2 F20 field-emission microscope. X-ray diffraction (XRD) patterns were collected on a Bruker D8 ADVANCE diffractometer equipped with a CuKα radiation source (λ = 1.54178 Å). Raman spectroscopy analyses were acquired on a Bruker Senterra confocal Raman spectrometer (laser excitation wavelength: 532 nm). X-ray photoelectron spectroscopy (XPS) results were recorded on a Thermo Fisher ESCALAB 250Xi spectroscope excited by AlKα radiation (1486.6 eV).
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3

Comprehensive Characterization of ANPC Materials

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N2 adsorption/desorption isotherms were measured on a Quantachrome autosorb-iQ at 77 K. Brunauer–Emmett–Teller (BET) specific surface areas of the ANPC materials were calculated according to the linear ranges of BET plots from the corresponding physisorption isotherms. Pore width distribution curves of the ANPC materials were acquired based on the quenched solid density functional theory (DFT) method. The microstructures and morphologies of the ANPC materials were observed on an FEI Tecnai field-emission transmission electron microscope (TEM) and an FEI Quanta TM 250 scanning electron microscope (SEM). Raman spectra were obtained on a Bruker Senterra confocal Raman spectrometer (laser excitation wavelength: 532 nm). X-ray photoelectron spectroscopy (XPS) spectra were collected on a Thermo Fisher ESCALAB 250Xi spectroscope equipped with an excitation source of Al Kα radiation (1486.6 eV).
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