X-ray photoelectron spectroscopy (XPS) analysis was performed using an AXIS UltraDLD X-ray photoelectron spectrometer (Kratos Analytical) equipped with a monochromatic Al X-ray source. The analysis area was below 1 mm2, with most of the signal coming from an area of about 700 × 300 μm2. A wide spectrum was recorded to detect elements present in the surface layer. The relative surface compositions were obtained from detailed spectra recorded for each element and quantified using atomic sensitivity factors supplied by Kratos. A high-resolution carbon C1s spectrum was curve-fitted to identify different functional groups from the chemical shifts in the carbon signal.
Quanta 250 feg sem
The Quanta 250 FEG SEM is a field emission gun scanning electron microscope. It provides high-resolution imaging and analysis of a wide range of materials and samples.
Lab products found in correlation
83 protocols using quanta 250 feg sem
Morphology and Composition Analysis of Nanostructured LFS Coatings
X-ray photoelectron spectroscopy (XPS) analysis was performed using an AXIS UltraDLD X-ray photoelectron spectrometer (Kratos Analytical) equipped with a monochromatic Al X-ray source. The analysis area was below 1 mm2, with most of the signal coming from an area of about 700 × 300 μm2. A wide spectrum was recorded to detect elements present in the surface layer. The relative surface compositions were obtained from detailed spectra recorded for each element and quantified using atomic sensitivity factors supplied by Kratos. A high-resolution carbon C1s spectrum was curve-fitted to identify different functional groups from the chemical shifts in the carbon signal.
Comprehensive Structural Analysis of Prepared Materials
Characterization of TiO2 Nanoparticles
TiO2 was confirmed and determined with X-ray diffraction
using an APEX II ultra-diffractometer with Cu Kα radiation at
λ = 1.54056 Å. To determine the primary TiO2 particle size, an aqueous suspension of 0.05 g/L was sonicated with
a probe sonicator for 60 s with 15 s rest over 30 min in a room temperature
water bath. Afterward, a 15 μL aliquot was drop-cast onto a
formvar/carbon-coated 100 mesh copper grid and dried. The copper grid
was imaged using an 80 kV JEOL-1400 Plus transmission electron microscope.
Particle sizes were analyzed using ImageJ software for more than 100
particles. For scanning electron microscopy (SEM) images for particle
film morphology, 2.5 mg of the particles was sonicated in 700 μL
of water for 30 s. Then, fourteen 5 mm x 5 mm silicon wafers were
laid on the ATR crystal, and the colloidal suspension was pipetted
into the trough. The solution was dried, and a wafer was imaged using
a FEI Quanta FEG 250 SEM at 10 kV.
The specific surface area
was determined using a Quantachrome Nova 4200e N2 adsorption
isotherm under liquid nitrogen. Samples were first degassed at 120
°C for 18 h, and a 15-multipoint isotherm was collected between
P/P0 of 0.05–0.95.
SEM Characterization of Samples
on the samples were carried out with a FEI Quanta FEG-250 SEM after
optical measurements. An acceleration voltage of 2 or 5 kV was applied
during the measurements to reduce charging on the sample surface.
SEM Examination of Gluten Fermentation
Scanning Electron Microscopy of Rice Noodles
Multimodal Imaging of Porous Transport Layers
Electrochemical and Imaging Techniques
Powder Morphology Analysis by SEM
Bacterial Biofilm Visualization Protocol
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