transmission electron microscopy (HR-TEM) images of the FGQD samples
were captured using a JEM-2100F transmission electron microscope equipped
with a field emission gun (200 kV; JEOL). XPS profiles were recorded
for both the samples using a VG ESCALAB 220i-XL system (Thermo Fisher
Scientific, Waltham). XPS and high-resolution scans were performed
at pass energies of 100 and 20 eV, respectively, and at an X-ray beam
size of approximately 100 μm. FGQD samples for XPS measurement
were prepared on a silicon substrate by the spin-coating method with
the rotation speed adjusted to 2000 rpm. The samples were dried overnight
in a vacuum oven at 80 °C prior to the measurements. Room-temperature
PL spectra were recorded using a PL spectrophotometer (FluoroMax Plus
fitted with 150 W xenon arc lamp, HORIBA, Kyoto, Japan) in the wavelength
range of 300–800 nm. The PL emission spectra were recorded
at excitation wavelengths of 400, 450, and 500 nm. The above experimental
details are as per our previously published work.31 (link)