Lambda 750 uv

The EDS, TEM, and HRTEM images were captured using the high‐resolution field emission transmission electron microscope Talos F200s G2 operating at an acceleration voltage of 200 kV. DLS and ζ potential measurements were conducted at room temperature on a Malvern Zetasizer Nano ZS90 equipped with a solid‐state He‐Ne laser (λ = 633 nm). The crystal structure of CSP NPs was characterized with a Shimadzu XRD‐6000 X‐ray diffractometer equipped with Cu Kα1 radiation (λ = 0.15 406 nm). The UV–vis–NIR spectra were collected on a PerkinElmer Lambda 750 UV–vis–NIR spectrophotometer. FTIR was tested by the Thermo Scientific NICOLET iS 50 conventional Fourier infrared spectrometer. The TGA of Cur, CSP, and CSC NPs was characterized by the Thermo STA 499 F3 jupiter. The copper ions were determined by the inductively coupled plasma mass spectrometry (ICP‐MS, Thermo, ELEMENT 2).

The AFM images of the polymer films were scanned in tapping mode by atomic force microscope (AFM, Veeco Multimode V). The absorption spectrum of the polymer film was obtained using a Perkin Elmer Lambda 750 UV–visible near-infrared spectrophotometer with integrating sphere. The electrical characterization of the memory cells were carried out by a Keithley 2612 source meter and an Agilent 4155c semiconductor parameter analyzer at room temperature in ambient atmosphere.