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Quorum q150r

Manufactured by Quorum Technologies
Sourced in United Kingdom

The Quorum Q150R is a compact sputter coater designed for the deposition of conductive coatings on samples for scanning electron microscopy (SEM) analysis. It features a fully automated control system and a rotary-pumped vacuum system. The Q150R is capable of depositing thin films of gold, platinum, or other conductive materials onto specimens with high uniformity.

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12 protocols using quorum q150r

1

Electron Microscopy Sample Preparation

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The fresh iWAT was cut into small pieces and quickly placed into a pre-cooled 2.5% glutaraldehyde fixative overnight at 4 °C. The samples were then washed three times with PBS (pH 7.4). The cells were post-fixed in 1% osmium tetroxide in the cacodylate buffer for 30 h and washed with buffer three times. Following this, the samples were dehydrated once in each concentration of ethanol for 15 min. Further dehydration of the samples was done with the EM CPD300 automated critical point dryer (Leica, Weztlar, Germany), and samples were sprayed using a Quorum Q150R vacuum magnetron ion sputter coater (Quorum, Nottingham, UK). The samples were imaged with a Nova Nano SEM-450, operating at 5 kV (Thermo Fisher Scientific, Waltham, Massachusetts, USA).
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2

Leaf Surface Ultrastructure Characterization

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To observe the laminar surface and cuticular patterns, leaf samples were fixed in FAA (formaldehyde—acetic acid—ethanol) solution for 24 h, then rinsed in distilled water and dehydrated in an ethanol series (30%, 50%, 60%, 70%, 80%, 95%, and 100%). Samples were dried to critical-point with CO2 for one hour with a dryer Quorum K850 (Quorum Technologies Ltd., Laughton, UK). Then samples were mounted on aluminum holders with carbon conductive tape, and finally covered with gold for two minutes at 20 μÅ with a Quorum Q150R (Quorum Technologies Ltd., Laughton, UK). Observations were made on a Hitachi SU1510 scanning electron microscope (Hitachi High Technologies America, Inc., Schaumburg, USA) at Laboratorio Nacional de Biodiversidad (LaNaBio, Mexico City, Mexico) at Instituto de Biología, UNAM.
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3

SEM Analysis of Coffee Color Changes

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A single specimen from each type of tested material, glazed or polished, and from Arabic Qahwa and Frappuccino Coffee Drink were selected for scanning electron microscopy (SEM) to assess consistency of color changes. The samples were gold sputter coated (Figure 2) with Quorum® Q-150R (East Sussex, BN8 6BN United Kingdom). Then, the samples were loaded into the specimen’s stage of the JEOL® JSM-6610 LV (Akishima, Tokyo, Japan) scanning electron microscope using 20 kv and 500×magnification for scanning and photography. A diagram of the study design and steps of the study is shown in Figure 1.
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4

Microstructural Analysis of Purple-Fleshed Sweet Potato

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To enhance the understanding of extraction process variances, the microstructures of untreated purple-fleshed sweet potato, as well as those subjected to conventional and ultrasound-assisted extraction (UAE), were examined using a scanning electron microscope (JSM-6010 LA, Jeol, Tokyo, Japan). Initially, samples were affixed to metal supports (stubs) using carbon tape and subsequently coated with a thin layer of gold utilizing a sputtering apparatus (Quorum Q150R, Quorum Technologies Ltd., East Sussex, UK). The samples were then scanned using SEM under partial vacuum conditions at 10 kV.
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5

Scanning Electron Microscopy of Suture Coatings

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To visualize PRP on the coated and uncoated sutures, three suture samples were used for the scanning electron microscopy study (None-coated, SC-coated and PRP-coated). Suture samples were cut into 2mm sections, allowed to air-dry at room temperature and coated in gold Quorum Q150R (Quorum Technologies Ltd, UK). Samples were then analysed using Quanta FEG 450 (Thermo Fisher Scientific, USA).
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6

Characterization of Fiber Materials

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The Energy Dispersive X-ray Spectroscopy (EDS) analysis was performed using a Bruker X-flash 630 detector (Baden-Württemberg, Germany) with a resolution of 123 eV inside the Scanning Electron Microscopy (SEM) chamber in an approximate area of 104 μm × 104 μm. The fibers were characterized by SEM using TESCAN MIRA 3 equipment (Tescan, Brno, South Moravian, Czech Republic), for which the sample was coated with approximately 20 nm of gold (99.99% purity) with a Quorum Q150R sputtering evaporator (Quorum Technologies, Lewes, UK) and using a secondary electron detector with an accelerating voltage of 10 kV. In addition, Differential Scanning Calorimetry (DSC) experiments were carried out on a STAR Default Db Mettler Toledo (Mettler Toledo, Milan, Italy), to characterize temperature transition in each material subject to the same condition. Temperature ranged from 20 °C to 290 °C, with a heating rate of 10 °C/min.
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7

Nanofibrous Mats Characterization

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A high-resolution scanning electron microscope Vega 3 (Tescan, Brno, Czech Republic) was used for nanofibrous mats characterization. First, the samples were sputtered by a conductive coating layer using a sputter Quorum Q150R (Quorum Technologies Ltd., Laughton, UK). A mean nanofiber diameter derived from 300 measurements taken from three different images was determined by applying the Adobe Creative Suite software (San Jose, CA, USA).
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8

SEM Analysis of Surface Morphology

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The surface morphology was evaluated using scanning electron microscopy (SEM; Hitachi S-3400 N; Hitachi High-Technologies Scientific Instruments, Wokingham UK), at an accelerating voltage of 5 kV. Prior to observation, each sample was sputtered with gold in a Quorum Q150R ion sputter (Quorum Technologies, Lewes, UK) for 90 s. Porosity was analysed and averaged based on 30 measurements from the SEM images using Image Tool (UTHSCSA; Image Tool Version 2; University of Texas, TX, USA).
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9

Scanning Electron Microscopy of Nanofibrous Mats

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A high-resolution scanning electron microscope Vega 3 (Tescan, Czech Republic) was used for characterization of nanofibrous mats. Prior to imaging, the samples were sputtered by a conductive coating layer using a sputter Quorum Q150R (Quorum Technologies Ltd., Laughton, UK).
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10

Gold/Palladium Sputter Coating for Profilometry

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Devices were coated with a gold/palladium (60:40) alloy for confocal profilometry and surface roughness measurements (Figures 2–4). The devices were sputtered with ~16 nm of the alloy in a Quorum Q150R rotary-pumped sputter coater (Quorum Technologies) as follows: the pressure was reduced to 1e-1 mBar (3 min 43 s) and then to 6-8e-2 mBar (1 min); argon gas was released into the chamber (20 s) until the internal pressure reached 1 mBar; a gold/palladium alloy was sputtered at a current of 20 mA (2 min); the chamber was backfilled with argon gas until it reached atmospheric pressure. The process was repeated once more.
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