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Helios fib sem

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Helios-FIB SEM is a high-resolution focused ion beam scanning electron microscope (FIB-SEM) system designed for advanced materials analysis and sample preparation. It combines a high-resolution scanning electron microscope (SEM) with a focused ion beam (FIB) column, enabling both imaging and nanoscale milling capabilities.

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5 protocols using helios fib sem

1

Blood Sample Preparation for SEM Imaging

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Sample-preparation procedure for SEM imaging comprised two stages of fixing and dehydration. The first stage was initiated by fixing the blood samples with 2.5% glutaraldehyde (Sigma-Aldrich, St Louis, MO) in PBS (pH of 7.4) for 1 h. This continued with 1% osmium tetroxide (OsO4, Sigma-Aldrich, St Louis, MO) in DI water for 1 h, followed by 1% thiocarbohydrazide (Sigma-Aldrich, St Louis, MO) in DI water for 5 min and 1% OsO4 again for 5 min. The samples were washed thrice with PBS for 5 min in between each step. Some samples were also centrifuged (at 500 g for 5 min) in between each step to remove fixer reagents, if needed.
The dehydration stage was initiated by serially rinsing the samples seven times in DI water-diluted ethanol (30%, 40%, 50%, …., 90%) and two times with 100% ethanol, each for 10 min. This was next followed by impregnation with 50% hexamethyldisilazane (HMDS) (Sigma-Aldrich, St Louis, MO) in ethanol for 20 min. Finally, 100% HMDS was added to the dried samples, which were then air-dried overnight at room temperature, mounted, coated with 15-nm gold, and imaged with an FEI Helios-FIB SEM at 1 kV.
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2

Topographical Characterization of Nanofluidic Channels

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The topologies of the nanofluidic channels and the roughness of the polymer surfaces were investigated using an Asylum Research MFP-3D Atomic Force Microscope (tip radius ~2 nm) in repulsive tapping mode at a rate of 1.0 Hz. The Tap300A1-G cantilever tips (Ted Pella) had a frequency of 300 kHz and force constant of 40 N/m. For SEM, the non-conductive resin stamps and thermoplastic substrates were pre-coated with a 2–3 nm Au/Pd layer and imaged using a FEI Helios FIB/SEM.
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3

3D Microstructural Characterization of Battery Electrodes

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An FEI Helios FIB-SEM (FEI Company, OR, USA) was used for serial sectioning and data collection. A trench (50 x 30 x 15 µm 3 ) was first milled to expose side walls for serial-sectioning (trench not shown). The pixel size of the SEM images is 31.25 nm, while the slice thickness is 150 nm. A through-the-lens detector (TLD) was used to collect the backscattered electron signal so as to obtain atomic Z-contrast among phases. As indicated in Figure 1 (c), a typical serial-section area of 50 µm x 45 µm was selected; the slicing direction was parallel to the current collector. Recognizing the spatial location of the current collector relative to the as-obtained 3D electrode structure is useful in characterizing directional connectivity and tortuosity. In the present case, the current collector is adjacent to the left YZ plane of the 3D data set. Overall, 268 consecutive images were collected.
After data collection, the 2D image sequences were aligned, cropped and stacked into a 3D microstructure using a method previously described (J. R. Kremer, et al., 1996 ; J. R. Wilson, et al., 2006) . A total 3D volume of ~35,000 µm 3 was reconstructed for further analysis.
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4

Electron Microscopy Sample Preparation Protocol

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Briefly, samples were fixed in 2.5% (v/v) glutaraldehyde in 0.1 M sodium phosphate buffer (pH 7.3) overnight at 4 °C. Samples were placed on a poly-L-lysine-coated coverslip (0.01 mg/mL, coated for 5 min, and rinsed twice in dH2O) for 1 h, then washed, serially dehydrated in ethanol, chemically dried using hexamethyldisilazane (HMDS) and dried overnight in a desiccator. Samples were then placed on a metal sample stub (EMS aluminum 6 mm pin, 12.7 mm diameter) with double-sided carbon tape (EMS standard carbon adhesive tabs, 12 mm diameter) and the underside of the coverslip coated with silver paint (EMS silver conductive coating). Samples were coated with 15 nm gold palladium (AuPd), on a Denton Desk III sputter coater before imaging on a ThermoFisher Helios FIB-SEM at 5 kV using an Ion Conversion and Electron (ICE) detector.
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5

Characterization of Space-Weathered Grains

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Observation and sample preparation at Kyoto University are as follows. Surface morphology of about 300 grains was observed by a JEOL JSM-7001F FE–SEM. We observed them 15 pA current and 2 kV acceleration voltage. FIB sections were prepared using a Thermo Fisher Helios FIB–SEM. Selected areas were cut out with a 30 kV Ga+ ion beam. Before the extraction, the target areas were Pt-C coated by a 2 kV electron beam. Then, Pt-C was deposited on the target areas by 16 or 30 kV Ga+ ion beams. The sections mounted on the TEM grids were thinned to a thickness of 50 to 200 nm on the 12 or 16 kV Ga+ ion beams. The damaged layers were removed using a 2 kV Ga+ ion beam. About 70 FIB sections were prepared and investigated by the team. In parallel with the above work, we also performed FIB and (scanning) transmission electron microscopy under air-free conditions using an air-tight FIB–SEM sample transfer holder and a double tilt LN2 Atmos Defend Holder (Mel-Build Corporation) at Kyushu University. Another air-tight sample holder was used to transfer the samples. An Ar-filled glove box was used for sample handling. A Thermo Fisher Scios FIB–SEM was used for the observation of about 500 grains and for FIB processing of space-weathered grains. The conditions of the FIB psrocessing are similar to those at Kyoto University.
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