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Fls1000 fluorescence spectrometer

Manufactured by Edinburgh Instruments
Sourced in United Kingdom

The FLS1000 is a high-performance fluorescence spectrometer designed by Edinburgh Instruments. It features advanced optics, a wide wavelength range, and high sensitivity to enable accurate and reliable fluorescence measurements.

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18 protocols using fls1000 fluorescence spectrometer

1

Characterization of Luminescent Printed Patterns

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SEM images were taken with a Sirion-400 field emission scanning electron microscope. XRD data were collected with a Shimadzu XD-3A X-ray diffractometer with Cu Kα radiation (λ = 1.5406 Å). UCL spectra were measured with a portable spectrometer (Maya2000Pro, Ocean Optics Co., LTD, Shanghai, China) using a continuous 975 nm diode laser as the excitation source. The diameter of the laser beam was ~8 mm at the powder sample position. Luminescent images of the printed patterns under 975 nm laser irradiation were taken by using an iPhone 7 digital camera (Apple Inc., Cupertino, CA, USA). Decay lifetime was tested with an FLS1000 fluorescence spectrometer (Edinburgh Instruments, Edinburgh, UK). The average lifetimes were determined via the following equation.
τ=1I0Itdt
where I(t) is the time-related emission intensity, and I0 is the maximum intensity.
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2

Fluorescence Spectra Acquisition Protocol

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We used the Edinburgh instruments FLS1000 Fluorescence Spectrometer to record the fluorescence spectra. We measured the emission spectrum under 365 nm excitation light under source light path of Xenon lamp and detector light path of visible PMT-980. The bandwidth of excitation and emission wavelength is 6.0 nm and 17.0 nm, respectively. The step size is 1.0 nm.
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3

Multimodal Characterization of Materials

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In-situ diffuse reflection infrared Fourier transform spectroscopy (DRIFTS) experiments were performed on a Thermo Nicolet iS10 spectrometer equipped with a mercury cadmium telluride (MCT) detector. The near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) experiments were conducted on a laboratory-based SPECS near-ambient pressure XPS system. The XRD patterns were examined on a Shimazu-6100 powder X-ray diffractometer using Cu Kα radiation at a scan rate of 7° min−1. Electron Microscope (TEM) analyses were performed on an H-7800 microscope with an acceleration voltage of 120 kV. The ultraviolet–visible diffuse reflectance spectroscopy (UV–Vis DRS) was recorded on a Shimadzu UV-3600 spectrometer with BaSO4 as a reference. The isotopically labeled experiments were carried out on a gas chromatography-mass spectrometry (GC-MS, Agilent 7890B-5977B). Transient fluorescence decay spectra were characterized on an Edinburgh FLS1000 fluorescence spectrometer. N2 adsorption-desorption isotherms were obtained on a BEL SORP mini (Microtrac BEL, Japan).
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4

Characterization of Quantum Dots

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A FEI Tecnai G2 F20 high-resolution transmission electron microscope (TEM) and an Agilent 5110 inductively coupled plasma optical emission spectroscopy (ICP–OES) were used to study their morphology and elemental compositions. QD samples grown to the different stages were prepared for the radial element distribution. For the absorption measurements, the QDs were spin-coated on quartz, and optical absorbance spectra were acquired with a Shimadzu 3600 UV–VIS-NIR spectrophotometer. The photoluminescence spectra were obtained by using an Edinburgh Instruments FLS1000 fluorescence spectrometer. XRD patterns were recorded by a D8 Advance (Bruker) instrument using a Cu Kα source.
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5

Time-Resolved Fluorescence Analysis of Purified Proteins

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Time resolved fluorescence spectroscopy of the purified proteins was carried out using an FLS1000 fluorescence spectrometer by Edinburgh Instruments. Time correlated single photon counting (TCSPC) using a pulsed laser diode was used for studying the fluorescence decay as a function of time. A 467 nm laser with 50 ps pulse width and repetition frequency 20 MHz was used for illuminating the samples. Fluorescence emission was recorded at 495 nm and graphs were plotted along with Instrument Response Function (IRF). Analysis and fitting was done using iterative re-convolution of IRF with decay curve f(t) using eqn (1). FAST program by Edinburgh Instruments was used for the all analysis. The decay curves were fitted with eqn (2): where bn is the relative amplitude of the nth component and τn the lifetime of the nth component. The fractional components were calculated according to eqn (3).
The average lifetime value was calculated using eqn (3):
The quantum yield (QY) was investigated by comparing quinine sulfate reference dye in 0.01 M sulphuric acid (QY = 54%) with SiNPs at 350 nm absorbance value. The quantum yield is given by where QYS and QYR are the QY of the SiNPs and quinine sulfate respectively, IS & IR are the integrated PL intensity, AS & AR are absorbance values, and ηS and ηR are the refractive indexes of the SiNPs and quinine sulfate respectively.
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6

Temperature-Dependent Optical Characterization

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The crystal structure of the sample was tested using a Rigaku UItimate IV X-ray diffractometer (Cu/Kα radiation) with a scanning step of 0.02° in the 2θ range from 20° to 70°. The excitation spectrum, emission spectrum, and fluorescence lifetime of the sample were tested using an Edinburgh FLS1000 fluorescence spectrometer with a 450 W ozone-free xenon arc lamp that covers a range of 230 to 1000 nm for steady-state measurements. The time resolution of the fluorescence spectrometer is 1e-9s (nanosecond level), which can meet the measurement range of fluorescence attenuation. To explore the dependence between the optical properties and temperature changes, temperature control was realized using a temperature controller (OMRON E5CC-800) with a type-K thermocouple and a heating tube.
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7

Structural and Optical Characterization of Nanomaterials

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Powder diffraction data were obtained using a PANalytical X'Pert Pro diffractometer equipped with an Anton Paar TCU 1000 N Temperature Control Unit using Ni-filtered Cu Kα radiation (V = 40 kV and I = 30 mA)38 (link), 39 (link). Transmission electron microscope (TEM) images were recorded with a Philips CM-20 SuperTwin transmission electron microscope, operating at 160 kV. A drop of the suspension was put on a copper microscope grid covered with carbon. Before the measurement, the sample was dried and purified in a H2/O2 plasma cleaner for 1 min. The excitation spectra and luminescence decay profiles were obtained using an FLS1000 Fluorescence Spectrometer from Edinburgh Instruments equipped with a 450 W xenon lamp and μFlash lamp as an excitation sources and R5509-72 photomultiplier tube from Hamamatsu in a nitrogen-flow cooled housing as a detector. To carry out the temperature measurement, the temperature of the sample was controlled using a THMS 600 heating–cooling stage from Linkam (0.1 °C temperature stability and 0.1 °C set point resolution). The emission spectra were recorded using 808 nm excitation lines from laser diode (LD of 1.1 W/cm2 excitation density) and a Silver-Nova Super Range TEC Spectrometer from Stellarnet (1 nm spectral resolution) as a detector.
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8

Advanced Characterization of Nanomaterials

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All fluorescence spectra were obtained by Synergy H1 full-function microplate reader (BioTek, Winooski, VT, USA). Transmission electron microscopy (TEM, FEI, Thermo Fisher Scientific, Waltham, MA, USA) images were obtained using a Talos F200X electron microscope. Fourier transform infrared (FTIR, Nicolet Instruments, Thermo Fisher Scientific, Waltham, MA, USA) spectra (400–4000 cm−1) were obtained on IS10 spectrometer. X-ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific, Waltham, MA, USA) was carried out by ESCALAB 250Xi spectrometer. Fluorescence lifetime was recorded via FLS1000 fluorescence spectrometer (Edinburgh Instruments, Livingston, UK). X-ray diffraction (XRD, Bruker, Karlsruhe, Germany) analysis using a D8 ADVANCE instrument using Cu Kα (λ = 0.15405 nm).
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9

Comprehensive Characterization of Material Samples

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Transmission electron
microscopy (TEM)
and high-resolution transmission electron microscopy (HR-TEM) images
were collected using a JEM-2100 transmission electron microscope (JEOL,
Ltd., Tokyo, Japan). Proton nuclear magnetic resonance (1H NMR) spectra were measured in dimethyl sulfoxide (DMSO) using an
AVANCE III HD 500 MHz spectrometer (BrukerCorp, Karlsruhe, Germany).
X-ray photoelectron spectroscopy (XPS) was carried out using an Escalab
250Xi X-ray photoelectron spectrometer (Thermo Fisher Scientific Co.,
Ltd., Shanghai, China). The FTIR spectra were collected using a frontier
Fourier transform infrared spectrometer (PerkinElmer Co., Ltd., Waltham,
MA). The UV–vis absorption spectra were recorded using a TU-1950
ultraviolet–visible spectrofluorometer (Persee General Instrument
Co., Ltd., Beijing, China). Photoluminescence (PL) measurements were
carried out using an LS55 fluorescence spectrometer (PerkinElmer Co.,
Ltd.). Fluorescence decay curves were measured using a DeltaFlex modular
fluorescence lifetime instrument (Horiba Jobin Yvon IBH Ltd., Glasgow,
U.K.). PL quantum yields were measured using an FLS1000 fluorescence
spectrometer (Edinburgh Instruments, Ltd., Edinburgh, U.K.). Fluorescence
images were captured using a DMI4000 B inverted fluorescence microscope
(Leica Microsystems Inc., Wetzlar, Germany).
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10

Spectroscopic Characterization of Compounds

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All reagents and solvents were obtained from J&K Scientific Ltd. (Beijing China). NMR spectra of samples were recorded on Bruker AV400 (400 MHz) in DMSO-d6 or THF-d8 solution using tetramethylsilane (TMS) as an internal standard. Mass spectrum was recorded on a Bruker Amazon SL Ion Trap Mass Spectrometer under ESI mode. Melting point was measured on a WRS-1B melting point apparatus. The fluorescence quantum yield was obtained with an Edinburgh FLS 1000 fluorescence spectrometer. All the emission spectra were recorded using a Hitachi F-4600 spectrofluorimeter and all the absorption spectra were recorded using an Agilent 8454 UV/vis spectrophotometer.
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