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Em 400t microscope

Manufactured by Philips
Sourced in Netherlands

The Philips EM 400T is a transmission electron microscope. It is designed to provide high-resolution imaging and analysis of samples at the nanoscale level. The microscope uses a high-energy electron beam to interact with the specimen, allowing users to study the internal structure and composition of materials.

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4 protocols using em 400t microscope

1

Characterization of Lipid Nanoparticle Formulation

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Submicron particle size and polydispersity index (PDI) analysis were performed using a Zeta Sizer Nano-ZS90 (Malvern Instrument Ltd., Worcs, England) equipped with a 5 mW solid-state laser with a wavelength of 670 nm. Measurements were performed at 20 ± 0.2 °C at an angle of 90°. The zeta potential (ZP, ξ) was measured by electrophoretic light scattering (ELS) using the same instrument. The measurements were recorded at 25 °C, using three sets of measures up to 100 to achieve an average value. Both analyses were carried out on samples previously diluted with bidistilled water in a 1:10 v:v ratio. Each value was measured at least in triplicate.
Morphological characteristics of LN-ODAF were investigated using TEM (Philips EM 400T microscope, Eindhoven, The Netherlands). TEM samples were prepared by deposition of diluted (100-fold) LN-ODAF formulation onto an aluminum specimen stub covered with a double-sided adhesive carbon disk. After water vaporization, the samples were spray coated with chromium prior to imaging (Quorum Q150T ES East Grinstead, West Sussex, UK).
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2

Transmission Electron Microscopy of ENMs

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The particle size and morphology of ENMs dispersed in cell culture media were evaluated using transmission electron microscopy on a Philips EM 400T microscope. The ENM samples were diluted to 50 μg/mL in DI water from a stock dispersion of 0.5 mg/mL. The TEM samples were then prepared by drop casting ENM dispersions on TEM grids. The grids were allowed to air-dry before imaging.
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3

Nanostructured Lipid Carrier Morphology Characterization

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NLC morphology was evaluated by means of transmission electron microscopy (TEM) (Philips EM 400T microscope, Eindhoven, Netherlands) and field emission scanning electron microscopy (FE-SEM) (LEO 1525 equipped with a GEMINI column, ZEISS, Germany). TEM samples were prepared by deposition of a drop of diluted (100 folds) NLC suspension on the surface of a 200 mesh Formvar®-coated copper grid (TAAB Laboratories Equipment, Ltd., Aldermaston, England) and letting drop to evaporate at room temperature overnight. To investigate particle internal morphology by FE-SEM, the suspension was lyophilized, then particles were broken up in dry ice and, after CO2 complete vaporization, re-dispersed in water. Specimens were prepared by deposition of diluted (100 folds) NLC suspension onto an aluminum specimen stub covered with a double sided adhesive carbon disk. After water vaporization at room temperature, samples were sputter coated with chromium prior to imaging (Quorum Q150T ES East Grinstead, West Sussex, United Kingdom). Coating was done at 120 mA for 30 s.
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4

Transmission Electron Microscopy of SLN and SSLN

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AST-SLN and AST-SSLN morphology was evaluated by means of transmission electron microscopy (TEM) (Philips EM 400T microscope, Eindhoven, The Netherlands). TEM samples were prepared by deposition of a drop of diluted (100-fold) SLN and SSLNs suspensions on the surface of a 200 mesh Formvar®-coated copper grid (TAAB Laboratories Equipment, Ltd., Aldermaston, UK) and letting the drop evaporate at room temperature overnight. Specimens were prepared by deposition of diluted (100-fold) SLN and SSLNs suspensions onto an aluminum specimen stub covered with a double-sided adhesive carbon disk. After water vaporization at room temperature, samples were sputter coated with chromium prior to imaging (Quorum Q150T ES East Grinstead, West Sussex, UK). Coating was done at 120 mA for 30 s.
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