Leo 1530 gemini
The LEO 1530 Gemini is a high-performance scanning electron microscope (SEM) designed for advanced materials research and analysis. It features a Gemini electron column, which delivers high-resolution imaging and exceptional analytical capabilities. The LEO 1530 Gemini is capable of producing detailed images and performing in-depth elemental analysis of a wide range of samples.
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90 protocols using leo 1530 gemini
Characterization of Recovered Samples
Scallop Valve Surface Characterization
Probing Ferroelastic Domains in BFO
Microscopic Analysis of Cone Fragment Remains
For light microscopy (LM), the samples picked with needles were treated with Schultze solution (concentrated nitric acid saturated with a few potassium chlorate crystals added) and washed in distilled water, then treated with 4% ammonia and washed until neutral. The extracted material was then mounted on microscopy slides in glycerine jelly, and covered with a coverslip. These pollen preparations were observed with a transmitted light microscope (Carl Zeiss Axioscope A1) equipped with a Canon 450D digital camera, and are deposited with the source specimen (MB.Pb.1997/1246).
Electrospun Scaffold Fiber Characterization
Scanning Electron Microscopy of Olfactory Structures in C. marinus
SEM analysis of metal oxide nanoparticles and Campylobacter
Multiscale Characterization of Metallic Nanostructures
emission scanning electron microscope (Carl Zeiss AG, Oberkochen, Germany). The In Lense
detector is used for imaging all samples, and the gun’s acceleration voltage is set
between 2 and 3 kV.
Atomic force microscopy (AFM) images are recorded using a Nanoscope Dimension V (Veeco,
USA) instrument with a Dimension 3100 controller. The instrument is operated in the
tapping mode with OTESPA-R3 cantilevers (Bruker). The resulting images are evaluated with
NanoScope Analysis software. Moreover, a slope analysis was performed on each sample to
verify the sharpness of the fabricated Au discs. Details of the slope analysis are
presented in the
Additionally, 3D reconstructed optical images taken with a laser scanning microscope
(Olympus, LEXT) are used to show the uniformity of the samples regarding the periodicity
and geometry of the discs. This laser scanning microscope allows a fast qualitative
evaluation of the fabricated samples. A 100× objective was used with N.A. 0.95 and a
z-scanning pitch of 120 nm. Additionally, a 1.3× digital zoom was used to obtain a
better view of the Au discs imaged.
Scanning Electron Microscopy of PUF and CNF-PUF
Particle Characterization of Powder Samples
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