Fully cured samples, similar to those used for the thermal conductivity measurements and prepared using the same isothermal curing procedure, were fractured and then the fracture surface was sputter-coated with gold (Baltec SC-005, Leica Biosystems, Wetzlar, Germany) and examined in a Scanning Electron Microscope (JEOL JSM-5610, Tokyo, Japan). Typically, an accelerating voltage of 10 kV was used to give magnifications of 100× to 5000×.
Jsm 5610
Manufactured by JEOL
Sourced in Japan, Germany
The JSM-5610 is a Scanning Electron Microscope (SEM) manufactured by JEOL. It is a versatile and compact instrument designed for high-performance imaging and analysis of a wide range of samples. The JSM-5610 utilizes an electron beam to scan the surface of a sample, generating detailed images and providing information about the sample's surface topography and composition.
Automatically generated - may contain errors
Lab products found in correlation
Nicolet is50, by Thermo Fisher Scientific (3 mentions)
Fe sem, by Zeiss (2 mentions)
D8 advanced diffractometer, by Bruker (1 mentions)
Jed 2300, by JEOL (1 mentions)
Eos 700d, by Canon (1 mentions)
Jfc 1600, by JEOL (1 mentions)
Sollar m6, by Thermo Fisher Scientific (1 mentions)
U 2900, by Hitachi (1 mentions)
Tecnai f30, by Thermo Fisher Scientific (1 mentions)
Labram hr800, by Horiba (1 mentions)
Xrd 7000, by Shimadzu (1 mentions)
Axiovert 40 mat, by Zeiss (1 mentions)
Spectrum 100 ftir spectrometer, by PerkinElmer (1 mentions)
Oca 15, by Dataphysics (1 mentions)
Dimension 3100 afm, by Veeco (1 mentions)
18 protocols using jsm 5610
1
Scanning Electron Microscopy of Fractured Composites
2
Structural Analysis of Materials by PXRD and SEM
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Powder X-ray
diffraction (PXRD) measurements were performed using a Bruker D8 advanced
diffractometer equipped with Cu Kα X-rays (1.5406 Å) and
a solid-state Si detector. Samples were mounted on a low-background
Si [1 1 1] disk sample holder. Powder XRD data were recorded from
2θ (10–90°) with a scanning rate of 0.010°/min.
Powder XRD patterns were quantified by Rietveld analysis using Topas
4.0 software37 and refined using appropriate
crystal structures using a powder diffraction file (PDF) available
from a crystallographic database (ICDD).
Scanning electron microscopy
(SEM) and energy-dispersive X-ray (EDX) measurements were performed
on JEOL model JSM-5610 equipment with secondary electron and backscattered
electron. Data were analyzed using INCA Microanalysis Suite software
v 4.15 and ImageJ v1.532.
diffraction (PXRD) measurements were performed using a Bruker D8 advanced
diffractometer equipped with Cu Kα X-rays (1.5406 Å) and
a solid-state Si detector. Samples were mounted on a low-background
Si [1 1 1] disk sample holder. Powder XRD data were recorded from
2θ (10–90°) with a scanning rate of 0.010°/min.
Powder XRD patterns were quantified by Rietveld analysis using Topas
4.0 software37 and refined using appropriate
crystal structures using a powder diffraction file (PDF) available
from a crystallographic database (ICDD).
Scanning electron microscopy
(SEM) and energy-dispersive X-ray (EDX) measurements were performed
on JEOL model JSM-5610 equipment with secondary electron and backscattered
electron. Data were analyzed using INCA Microanalysis Suite software
v 4.15 and ImageJ v1.532.
3
Morphological and Elemental Analysis of Particulate Matter
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To obtain the shape, size, and composition of the PM, a morphological observation was performed. The sampled filters were cut into pieces of approximately 5 × 5 mm. The cut pieces were fixed onto sample stages with carbon tape. To avoid charging the filters, the samples were sputtered with platinum-palladium and observed using SEM (JSM-5610, JEOL). SEM was equipped with Energy Dispersive X-ray Spectroscopy (EDS; JED-2300, JEOL). The acceleration voltage was 15.0 kV. To compare with the original condition, a blank filter was prepared. To check the components of the collected PM, elemental mapping and spectra analysis of the PM counts divided by the blank filter's counts were conducted using EDS.
4
Microscopic Characterization of Materials
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Scanning electron microscopy
(SEM) images
were obtained from JEOL-JSM5610 instrument using 8–10 kV energy.
Samples were prepared by drop casting from methanol or DMF solution
on silicon wafers and dried at ambient temperature. The samples were
coated with gold prior to the SEM study. Transmission electron microscopy
(TEM) measurements were performed on an FEI Tecnai T30 system with
EDAX microscope at an accelerating voltage of 300 kV. The samples
were prepared by drop casting from methanol solution of1 on a carbon-coated copper grid. Atomic force microscopy (AFM) measurements
were carried out with Bruker NanoScope instrument with a nominal tip
(Veeco RTESP tips, 1–10 Ω/cm), phosphorus doped Si was
used as cantilevers at the resonant frequency range of 266–326
kHz. Scan arrays were 256 × 256 points, and the scan rate was
0.62 Hz.
(SEM) images
were obtained from JEOL-JSM5610 instrument using 8–10 kV energy.
Samples were prepared by drop casting from methanol or DMF solution
on silicon wafers and dried at ambient temperature. The samples were
coated with gold prior to the SEM study. Transmission electron microscopy
(TEM) measurements were performed on an FEI Tecnai T30 system with
EDAX microscope at an accelerating voltage of 300 kV. The samples
were prepared by drop casting from methanol solution of
were carried out with Bruker NanoScope instrument with a nominal tip
(Veeco RTESP tips, 1–10 Ω/cm), phosphorus doped Si was
used as cantilevers at the resonant frequency range of 266–326
kHz. Scan arrays were 256 × 256 points, and the scan rate was
0.62 Hz.
5
Comparative Silk Fiber Morphology
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Images of B. mori silk cocoon, A. pernyi silk cocoon, and silk samples were obtained using a digital camera (Canon EOS700D). The cross-sectional morphology of the silk fibers was characterized with a polarizing microscope (AxioCam MRc 5). Samples were cut using a fiber slicer. The longitudinal surfaces of the samples were characterized via SEM (JEOL JSM-5610). The samples were adhered to conductive adhesives, sputter-coated with gold for 60 s and then examined via SEM at an extra-high tension of 1 kv.
6
Seed Surface Morphology Analysis
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Seed surface morphologies were analyzed using a JEOL JSM-5610 instrument (LV, Tokyo, Japan). Samples were coated using a fully automated sputter coater (JFC-1600, JEOL Ltd., Tokyo, Japan) with fine-grained platinum for 100 s at 80 mA. The hilum side and the lens groove were photographed at 50X and 500X magnifications, respectively.
7
Microscopic Analysis of Insulin-Loaded Microbeads and Collagen Scaffolds
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The morphology of insulin loaded microbeads and scaffold microstructure was examined using a scanning electron microscope (SEM, JSM-5610, JEOL Ltd., Tokyo, Japan). Freeze-dried microbeads were dispersed over a carbon adhesive mounted over a copper stub and were sputtered with a thin layer of platinum by a sputter-coater (ESC-101, Elionix, Tokyo, Japan) for 500 seconds. The freeze-dried collagen scaffolds were cut into cross-sections and mounted on a carbon adhesive over the SEM stub. The cross-sections were sputter-coated with platinum for 300 seconds. The microbeads and scaffold cross-sections were observed at an acceleration potential of 5 kV and 10 kV, respectively.
8
Comprehensive Material Characterization Protocol
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The microscopic surface morphologies were observed by field emission scanning electron microscopy (FESEM, JSM-5610, JEOL, Japan) equipped with energy dispersive spectroscopic (EDS), operating at 3 kV acceleration voltage. A Fourier-transform infrared (FTIR) spectrometer (FTIR, Nicolet IS50, Thermo, USA) equipped with an ATR accessory was used to examine the chemical groups of the sample. All spectra were recorded in the range from 4000 to 450 cm−1 with 4 cm−1 resolution. X-ray photoelectron spectroscopy (XPS, K-Alpha Thermo, USA) data was obtained using an electronic spectrometer. The crystal phase of the samples was tested with an X-ray diffractometer (XRD, D8, Bruker, Germany). The quantitative test of TiO2 was quantified through atomic absorption spectrometry (AAS, Sollar M6, Thermo, USA) with air-acetylene flame. Separate hollow cathode lamps radiating at wavelengths of 248.3 (Ti) were used to determine the amount of Ti. The mechanical strength of the samples was tested through a universal testing machine (Instron 5943, USA) according to the GB/T18318-2011 standard. The optical properties of the samples were studied with a UV-vis spectrophotometer (Hitachi U-2900, Japan) in the wavelength range of 200–800 nm.
9
Flagellum Surface Structure Analysis
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To examine the mechanism of the rearrangement of the flagellum, we scrutinized the surface structure via scanning electron microscopy (SEM). The alcohol-preserved specimens were dehydrated through an ethyl alcohol/t-butyl alcohol series and were freeze-dried. Then, the specimens were coated with palladium and observed using SEM (JSM-5610, JEOL, Japan).
10
Phase Evolution of Ferroelectric Powders
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Phase structures of the powders from the unpoled and poled pellets were investigated by X-ray diffraction (XRD; XRD-7000, Shimadzu, Kyoto, Japan) with Cu Kα radiation. Long run diffractograms for structure determination were collected in the Bragg angle (2θ) range from 10° to 130°. The Rietveld program Fullprof was used for full-pattern matching and structural refinements at ambient temperature. High temperature XRD (2θ, 10°–80°) was conducted to investigate the phase transition ranging from RT to 430 °C, then cooling to RT. A stabilization time of 10 min was systematically applied between each measurement. Morphological images were obtained by scanning electron microscope (SEM; JSM-5610, JEOL, Tokyo, Japan). The TEM images were obtained from the as-sintered pellets by using a transmission electron microscopy (TEM; Tecnai F30, FEI, Hillsboro, OR, USA). Raman spectra were recorded on polished sintered pellets using 514.5 nm excitation by a Jobin-Yvon LabRam HR800 (Horiba Jobin Yvon Inc., Paris, France) from 30 °C to 450 °C with 20 min of thermal stabilization on each measurement.
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